ClassID:

170110

G01N2223/6466 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Specific applications or type of materials flaws, defects flaws comparing to predetermined standards

Recent Application in this class:
#1
20260133142
2026-05-14

ARTICLE INSPECTION DEVICE

#2
20250383307
2025-12-18

X-RAY DIFFRACTION INSPECTION SYSTEM AND METHOD FOR OPERATING SAME

#3
20250347584
2025-11-13

METHOD OF CALCULATING INDICATOR OF THIN WIRE, METHOD OF EVALUATING QUALITY OF OPTICAL CABLE, AND OPTICAL CABLE

#4
20240353355
2024-10-24

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A STRAND

#5
20230184701
2023-06-15

Method and system for inspecting a structure across a cover layer covering the structure

#6
20220253999
2022-08-11

EBeam Inspection Method

#7
20210279878
2021-09-09

Methods and systems for printed circuit board design based on automatic corrections

#8
20210014979
2021-01-14

Methods and systems for manufacturing printed circuit board based on x-ray inspection

#9
20210012499
2021-01-14

Methods and systems for detecting defects in devices using X-rays

#10
20210012054
2021-01-14

Methods and systems for printed circuit board design based on automatic corrections

#11
20210011177
2021-01-14

Methods and systems for process control based on X-ray inspection

#12
20210010954
2021-01-14

Methods and systems for product failure prediction based on X-ray image re-examination

#13
20210010953
2021-01-14

Methods and systems for defects detection and classification using X-rays

#14
20200300784
2020-09-24

Inspection device, inspection method, and method for producing object to be inspected

#15
20180231478
2018-08-16

Detection of crystallographic properties in aerospace components

#16
20180059037
2018-03-01

Method of fabricating a reference blade for calibrating tomographic inspection, and a resulting reference blade

#17
20180053291
2018-02-22

Reference image contour generation

#18
20170089845
2017-03-30

Detection of crystallographic properties in aerospace components

#19
20160314572
2016-10-27

EBeam inspection method

#20
20150330912
2015-11-19

Defect sampling for electron beam review based on defect attributes from optical inspection and optical review

#21
20130255385
2013-10-03

X-ray backscatter system and method for detecting discrepancies in items

#22
20130140457
2013-06-06

Defect observation method and defect observation device

#23
20100288032
2010-11-18

Processes to create discrete corrosion defects on substrates and establish corrosion NDI test standards

#24
20100288031
2010-11-18

Processes to create discrete corrosion defects on substrates and establish corrosion NDI test standards

#25
20070220946
2007-09-27

Processes to create discrete corrosion defects on substrates and establish corrosion NDI test standards

#26
17454865
2024-04-02

System and method for crack detection

#27
17371525
2023-09-05

Radiographic crack image quality indicator system and method