Patents-Review.com
ClassID:

171144 ⎘

G01Q10/065 - CPC Classification

Classification description:

Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe; Fine scanning or positioning; Circuits or algorithms therefor Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself

Recent Application in this class:
#1
20250370002
2025-12-04

Controlled Indentation Instrumentation Working in Dynamical Mechanical Analysis Mode

 #2
20250362321
2025-11-27

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP

 #3
20250321245
2025-10-16

SCANNING PROBE SYSTEMS AND FEEDBACK CONTROL METHODS BASED ON DERIVATIVE TUNNELING SIGNAL REGULATION

 #4
20250290948
2025-09-18

Atomic Force Microscope Based Infrared Spectroscopy With Multiple Laser Pulse Repetition Rate Excitation And Optional Force Volume Operation

 #5
20250264497
2025-08-21

SCANNING PROBE MICROSCOPE

 #6
20250130251
2025-04-24

PROBE DEVICE, PROBE CONTROL APPARATUS AND METHOD

 #7
20250067769
2025-02-27

SCANNING PROBE MICROSCOPY SYSTEM AND METHOD OF OPERATING SUCH A SYSTEM

 #8
20250004010
2025-01-02

ATOMIC FORCE MICROSCOPE (AFM) DEVICE AND METHOD OF OPERATING THE SAME

 #9
20240264199
2024-08-08

Method of examining a sample in an atomic force microscope using attractive tip-to-sample interaction

 #10
20240230709
2024-07-11

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP

 #11
20240210444
2024-06-27

USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQUE IN A SALT FOG CORROSION TEST

 #12
20240210443
2024-06-27

FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY DEVICE AND METHOD OF CALIBRATING A POSITION OF A PROBE TIP

 #13
20240110939
2024-04-04

AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME

 #14
20230251285
2023-08-10

Device and method for operating a bending beam in a closed control loop

 #15
20230251284
2023-08-10

Automated optimization of AFM light source positioning

 #16
20230030991
2023-02-02

Method of imaging a surface using a scanning probe microscope

 #17
20230018874
2023-01-19

Scanning probe microscope and method for resonance-enhanced detection using a range of modulation frequencies

 #18
20220390484
2022-12-08

Scanning probe system

 #19
20220308086
2022-09-29

Probe for scanning probe microscope and binary state scanning probe microscope including the same

 #20
20220260612
2022-08-18

Phase-shift-based amplitude detector for a high-speed atomic force microscope

 #21
20220244289
2022-08-04

Automated optimization of AFM light source positioning

 #22
20220146548
2022-05-12

Apparatus and method for a scanning probe microscope

 #23
20220082583
2022-03-17

Device and method for operating a bending beam in a closed control loop

 #24
20220082582
2022-03-17

Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software

 #25
20210318353
2021-10-14

System and method of performing scanning probe microscopy on a substrate surface

 #26
20210311090
2021-10-07

Scanning probe microscope and a method for operating thereof

 #27
20210293849
2021-09-23

Scanning probe microscope and setting method thereof

 #28
20210190818
2021-06-24

Compensating control signal for raster scan of a scanning probe microscope

 #29
20210172976
2021-06-10

Phase-shift-based amplitude detector for a high-speed atomic force microscope

 #30
20210132109
2021-05-06

Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software

 #31
20200400715
2020-12-24

Measuring device for a scanning probe microscope and method for scanning probe microscopy of a measurement sample by means of a scanning probe microscope

 #32
20200371134
2020-11-26

AFM with suppressed parasitic signals

 #33
20200341027
2020-10-29

Scanning probe microscope with case and elastic body

 #34
20200191826
2020-06-18

Method and apparatus of operating a scanning probe microscope

 #35
20200141970
2020-05-07

Scanning probe microscope

 #36
20200116754
2020-04-16

Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample

 #37
20200116480
2020-04-16

SUBSTRATE CLEANING METHOD, SUBSTRATE CLEANING APPARATUS, SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING SYSTEM, MACHINE LEARNING DEVICE, AND PREDICTION DEVICE

 #38
20200041540
2020-02-06

Scanning probe system

 #39
20200025796
2020-01-23

Apparatus and method for a scanning probe microscope

 #40
20200011893
2020-01-09

Scanning probe system

 #41
20190391178
2019-12-26

Feedback correction in sub-resonant tapping mode of an atomic force microscope

 #42
20190369139
2019-12-05

Atomic force microscopy device, method and lithographic system

 #43
20190353680
2019-11-21

Sample container mounting member and sample container sealing method

 #44
20190353679
2019-11-21

High-precision scanning device

 #45
20190331711
2019-10-31

Scanning probe microscope and light intensity adjusting method

 #46
20190250524
2019-08-15

Alignment system and method

 #47
20190094267
2019-03-28

Method of controlling a probe using constant command signals

 #48
20190094266
2019-03-28

Method of operating an AFM

 #49
20190094265
2019-03-28

AFM with suppressed parasitic signals

 #50
20190077024
2019-03-14

Integrated measurement and micromechanical positioning apparatus for real-time test control

 #51
20190018040
2019-01-17

Method and apparatus of using peak force tapping mode to measure physical properties of a sample

 #52
20180299480
2018-10-18

Scanning probe microscope

 #53
20180299479
2018-10-18

Force Measurement with Real-Time Baseline Determination

 #54
20180272523
2018-09-27

Linked micromechanical positioning apparatus for real-time testing and measurement

 #55
20180217180
2018-08-02

Automatic calibration and tuning of feedback systems

 #56
20180210007
2018-07-26

Systems and methods for nano-tribological manufacturing of nanostructures

 #57
20180164342
2018-06-14

Scanning probe system

 #58
20180149673
2018-05-31

Apparatus and methods for investigating a sample surface

 #59
20180143220
2018-05-24

Atomic force microscope and control method of the same

 #60
20180136251
2018-05-17

Method and apparatus of operating a scanning probe microscope

 #61
20180120343
2018-05-03

Atomic force microscope and control method of the same

 #62
20180106830
2018-04-19

Method and device of using a scanning probe microscope

 #63
20180100875
2018-04-12

Methods, devices and systems for scanning tunneling microscopy control system design

 #64
20170356930
2017-12-14

Method and system for positioning using near field transducers, particularly suited for positioning electronic chips

 #65
20170285067
2017-10-05

Scanning probe microscope and probe contact detection method

 #66
20170261532
2017-09-14

Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope

 #67
20170242052
2017-08-24

Method and apparatus of operating a scanning probe microscope

 #68
20170227577
2017-08-10

Force measurement with real-time baseline determination

 #69
20170199219
2017-07-13

High speed adaptive-multi-loop mode imaging atomic force microscopy

 #70
20170131324
2017-05-11

Scanning probe microscope

 #71
20170102407
2017-04-13

Scanning probe microscope and method for examining a surface with a high aspect ratio

 #72
20170082685
2017-03-23

Probe-based data collection system with adaptive mode of probing controlled by local sample properties

 #73
20170074901
2017-03-16

Probe actuation system with feedback controller

 #74
20170052210
2017-02-23

Measuring method for atomic force microscope

 #75
20170038410
2017-02-09

Harmonic feedback atomic force microscopy

 #76
20170016932
2017-01-19

Probe system with multiple actuation locations

 #77
20160356808
2016-12-08

Measurement apparatus and method with adaptive scan rate

 #78
20160356807
2016-12-08

Electrode control methodology for a scanning tunneling microscope

 #79
20160313369
2016-10-27

Automated atomic force microscope and the operation thereof

 #80
20160313367
2016-10-27

Method and apparatus of operating a scanning probe microscope

 #81
20160274146
2016-09-22

Scanning ion conductance microscopy using surface roughness for probe movement

 #82
20160274144
2016-09-22

Method and apparatus of using peak force tapping mode to measure physical properties of a sample

 #83
20160274143
2016-09-22

Dual-probe scanning probe microscope

 #84
20160266166
2016-09-15

Closed loop controller and method for fast scanning probe microscopy

 #85
20160258979
2016-09-08

Method and apparatus of operating a scanning probe microscope

 #86
20160216293
2016-07-28

Scanning probe microscope and control method thereof

 #87
20160178659
2016-06-23

Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode

 #88
20160154022
2016-06-02

Probe microscope with probe movement from heating

 #89
20160077016
2016-03-17

Evaluation system and a method for evaluating a substrate

 #90
20160047841
2016-02-18

Signal detection circuit and scanning probe microscope

 #91
20150369838
2015-12-24

Method and device for controlling a scanning probe microscope

 #92
20150301080
2015-10-22

Automated atomic force microscope and the operation thereof

 #93
20150241469
2015-08-27

Precise probe placement in automated scanning probe microscopy systems

 #94
20150198630
2015-07-16

Closed loop controller and method for fast scanning probe microscopy

 #95
20150034821
2015-02-05

Ionization apparatus, mass spectrometer including ionization apparatus, and image forming system

 #96
20140366228
2014-12-11

Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopy

 #97
20140338073
2014-11-13

Method and device for controlling a scanning probe microscope

 #98
20140283229
2014-09-18

Method and apparatus of operating a scanning probe microscope

 #99
20140283228
2014-09-18

Dual-probe scanning probe microscope

 #100
20140230103
2014-08-14

Method and apparatus of using peak force tapping mode to measure physical properties of a sample

 #101
20140223615
2014-08-07

Method and apparatus of operating a scanning probe microscope

 #102
20140223613
2014-08-07

Scanning probe microscope and control method thereof

 #103
20140150139
2014-05-29

Method of controlling frequency modulated-atomic force microscope

 #104
20140137300
2014-05-15

Atomic force microscope system using selective active damping

 #105
20140026263
2014-01-23

Adaptive mode scanning probe microscope

 #106
20130333076
2013-12-12

Atomic force microscopy controller and method

 #107
20130312143
2013-11-21

Scanning ion conductance microscopy using piezo actuators of different response times

 #108
20130276174
2013-10-17

Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode

 #109
20130110262
2013-05-02

Automatic tuning of atomic force microscope

 #110
20130061356
2013-03-07

Active damping of high speed scanning probe microscope components

 #111
20130042375
2013-02-14

Control system for a scanning probe microscope

 #112
20130007929
2013-01-03

Frequency measuring and control apparatus with integrated parallel synchronized oscillators

 #113
20120304343
2012-11-29

Automatic gain tuning in atomic force microscopy

 #114
20120151637
2012-06-14

Scanning type probe microscope

 #115
20120137395
2012-05-31

SCANNED PROBE MICROSCOPE WITHOUT INTERFERENCE OR GEOMETRIC CONSTRAINT FOR SINGLE OR MULTIPLE PROBE OPERATION IN AIR OR LIQUID

 #116
20120131702
2012-05-24

Method and apparatus of using peak force tapping mode to measure physical properties of a sample

 #117
20120124706
2012-05-17

Scanning probe microscope and method for detecting proximity of probes thereof

 #118
20120118036
2012-05-17

SYSTEM AND METHOD FOR REDUCING THE AMPLITUDE OF THERMALLY INDUCED VIBRATIONS IN MICROSCALE AND NANOSCALE SYSTEMS

 #119
20120030845
2012-02-02

Scanning probe microscope

 #120
20110296564
2011-12-01

Scanning probe microscope with current controlled actuator

 #121
20110296561
2011-12-01

Control system for scanning probe microscope

 #122
20110289635
2011-11-24

Resonance compensation in scanning probe microscopy

 #123
20110277192
2011-11-10

Scanning probe microscope with drift compensation

 #124
20110271412
2011-11-03

Method for measuring a piezoelectric response by means of a scanning probe microscope

 #125
20110261352
2011-10-27

Scan device for microscope measurement instrument

 #126
20110247106
2011-10-06

Dynamic probe detection system

 #127
20110193510
2011-08-11

Positioning system and method

 #128
20110191917
2011-08-04

Harmonic correcting controller for a scanning probe microscope

 #129
20110167525
2011-07-07

Probe detection system

 #130
20110167524
2011-07-07

Method and apparatus of operating a scanning probe microscope

 #131
20110138506
2011-06-09

METHOD OF PROBE ALIGNMENT

 #132
20110131690
2011-06-02

Scanning Ion Conductance Microscopy

 #133
20110107471
2011-05-05

Scanning probe microscope having support stage incorporating a kinematic flexure arrangement

 #134
20110098926
2011-04-28

Alignment and anti-drift mechanism

 #135
20110062964
2011-03-17

METHOD AND APPARATUS FOR MEASURING SURFACE PROPERTIES

 #136
20110055981
2011-03-03

Device for Positioning a Moveable Object of Submicron Scale

 #137
20110047662
2011-02-24

Apparatus and method for investigating surface properties of different materials

 #138
20110016592
2011-01-20

Iterative feedback tuning in a scanning probe microscope

 #139
20100257641
2010-10-07

Real-time, active picometer-scale alignment, stabilization, and registration in one or more dimensions

 #140
20100132078
2010-05-27

Method for measuring the force of interaction in a scanning probe microscope

 #141
20100128342
2010-05-27

Coherent demodulation with reduced latency adapted for use in scanning probe microscopes

 #142
20100122385
2010-05-13

Method and apparatus of operating a scanning probe microscope

 #143
20100116038
2010-05-13

FEEDBACK- ENHANCED THERMO-ELECTRIC TOPOGRAPHY SENSING

 #144
20100115674
2010-05-06

Atomic force microscope apparatus

 #145
20100064397
2010-03-11

CONTROLLED ATOMIC FORCE MICROSCOPE

 #146
20100036636
2010-02-11

Digital damping control of nanomechanical test instruments

 #147
20100031404
2010-02-04

Scanning probe microscope with periodically phase-shifted AC excitation

 #148
20100024082
2010-01-28

Atomic force microscope

 #149
20090313729
2009-12-17

Scan type probe microscope and cantilever drive device

 #150
20090293161
2009-11-26

Cantilever device and cantilever controlling method

 #151
20090293160
2009-11-26

Automatic landing method and apparatus for scanning probe microscope using the same

 #152
20090276924
2009-11-05

Scanning probe microscope and active damping drive control device

 #153
20090260113
2009-10-15

Probe microscope setup method

 #154
20090222958
2009-09-03

Method and apparatus for obtaining quantitative measurements using a probe based instrument

 #155
20090140142
2009-06-04

SCANNING PROBE MICROSCOPE AND MEASURING METHOD THEREBY

 #156
20090139315
2009-06-04

Non-destructive ambient dynamic mode AFM amplitude versus distance curve acquisition

 #157
20090133168
2009-05-21

Scanning probe microscope

 #158
20090062935
2009-03-05

Automatic generation of PID parameters for a scanning probe microscope

 #159
20090032706
2009-02-05

Fast-scanning SPM and method of operating same

 #160
20090032703
2009-02-05

High-bandwidth actuator drive for scanning probe microscopy

 #161
20090021747
2009-01-22

Shape measuring apparatus

 #162
20080295585
2008-12-04

Tweezer-equipped scanning probe microscope and transfer method

 #163
20080277582
2008-11-13

Closed loop controller and method for fast scanning probe microscopy

 #164
20080236259
2008-10-02

Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe Microscope

 #165
20080229813
2008-09-25

Phase feedback AFM and control method therefor

 #166
20080098804
2008-05-01

Method for rapid seeks to the measurement surface for a scanning probe microscope

 #167
20080047334
2008-02-28

Scanning Microscope With Shape Correction Means

 #168
20080000292
2008-01-03

System for nano position sensing in scanning probe microscopes using an estimator

 #169
20080000291
2008-01-03

Method and apparatus for monitoring of a SPM actuator

 #170
20070294042
2007-12-20

Cantilever control device

 #171
20070290130
2007-12-20

Scanning probe microscope

 #172
20070277599
2007-12-06

Atomic force microscope technique for minimal tip damage

 #173
20070251305
2007-11-01

Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument

 #174
20070214864
2007-09-20

Active damping of high speed scanning probe microscope components

 #175
20070163335
2007-07-19

Method and apparatus for measuring electrical properties in torsional resonance mode

 #176
20070033991
2007-02-15

Tracking qualification and self-optimizing probe microscope and method

 #177
20070024301
2007-02-01

Electrical feedback detection system for multi-point probes

 #178
20060283240
2006-12-21

Method of making a force curve measurement on a sample

 #179
20060261264
2006-11-23

Feedback influenced increased-quality-factor scanning probe microscope

 #180
20060230474
2006-10-12

Method and apparatus for rapid automatic engagement of a probe

 #181
20060225490
2006-10-12

Adaptable end effector for atomic force microscopy based nano robotic manipulators

 #182
20060191329
2006-08-31

Dynamic activation for an atomic force microscope and method of use thereof

 #183
20060125465
2006-06-15

Evanescent microwave probe with enhanced resolution and sensitivity

 #184
20060113469
2006-06-01

Scanning probe microscope and sample observing method using this and semiconductor device production method

 #185
20060065047
2006-03-30

Atomic force microscope

 #186
20060027739
2006-02-09

Scanning probe microscope and method

 #187
20060000263
2006-01-05

Method and apparatus for obtaining quantitative measurements using a probe based instrument

 #188
20050212529
2005-09-29

Method and apparatus for measuring electrical properties in torsional resonance mode

 #189
20050199046
2005-09-15

Scanning probe microscope

 #190
20050127929
2005-06-16

Electrical feedback detection system for multi-point probes

 #191
20050120781
2005-06-09

Scanning probe microscope

 #192
20050081610
2005-04-21

Force scanning probe microscope

 #193
20050066714
2005-03-31

Active probe for an atomic force microscope and method for use thereof

 #194
20050050947
2005-03-10

Scanning probe microscope and scanning method

 #195
16555211
2022-10-04

Method of observing objects using a spinning localized observation