171142 ⎘
Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe; Fine scanning or positioning Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
Atomic Force Microscope Based Infrared Spectroscopy With Multiple Laser Pulse Repetition Rate Excitation And Optional Force Volume Operation
#2METHOD FOR FORMING MICRO-PATTERN ON SURFACE OF PRODUCT, AND PRODUCT HAVING MICRO-PATTERN FORMED THEREON BY APPLYING METHOD
#3SCANNING METHOD AND DEVICE FOR SCANNING PROBE MICROSCOPE BASED ON HIGH-SPEED INSTANTANEOUS FORCE CONTROL
#4LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE
#5Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes
#6Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device
#7OPTOMECHANICAL TRANSDUCER
#8Method of imaging a surface using a scanning probe microscope
#9Integrated dual-probe rapid in-situ switching measurement method and device of atomic force microscope
#10AFM imaging with creep correction
#11Cantilever, scanning probe microscope, and measurement method using scanning probe microscope
#12Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imaging
#13Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating
#14Apparatus and method for a scanning probe microscope
#15Scanning probe microscope, scan head and method
#16Micro-optomechanical system and method for the production thereof
#17Cantilever with a collocated piezoelectric actuator-sensor pair
#18Measuring device for a scanning probe microscope and method for scanning probe microscopy of a measurement sample by means of a scanning probe microscope
#19Surface analyzer
#20Method for producing a probe suitable for scanning probe microscopy
#21Multiple integrated tips scanning probe microscope
#22Testing device and method for measuring adhesion force between gas hydrate and mineral particles
#23Multi-axis positioning device
#24Scanning probe microscope
#25Apparatus and method for a scanning probe microscope
#26Scanning probe microscope and cantilever moving method
#27Scanning probe microscope and method for increasing a scan speed of a scanning probe microscope in the step-in scan mode
#28Nozzle inspection method and apparatus
#29Multiple integrated tips scanning probe microscope
#30Microfluidic cell for atomic force microscopy
#31Scanning probe microscope and scanning method thereof
#32Compact probe for atomic-force microscopy and atomic-force microscope including such a probe
#33Miniaturized and compact probe for atomic force microscopy
#34Method and device of using a scanning probe microscope
#35SELF-SENSING ARRAY OF MICROCANTILEVERS FOR CHEMICAL DETECTION
#36Microwave impedance microscopy using a tuning fork
#37Test mass compensation of mass measurement drift in a microcantilever resonator
#38Dynamic sweep-plow microcantilever device and methods of use
#39Scanning probe microscope and method for examining a surface with a high aspect ratio
#40Probe actuation system with feedback controller
#41Probe system with multiple actuation locations
#42Consensus-based multi-piezoelectric microcantilever sensor
#43Measurement apparatus and method with adaptive scan rate
#44Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample
#45Interface of a microfabricated scanning force sensor for combined force and position sensing
#46Multiple probe actuation
#47Multiple probe detection and actuation
#48Multiple probe actuation
#49Photothermal actuation of a probe for scanning probe microscopy
#50Test mass compensation of mass measurement drift in a microcantilever resonator
#51Scanning probe microscope comprising an isothermal actuator
#52Beam scanning system
#53Probe actuation
#54Atomic force microscope system using selective active damping
#55Atomic force microscope probe, method for preparing same, and uses thereof
#56Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
#57Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
#58Micro-mechanical component with cantilever integrated electrical functional element
#59Metal tip for scanning probe applications and method of producing the same
#60Scanning probe microscope and method for detecting proximity of probes thereof
#61Self-sensing array of microcantilevers for chemical detection
#62Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantilevers
#63Piezoelectric microcantilevers and uses in atomic force microscopy
#64Fast microscale actuators for probe microscopy
#65Device comprising a cantilever and scanning system
#66Device and method for an atomic force microscope for the study and modification of surface properties
#67Apparatus and method for investigating surface properties of different materials
#68Microprobe, measurement system and method
#69SELF-SENSING ARRAY OF MICROCANTILEVERS CHEMICAL DETECTION
#70Cantilevers with integrated piezoelectric actuators for probe microscopy
#71Mechanically-coupled tuning fork-scanning probe vibrating system
#72Coupled mass-spring systems and imaging methods for scanning probe microscopy
#73Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever
#74Oscillating scanning probe microscope
#75Piezoelectric microcantilevers and uses in atomic force microscopy
#76Cantilevers with integrated actuators for probe microscopy
#77Scanning Probe Microscope, Nanomanipulator with Nanospool, Motor, nucleotide cassette and Gaming application
#78Oscillator and method of making for atomic force microscope and other applications
#79Thermal mechanical drive actuator, thermal probe and method of thermally driving a probe
#80Probe module with integrated actuator for a probe microscope
#81Method and apparatus of high speed property mapping
#82Oscillator for atomic force microscope and other applications
#83Oscillator and method of making for atomic force microscope and other applications
#84Self-sensing array of microcantilevers for chemical detection
#85Measuring system for the combined scanning and analysis of microtechnical components comprising electrical contacts
#86MEMS differential actuated nano probe and method for fabrication
#87Oscillating scanning probe microscope
#88MEMS differential actuated nano probe and method for fabrication
#89Active probe for an atomic force microscope and method for use thereof