171139 ⎘
Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
Sub-classes:SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM
#2SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING USING SEMI-KINEMATIC COUPLING
#3SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING
#4Method of examining a sample in a scanning tunneling microscope using tip-to-sample distance variations
#5MULTI-MODAL MICROSCOPIC IMAGING
#6MULTI-MODAL MICROSCOPIC IMAGING
#7Systems and methods for optogenetic imaging
#8Systems and methods for optogenetic imaging using semi-kinematic coupling
#9Systems and methods for optogenetic imaging
#10Systems and methods for optogenetic imaging
#11Method and apparatus for detecting an energized e-field
#12Programmable light curtains
#13Depassivation lithography by scanning tunneling microscopy
#14Atomic force microscope with optical guiding mechanism
#15MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND APPLICATIONS
#16Systems and methods for optogenetic imaging
#17Method and apparatus for detecting an energized e-field
#18Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view
#19ISOLATED WET CELL
#20Scanning probe microscope combined with a device for modifying the surface of an object
#21Method for evaluating structural change during production process, and analysis program
#22Quantitative measurements using multiple frequency atomic force microscopy
#23Scanning probe microscope and measurement method using the same
#24Stimulating an optical sensor using optical radiation pressure
#25Systems and devices for non-destructive surface chemical analysis of samples
#26Method and apparatus for detecting an energized e-field
#27Modular atomic force microscope with environmental controls
#28Scanning probe microscope and method for examining a surface with a high aspect ratio
#29Harmonic feedback atomic force microscopy
#30Measuring method of scanning probe microscopy using penetrative pressing force
#31Electrode control methodology for a scanning tunneling microscope
#32Systems and methods for non-destructive surface chemical analysis of samples
#33Quantitative measurements using multiple frequency atomic force microscopy
#34Scanning ion conductance microscopy using surface roughness for probe movement
#35Dual-probe scanning probe microscope
#36Debris removal from high aspect structures
#37Debris removal in high aspect structures
#38Apparatus for scanning nano structure with plural AFM probes and method thereof
#39Scanning probe microscope and control method thereof
#40Head limiting movement range of laser spot and atomic force microscope having the same
#41NANOTIPPED DEVICE AND METHOD
#42Probe microscope with probe movement from heating
#43Scanning mechanism and scanning probe microscope
#44Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample
#45Variable density scanning
#46Method and device for controlling a scanning probe microscope
#47Surface force measuring method and surface force measuring apparatus
#48Methods, devices, and systems for forming atomically precise structures
#49Modular atomic force microscope with environmental controls
#50Intermittent contact resonance atomic force microscope and process for intermittent contact resonance atomic force microscopy
#51AM/FM measurements using multiple frequency of atomic force microscopy
#52Method to obtain absorption spectra from near-field infrared scattering using homo-dyne detection
#53System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
#54Multiple probe actuation
#55Method for measuring vibration characteristic of cantilever
#56ATOMIC FORCE MICROSCOPY USING CORRELATED PROBE OSCILLATION AND PROBE-SAMPLE BIAS VOLTAGE
#57Method and apparatus to compensate for deflection artifacts in an atomic force microscope
#58Multiple probe actuation
#59Photothermal actuation of a probe for scanning probe microscopy
#60Force measurement with real-time baseline determination
#61Scanning mechanism and scanning probe microscope
#62Modular atomic force microscope with environmental controls
#63Multi-actuator design and control for a high-speed/large-range nanopositioning system
#64Scanning probe microscope
#65Fully digitally controller for cantilever-based instruments
#66Method and apparatus for detecting an energized E-field
#67MULTI-RESONANT DETECTION SYSTEM FOR ATOMIC FORCE MICROSCOPY
#68Scanning probe microscope with improved feature location capabilities
#69Method and apparatus of physical property measurement using a probe-based nano-localized light source
#70ILLUMINATION FOR OPTICAL SCAN AND MEASUREMENT
#71Optical scanning and measurement
#72Scanning probe microscope
#73Scanning probe microscope comprising an isothermal actuator
#74Compound microscope
#75Variable Density Scanning
#76Beam scanning system
#77Scanning mechanism and scanning probe microscope
#78Probe actuation
#79Motion sensor integrated nano-probe N/MEMS apparatus, method, and applications
#80SCANNING PROBE MICROSCOPE
#81Sealed AFM cell
#82Dual-probe scanning probe microscope
#83Method and apparatus for adaptive tracking using a scanning probe microscope
#84Method and apparatus of physical property measurement using a probe-based nano-localized light source
#85Potential measurement device and atomic force microscope
#86Scanning probe microscope and control method thereof
#87Modular Atomic Force Microscope
#88ULTRA-COMPACT NANOCAVITY-ENHANCED SCANNING PROBE MICROSCOPY AND METHOD
#89System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
#90Atomic force microscope system using selective active damping
#91Scanning probe microscope
#92Apparatus and method for analyzing and modifying a specimen surface
#93Atomic force microscopy controller and method
#94Atomic Force Microscope Manipulation of Living Cells
#95Scanning method for scanning a sample with a probe
#96Scanning probe microscope
#97NEAR FIELD OPTICAL MICROSCOPE WITH OPTICAL IMAGING SYSTEM
#98Quantitative measurements using multiple frequency atomic force microscopy
#99Fully digitally controller for cantilever-based instruments
#100Atomic force microscope manipulation of living cells
#101Nanotipped device and method
#102Scanning Ion Conductance Microscopy
#103Fully digitally controller for cantilever-based instruments
#104Scanning probe microscope
#105Nanotipped device and method
#106Fully digitally controller for cantilever-based instruments
#107Nanotipped device and method
#108Scanning probe sensor with a ferromagnetic fluid
#109Scanning probe microscope
#110Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode
#111Illumination for optical scan and measurement
#112Scanning probe microscope