168332 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by measuring secondary emission from the material Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
Sub-classes:DYNAMIC MULTI-WAVELENGTH AND SAMPLE VOLTAGE ATOM PROBE TOMOGRAPH FEEDBACK CONTROL SYSTEM
#2METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD FOR CLASSIFYING SEMICONDUCTOR STRUCTURE
#3PHOTOELECTRON EMISSION MICROSCOPE
#4Process and device for the spatially resolved localization of defects in materials
#5AN ILLUMINATION CONTROL DEVICE FOR A CHARGED PARTICLE ANALYSER
#6COMPUTER-IMPLEMENTED METHOD FOR GENERATING EVENT-AVERAGED AND TIME-RESOLVED SPECTRA
#7Carbon-based optical sensor element for measuring greenhouse gas concentration
#8LASER LIGHT SOURCE AND PHOTOELECTRON MICROSCOPE
#9Electron microscope, and method for observing measurement sample
#10METHOD OF GENERATING LOCAL ELECTRIC FIELDS
#11Apparatus for electrodeless measurement of electron mobility in nano material, apparatus for electrodeless measurement of hole mobility in nano material, method for electrodeless measurement of electron mobility in nano material, and method for electrodeless measurement of hole mobility in nano material
#12Time-resolved photoemission electron microscopy and method for imaging carrier dynamics using the technique
#13Adsorbate analysis using optically stimulated electron emission
#14Optical device for estimating a center of gravity of an aircraft
#15Detector supplement device for spectroscopy setup
#16Electrostatic lens, and parallel beam generation device and parallel beam convergence device which use electrostatic lens and collimator
#17Analysis method for obtaining XPS and AES and elements in each chemical bonding state and X-ray photoelectron spectroscope for same
#18Multi-channel aerosol scattering absorption measuring instrument
#19Reflective Photomask, Method for Inspecting Same and Mask Blank
#20Inspection system by charged particle beam and method of manufacturing devices using the system
#21Inspection system by charged particle beam and method of manufacturing devices using the system
#22Systems and methods for defect detection using exoelectrons
#23Electrode member, electron energy analyzer, photoelectron energy analyzer, and temperature measuring apparatus
#24Inspection system by charged particle beam and method of manufacturing devices using the system
#25APPARATUS AND METHOD FOR ARRAY GEM DIGITAL IMAGING RADIATION DETECTOR
#26Inspection system by charged particle beam and method of manufacturing devices using the system
#27Spherical aberration corrected electrostatic lens, input lens, electron spectrometer, photoemission electron microscope and measuring system
#28Resin film evaluation method and method for manufacturing a semiconductor device
#29Pattern measurement apparatus and pattern measuring method
#30Inspection system by charged particle beam and method of manufacturing devices using the system
#31Non-destructive testing method and apparatus
#32Electron Spectroscope With Emission Induced By A Monochromatic Electron Beam
#33Photoelectron Measuring Device
#34Method and apparatus for measuring purity of noble gases
#35Endpoint detection for the patterning of layered materials
#36Method and device for measuring quantity of wear
#37Method and apparatus for nanoscale surface analysis using soft X-rays
#38Material surface analyzing method
#39Combinatorial screening system and X-ray diffraction and Raman spectroscopy
#40Method for non-destructive testing
#41Morphology and Spectroscopy of Nanoscale Regions using X-Rays Generated by Laser Produced Plasma
#42Method and apparatus for inspecting defects