168321 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by measuring secondary emission from the material; Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement all measurements being of a secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement
Downhole lithium detection systems and methods
#2METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
#3PATTERNED X-RAY EMITTING TARGET
#4Direct Sampling from Phase-Separated Sample for Hydrophobicity Assessment
#5METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEASURING CONTENT OF SILICON CARBIDE BY USING XPS
#6METHOD FOR CLASSIFYING UNKNOWN PARTICLES ON A SURFACE OF A SEMI-CONDUCTOR WAFER
#7Method and system for non-destructive metrology of thin layers
#8SYSTEM AND METHOD FOR DETERMINING MASS FRACTIONS IN A TEST SAMPLE WITH WAVE-LENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETERS
#9MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
#10GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORESCENCE AND SPECTROSCOPY
#11Phase Analyzer, Sample Analyzer, and Analysis Method
#12Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometer
#13Patterned x-ray emitting target
#14Method and system for non-destructive metrology of thin layers
#15Method of calculating thickness of graphene layer and method of measuring content of silicon carbide by using XPS
#16Systems, devices, and methods for x-ray fluorescence analysis of geological samples
#17Analyzer
#18Particle measuring device and particle measuring method
#19Method and system for non-destructive metrology of thin layers
#20System and process for in-process electron beam profile and location analyses
#21Graphene-based electro-microfluidic devices and methods for protein structural analysis
#22Nondestructive inspection system
#23Method and system for non-destructive metrology of thin layers
#24METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
#25ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUS
#26Method for rapid analysis of gold
#27Quantitative X-ray analysis—multi optical path instrument
#28Combined handheld XRF and OES systems and methods
#29Silicon germanium thickness and composition determination using combined XPS and XRF technologies
#30Semiconductor inspection device including a counter electrode with adjustable potentials used to obtain images for detection of defects, and inspection method using charged particle beam
#31Cross-section processing and observation method and cross-section processing and observation apparatus
#32Cross-section processing and observation method and cross-section processing and observation apparatus
#33Method for determining the performance of a photolithographic mask
#34Composite charged particle beam apparatus
#35Charged particle beam device, position specification method used for charged particle beam device, and program
#36Sample inspection methods, systems and components
#37Variable rate scanning in an electron microscope
#38Section image acquiring method using combined charge particle beam apparatus and combined charge particle beam apparatus
#39Methods and systems for non-intrusive chemical assaying of hydrogenous materials and mixtures using combined neutron activation and nuclear resonance fluorescence