DETECTING TARGET MOLECULES USING ALPHA PARTICLE RADIOISOTOPES

METHOD FOR DIAGNOSING THYROID CARCINOMA

PROMPT GAMMA NEUTRON ACTIVATION ANALYSIS APPARATUS

LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES

SYSTEMS AND METHODS FOR IMPROVED ANALYSIS OF ELECTROMAGNETIC SPECTRA

DEVICE AND SYSTEM FOR DETECTING RADIATION EMITTED BY A SAMPLE IRRADIATED BY AN EXCITATION BEAM

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY TO MEASURE A FILM STACK

FILM CAPACITOR

NONDESTRUCTIVE INSPECTION SYSTEM

NONDESTRUCTIVE INSPECTING DEVICE

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS AND XRF TECHNOLOGIES

System of measuring image of pattern in high NA scanning-type EUV mask

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

METHOD, DEVICE AND MARKER SUBSTANCE KIT FOR MULTI-PARAMETRIC X-RAY FLUORESCENCE IMAGING

X-RAY FLUORESCENCE ANALYZER

Scanning mode application of neutron-induced gamma analysis for soil carbon mapping

SYSTEMS AND METHODS FOR PROCESSING MATERIALS WITH COMPLEX ISOTOPE VECTORS FOR USE AS A NUCLEAR FUEL

[18F]-Labeled Benzothiazole Derivative As PET Radiotracer

Non-invasive monitoring of atomic reactions to detect structural failure

X-ray analysis device including a spectrometer to detect characteristic X-rays and related X-ray analysis method

Feed-forward of multi-layer and multi-process information using XPS and XRF technologies

System and method for detection and identification of foreign elements in a substance by X-ray or Gamma-ray detection and emission

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry

Detection reagent, detection device, and method for detecting primary amide compound

Evaluating drill-in fluid performance in a wellbore

Method and device for inspection of semiconductor samples

IMAGING-DIRECTED NANOSCALE PHOTO-CROSSLINKING

Contact imaging sensor head for computed radiography

Surface analysis tools for process control of laser treatment of composites

System and method for computed laminography x-ray fluorescence imaging

Instrumented couplings

Nondestructive inspection method and apparatus comprising a neutron source and a gamma-ray detection device for determining a depth of a target component in an inspection target

Neutron imaging devices for cased wells and open boreholes

Estimating wear for BHA components using borehole hardness

Feed-forward of multi-layer and multi-process information using XPS and XRF technologies

Using absolute Z-height values for synergy between tools

Method and devices for determining metrology sites

Method for operating a signal filter and radiation detection system

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

Image processing device, image processing method and charged particle microscope

Scanning mode application of neutron-induced gamma analysis for soil carbon mapping

System and method for analyzing subsurface core samples

Normalization of a positron emission tomography scanner

Non-invasive monitoring of atomic reactions to detect structural failure

Contact imaging sensor head for computed radiography

Methods and systems for non-invasive measurement of soil chlorine and/or nitrogen content and for detecting sub-surface chlorine or nitrogen-containing objects

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

Graphene-based electro-microfluidic devices and methods for protein structural analysis

Feed-forward of multi-layer and multi-process information using XPS and XRF technologies

Method and system for X-ray fluorescence (XRF) analysis of exploration samples

Encoding information in chemical concentrations

Systems and methods for assaying an object

METHOD FOR MANUFACTURING COMPOSITE MEMBER

Methods for aligning a spectrometer

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

Charged particle beam device and pattern measurement device

Cross sectional depth composition generation utilizing scanning electron microscopy

Cross sectional depth composition generation utilizing scanning electron microscopy

Systems and methods for component identification

Cathodoluminescence-activated nanoscale imaging

Light amount detection device, immune analyzing apparatus and charged particle beam apparatus that each use the light amount detection device

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

Sample holder for X-ray analysis

Sample observation method and sample observation device

Methods for manufacturing doubly bent X-ray focusing device, doubly bent X-ray focusing device assembly, doubly bent X-ray spectroscopic device and doubly bent X-ray spectroscopic device assembly

Methods and systems for non-invasive measurement of soil chlorine and/or nitrogen content and for detecting sub-surface chlorine or nitrogen-containing objects

Grazing incidence x-ray fluorescence spectrometer and grazing incidence x-ray fluorescence analyzing method

Electron vibrometer and determining displacement of a cantilever

Cross sectional depth composition generation utilizing scanning electron microscopy

System for determining and imaging wax deposition and corrosion in pipelines

Multimodality mineralogy segmentation system and method

Apparatus and method of processing multi-component induction data

METHOD AND DEVICE FOR DETERMINING STRUCTURE OF MULTI-ELEMENT CRYSTAL

XRF/XRD system with dynamic management of multiple data processing units

X-ray device

System and method for imaging a secondary charged particle beam with adaptive secondary charged particle optics

Radioactive gas measurement apparatus and failed fuel inspection apparatus

Inspection device

VAPOR DEPOSITION EQUIPMENT INCLUDING A SELENIZATION PROCESS FOR FABRICATING CIGS FILM

SYSTEM FOR DETERMINING AND IMAGING WAX DEPOSITION AND CORROSION IN PIPELINES

Sensor integrated metal dielectric filters for solar-blind silicon ultraviolet detectors

Apparatus and method of processing multi-component induction data

Sample holder and charged particle device

Marker For Detection And Confirmation Of Peripheral Lung Nodules

System and method for measuring cooling of a component

X-ray fluorescence analyzer and measurement position adjusting method therefore

X-ray fluorescence analysis of thin-film coverage defects

Rare-earth oxyorthosilicates with improved growth stability and scintillation characteristics

Scanning electron microscope system capable of measuring in-cell overlay offset using high-energy electron beam and method thereof

Method and apparatus for radiation dosimetry utilizing fluorescent imaging with precision correction

Method and apparatus for predicting a growth rate of deposited contaminants

MATERIAL INSPECTION APPARATUS

Method for estimating shape before shrink and CD-SEM apparatus

Analysis device, analysis method, film formation device, and film formation method

Atmospheric pressure ion detector for outside air measurement

PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM

Adaptive data collection for local states of a material

Luminescence based spectrometers

Isotope specific arbitrary material sorter

Measuring method, data processing apparatus and electron microscope using same

Method of analyzing a sample and charged particle beam device for analyzing a sample

Enhanced alpha particle emitter

Method and a system for recognizing voids in a bump

Sample holder

Apparatus and methods for chirality detection

INSPECTION DEVICE

Method and system for estimating properties of porous media such as fine pore or tight rocks

Sample analyzing apparatus and sample analyzing method

On-belt analyser system

Defect observation method and defect observation device

Charged particle beam microscope

Charged-particle microscope providing depth-resolved imagery

Charged particle microscopy imaging method

Apparatus and methods for chirality detection

Method for characterizing a membrane in a wet condition by positron annihilation spectrometer and sample holder thereof

Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment

Nondestructive inspection apparatus and nondestructive inspection method for composite structure

Laser atom probe methods

Systems and methods of analyzing nucleic acid polymers and related components

Element mapping apparatus and element mapping image display method

On-belt analyser system

Charged particle beam apparatus and specimen inspection method

Atom probes, atom probe specimens, and associated methods

Systems and methods of analyzing nucleic acid polymers and related components

Method of forming a sample image and charged particle beam apparatus

Systems and methods of analyzing nucleic acid polymers and related components

Apparatus for detecting backscattered electrons in a beam apparatus

Positronium-mediated method for identifying a contaminant gas in a gaseous mixture

Method for inspecting defect and system therefor

Charged particle beam apparatus and method for charged particle beam adjustment

Online analysis device

NUCLEAR MATERIAL DETECTION METHOD

Cryptographic container security system

Positronium-mediated method for identifying an organism

Wafer-level testing of light-emitting resonant structures

Method and measuring arrangement for nondestructive analysis of an examination object by means of x-radiation

Laser atom probe methods

Pattern inspection method and system therefor

Pattern observation apparatus, pattern observation method, method of manufacturing semiconductor device, and program

Method and apparatus for material identification

Apparatus, method, and computer program product for deconvolution analysis

Method for inspecting defect and system therefor

Elemental analyzer apparatus and method

Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system

Systems and methods of analyzing nucleic acid polymers and related components

Ultraviolet emitting scintillators for oil detection

Systems and methods of analyzing nucleic acid polymers and related components

Systems and methods of analyzing nucleic acid polymers and related components

Systems and methods of analyzing nucleic acid polymers and related components

Apparatus for radiation image recording

Nuclear material detection apparatus and method

Method for on-line evaluation of materials using prompt gamma ray analysis

Method and system for the examination of specimen

Apparatus and method for suppressing insignificant variations in measured sample composition data, including data measured from dynamically changing samples using x-ray analysis techniques

Optical alignment of X-ray microanalyzers

System and method for inspecting charged particle responsive resist

Individually addressable nanoelectrode array

Coincidence technique-based x-ray detection device and composition analysis method

Contact imaging sensor head for computed radiography

Automated SEM nanoprobe tool

Method and system for perceiving a boundary between a first region and second region of a superabrasive volume

Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume