168328 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM] Measuring cathodoluminescence
Polishing State Analysis Prediction Program, Storage Device, Cathodeluminescence Device, and Polishing State Analysis Prediction Method
#2SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
#3Method for quantitatively analyzing reservoir formation of ultra-deep evaporite-dolomite symbiotic system
#4MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
#5Apparatus and method for projecting an array of multiple charged particle beamlets on a sample
#6Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
#7Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
#8Method for improving an EBSD/TKD map
#9Dislocation type and density discrimination in semiconductor materials using cathodoluminescence measurements
#10Method of examining a sample using a charged particle microscope
#11Electric conductivity-measuring material, electric conductivity-measuring film, electric conductivity-measuring device, and electric conductivity-measuring method, as well as electric resistivity-measuring material, electric resistivity-measuring film, electric resistivity-measuring device, and electric resistivity-measuring method
#12Methods of inspecting samples with multiple beams of charged particles
#13Object preparation device and particle beam device with an object preparation device and method for operating the particle beam device
#14Object preparation device and particle beam device having an object preparation device and method for operating the particle beam device
#15Devices and methods for spectroscopic analysis
#16Cathodoluminescence-activated nanoscale imaging
#17Nanoscale optical tomography with cathodoluminescence spectroscopy
#18Method for evaluating semiconductor substrate
#19Analyzing an object using a particle beam apparatus
#20Method of checking forsterite, apparatus that evaluates forsterite, and production line that manufactures steel sheet
#21Defect observation method and defect observation device
#22Adjustable cathodoluminescence detection system and microscope employing such a system
#23Devices and methods for spectroscopic analysis
#24Method of analyzing a sample and charged particle beam device for analyzing a sample
#25Multi-color nanoscale imaging based on nanoparticle cathodoluminescence
#26SYSTEM AND METHOD FOR MEASURING ANGULAR LUMINESCENCE IN A CHARGED PARTICLE MICROSCOPE
#27Image processing apparatus, image processing method
#28Adjustable cathodoluminescence detection system and microscope employing such a system
#29Detection device and particle beam device having a detection device
#30System and method for cathodoluminescence-based semiconductor wafer defect inspection