170113 ⎘
Investigating materials by wave or particle radiation; Specific applications or type of materials voids
Void Inspection Method, Storage and Void Inspection System
#2Handheld inspection device and method of inspecting an infrastructure having a structure wall supported into material
#3Performance evaluation method for elastic material
#4Inspection position identification method, three-dimensional image generation method, and inspection device
#5Inspection position identification method, three-dimensional image generation method, and inspection device
#6Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process
#7Apparatus and method for calculating a recording trajectory
#8X-ray sidescatter inspection of laminates
#9Void evaluation apparatus and void evaluation method in the solder
#10X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
#11X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus