171146 ⎘
Monitoring the movement or position of the probe by optical means
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
#2APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORCE MICROSCOPE
#3Atomic Force Microscope Based Infrared Spectroscopy With Multiple Laser Pulse Repetition Rate Excitation And Optional Force Volume Operation
#4HYBRID NEAR-FIELD SCANNING MICROWAVE MICROSCOPE
#5SCANNING PROBE MICROSCOPE
#6SINGLE-MOLECULE FORCE SPECTROSCOPY-INFRARED SPECTROSCOPY (SMFS-IR) COUPLING METHOD AND SYSTEM, AND DEVICE
#7SCANNING PROBE MICROSCOPE AND METHOD OF ALIGNMENT, FOCUSING, AND MEASUREMENT
#8METHODS FOR POSITIONING A MEASUREMENT SPOT USING A SCANNING PROBE MICROSCROPE
#9SCANNING PROBE MICROSCOPE AND SAMPLE USED THEREIN
#10SCANNING PROBE MICROSCOPE
#11LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE
#12POSITIONING SYSTEM AND METHOD
#13LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCANNING MICROSCOPE DEVICE COMPRISING A LASER DIODE
#14DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
#15METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE
#16AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME
#17SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MAPPING
#18Defect detection using thermal laser stimulation and atomic force microscopy
#19Atomic force microscope
#20ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN A SCANNING PROBE MICROSCOPY SYSTEM
#21Nano robotic system for high throughput single cell DNA sequencing
#22METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEASURED, ATOMIC FORCE MICROSCOPE FOR PERFORMING SAME METHOD, AND COMPUTER PROGRAM STORED IN STORAGE MEDIUM TO PERFORM SAME METHOD
#23Automated optimization of AFM light source positioning
#24APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORCE MICROSCOPE
#25Truncated nonlinear interferometer-based sensor system
#26Debris removal from high aspect structures
#27Method of imaging a surface using a scanning probe microscope
#28Method and device for simultaneous independent motion measurement of multiple probes in atomic force microscope
#29Integrated dual-probe rapid in-situ switching measurement method and device of atomic force microscope
#30Scanning probe microscope and method for resonance-enhanced detection using a range of modulation frequencies
#31Atomic force microscope using artificial intelligence object recognition technology and operation method thereof
#32Information providing system, server device, and analyzer
#33Cantilever, scanning probe microscope, and measurement method using scanning probe microscope
#34Automated optimization of AFM light source positioning
#35Heterodyne scanning probe microscopy method and scanning probe microscopy system
#36Apparatus and method for examining and/or processing a sample
#37Probe for detecting near field and near-field detecting system including the same
#383D multipurpose scanning microscopy probes
#39Apparatus and method for a scanning probe microscope
#40Method and apparatus for examining a measuring tip of a scanning probe microscope
#41Torsion wing probe assembly
#42Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample
#43Atomic force microscope
#44Scanning probe microscope and scanning probe microscope optical axis adjustment method
#45Truncated non-linear interferometer-based sensor system
#46Array atomic force microscopy for enabling simultaneous multi-point and multi-modal nanoscale analyses and stimulations
#47High speed atomic force profilometry of large areas
#48SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING PHYSICAL QUANTITY USING SCANNING PROBE MICROSCOPE
#49Scanning type probe microscope and control device for scanning type probe microscope
#50Debris removal in high aspect structures
#51Micromechanical sensor with optical transduction
#52Scanning probe microscope and optical axis adjustment method in scanning probe microscope
#53Systems, method and computer-accessible medium for providing balanced asymmetric interferometry for vibrationally isolated optical scanning probe(s)
#54Truncated nonlinear interferometer-based atomic force microscopes
#55Apparatus and method for examining and/or processing a sample
#56Scanning probe microscope and position adjustment method for scanning probe microscope
#57Micro-optomechanical system and method for the production thereof
#58Apparatus and methods for quantum beam tracking
#59Method and apparatus for correcting responsivity variation in photothermal imaging
#60SYSTEM AND METHOD FOR OPTICAL DRIFT CORRECTION
#61Torsion wing probe assembly
#62Surface analyzer
#63Device integrated with scanning probe for optical nanofocusing and near-field optical imaging
#64Multiple integrated tips scanning probe microscope
#65Method and apparatus of operating a scanning probe microscope
#66Low drift system for a metrology instrument
#67Method and apparatus for examining a measuring tip of a scanning probe microscope
#68Scanning probe microscope
#69Heterodyne atomic force microscopy device, method and lithographic system
#70Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample
#71High speed atomic force profilometry of large areas
#72Apparatus and method for a scanning probe microscope
#73Scanning probe system
#74Scanning probe microscope
#75Atomic force microscopy device, method and lithographic system
#76SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MAPPING
#77Debris removal in high aspect structures
#78Scanning probe microscope and light intensity adjusting method
#79Metrological scanning probe microscope
#80Scanning probe microscope and cantilever moving method
#81Cryogenic cooling system
#82Scanning probe microscope
#83Debris removal from high aspect structures
#84Alignment system and method
#85Build Sequences for Mechanosynthesis
#86Scanning probe microscope
#87Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope
#88Multiple integrated tips scanning probe microscope
#89Atomic force microscope with optical guiding mechanism
#90Characterizing a height profile of a sample by side view imaging
#91Determining interaction forces in a dynamic mode AFM during imaging
#92Method for estimating a stiffness of a deformable part
#93Filed-mapping and focal-spot tracking for s-SNOM
#94Microscope comprising a movable objective-camera system with rolling shutter camera sensor and a multi-color strobe flash and method for scanning microscope slides with proper focus
#95Scanning probe microscopy utilizing separable components
#96Scanning probe microscope
#97Build sequences for mechanosynthesis
#98Measurement system
#99Scanning probe microscope
#100Systems and methods for nano-tribological manufacturing of nanostructures
#101Compact probe for atomic-force microscopy and atomic-force microscope including such a probe
#102Photonic probe for atomic force microscopy
#103Scanning probe microscope
#104Scanning probe system
#105Apparatus and methods for investigating a sample surface
#106Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view
#107Method and apparatus of operating a scanning probe microscope
#108Metrological scanning probe microscope
#109Build sequences for mechanosynthesis
#110Miniaturized and compact probe for atomic force microscopy
#111Scanning probe microscope
#112Method and device of using a scanning probe microscope
#113Scanning probe microscope using gradual increases and decreases in relative speed when shifting and reciprocating the scanned probe across a sample
#114Chemical nano-identification of a sample using normalized near-field spectroscopy
#115Modular Atomic Force Microscope
#116Method and apparatus of operating a scanning probe microscope
#117Field-mapping and focal-spot tracking for S-SNOM
#118Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression
#119Scanning probe microscope and optical axis adjustment method for scanning probe microscope
#120Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
#121Chemical nano-identification of a sample using normalized near-field spectroscopy
#122Optical beam positioning unit for atomic force microscope
#123Method and apparatus of operating a scanning probe microscope
#124Scanning probe microscope
#125Debris removal from high aspect structures
#126Debris removal in high aspect structures
#127Method and apparatus of operating a scanning probe microscope
#128Multiple Integrated Tips Scanning Probe Microscope
#129Optical knife-edge detector with large dynamic range
#130Scanning probe microscope head design
#131Minute object characteristics measuring apparatus
#132Head limiting movement range of laser spot and atomic force microscope having the same
#133Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode
#134METHOD OF ANALYZING SURFACE OF SAMPLE USING SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE THEREFOR
#135Metrological scanning probe microscope
#136Force detection for microscopy based on direct tip trajectory observation
#137Evaluation system and a method for evaluating a substrate
#138Inspection method and its apparatus for thermal assist type magnetic head element
#139Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light Source
#140Scanning probe microscope head design
#141Chemical nano-identification of a sample using normalized near-field spectroscopy
#142Three-dimensional fine movement device
#143Scanning mechanism and scanning probe microscope
#144Probe calibration or measurement routine
#145Multiple probe actuation
#146Multiple probe detection and actuation
#147Multiple probe actuation
#148Photothermal actuation of a probe for scanning probe microscopy
#149Device and method for the interferometric measuring of an object
#150Method and system for characterization of nano- and micromechanical structures
#151Nanoindenter multimodal microscope objective for mechanobiology
#152Scanning mechanism and scanning probe microscope
#153Scanning probe microscope
#154Device and method for measuring distribution of atomic resolution deformation
#155Measuring surface curvature
#156Beam scanning system
#157Scanning mechanism and scanning probe microscope
#158Probe actuation
#159Optical cantilever based analysis
#160Microscope probe and method for use of same
#161Optical beam positioning unit for atomic force microscope
#162Actuator position calculation device, actuator position calculation method, and actuator position calculation program
#163Sealed AFM cell
#164Method and apparatus of operating a scanning probe microscope
#165Sensor for low force-noise detection in liquids
#166Atomic force microscope system using selective active damping
#167Interferometric atomic-force microscopy device and method
#168Modular UHV Compatible Angle Physical Contact Fiber Connection for Transferable Fiber Interferometer Type Dynamic Force Microscope Head
#169Scanning probe microscopy cantilever comprising an electromagnetic sensor
#170System and method for high-speed atomic force microscopy with switching between two feedback loops
#171Feedback controller in probe microscope utilizing a switch and a inverter
#172Integrated Displacement Sensors for Probe Microscopy and Force Spectroscopy
#173Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode
#174Probe head scanning probe microscope including the same
#175Automatic tuning of atomic force microscope
#176Methods of manufacturing diamond capsules
#177Displacement measurement method and apparatus thereof, stage apparatus, and probe microscope
#178Method of measuring vibration characteristics of cantilever
#179Fast-scanning SPM scanner and method of operating same
#180High frequency deflection measurement of IR absorption
#181Apparatus and Method for Isolating and Measuring Movement in Metrology Apparatus
#182CANTILEVER-BASED OPTICAL INTERFACE FORCE MICROSCOPE
#183Load measuring apparatus
#184Method and apparatus for measuring cantilever deflection in constrained spaces
#185Method for processing output of scanning type probe microscope, and scanning type probe microscope
#186Dynamic probe detection system
#187Heterodyne detection device for imaging an object by re-injection
#188Probe detection system
#189Device for scanning a sample surface covered with a liquid
#190METHOD OF PROBE ALIGNMENT
#191Scanning probe microscope
#192Athermal atomic force microscope probes
#193Laser guided tip approach with 3D registration to a surface
#194Probe microscope
#195Scanning probe microscope having improved optical access
#196Modular atomic force microscope
#197ULTRASOFT ATOMIC FORCE MICROSCOPY DEVICE AND METHOD
#198Vibration compensation in probe microscopy
#199Atomic force microscopy devices, arrangements and systems
#200Probe microscopy and probe position monitoring apparatus
#201Probe microscope
#202Scanning probe microscope with independent force control and displacement measurements
#203Probe sensor with multi-dimensional optical grating
#204Three-dimensional nanoscale metrology using FIRAT probe
#205Method and apparatus of operating a scanning probe microscope
#206FEEDBACK- ENHANCED THERMO-ELECTRIC TOPOGRAPHY SENSING
#207Method of detecting a movement of a measuring probe and measuring instrument
#208Tool tips with scanning probe microscopy and/or atomic force microscopy applications
#209Atomic force microscope
#210Automatic landing method and apparatus for scanning probe microscope using the same
#211Heterodyne laser doppler probe and measurement system using the same
#212Displacement measurement method and apparatus thereof, stage apparatus, and probe microscope
#213System and method for the inspection of micro and nanomechanical structures
#214Raster scanning microscope having transparent optical element with inner curved surface
#215CANTILEVER SENSOR SYSTEM AND PROFILERS AND BIOSENSORS USING THE SAME
#216Probe apparatus for measuring an electron state on a sample surface
#217Measuring device with daisy type cantilever wheel
#218Apparatus and method for dynamic cellular probing and diagnostics using holographic optical forcing array
#219Homodyne laser interferometer probe and displacement measurement system using the same
#220Fast-scanning SPM and method of operating same
#221Measuring probe, sample surface measuring apparatus and sample surface measuring method
#222Shape measuring apparatus
#223Optical device comprising a cantilever and method of fabrication and use thereof
#224Three-dimensional nanoscale metrology using FIRAT probe
#225Hybrid contact mode scanning cantilever system
#226System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers
#227Factory-alignable compact cantilever probe
#228Diamond structures as fuel capsules for nuclear fusion
#229Fast-scanning SPM scanner and method of operating same
#230Scanning probe microscopy inspection and modification system
#231Tip structure for scanning devices, method of its preparation and devices thereon
#232Device and method for scanning probe microscopy
#233Probe sensor with multi-dimensional optical grating
#234Optical displacement detection mechanism and surface information measurement device using the same
#235Optical displacement-detecting mechanism and probe microscope using the same
#236Measuring apparatus
#237Scanning Microscope With Shape Correction Means
#238Microscope and interferometer thereof
#239System for nano position sensing in scanning probe microscopes using an estimator
#240Method and apparatus for monitoring of a SPM actuator
#241Cantilever assembly
#242Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography
#243Optical detection alignment/tracking method and apparatus
#244Atomic force microscope
#245Probe for probe microscope using transparent substrate, method of producing the same, and probe microscope device
#246Probe module with integrated actuator for a probe microscope
#247Nanogap series substance capturing, detecting and identifying method and device
#248Object inspection and/or modification system and method
#249Probe apparatus for measuring an electron state on a sample surface
#250Integrated displacement sensors for probe microscopy and force spectroscopy
#251Three-dimensional nanoscale metrology using FIRAT probe
#252Apparatus and method for detecting deformability of cells using spatially modulated optical force microscopy
#253Scanning probe microscopy inspection and modification system
#254Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
#255Scanning-type probe microscope
#256Integrated displacement sensors for probe microscopy and force spectroscopy
#257Force sensing integrated readout and active tip based probe microscope systems
#258Beam tracking system for scanning-probe type atomic force microscope
#259Multiple local probe measuring device and method
#260Method to transiently detect sample features using cantilevers
#261Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
#262Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
#263Interferometric apparatus utilizing a cantilever array to measure a surface
#264Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope
#265Scanning probe microscope
#266Real time detection of loss of cantilever sensing loss
#267Apparatus and method for a scanning probe microscope
#268Method and device for measuring vibration frequency of multi-cantilever
#269Scanning probe microscope and sample observing method using this and semiconductor device production method
#270Surface shape measuring apparatus, surface measuring method, and exposure apparatus
#271Diffractive optical position detector in an atomic force microscope having a moveable cantilever
#272Atomic force microscope
#273Method and apparatus for evanescent filed measuring of particle-solid separation
#274Atomic force microscope and corrector thereof and measuring method
#275Electrical scanning probe microscope apparatus
#276Sensor with cantilever and optical resonator
#277Scanning probe microscope and molecular structure change observation method
#278Methods and devices for determining a cell characteristic, and applications employing the same
#279Microscope using quantum-mechanically entangled photons
#280Scanning probe microscope and measuring method by means of the same
#281Multiple local probe measuring device and method
#282Scanning probe microscopy inspection and modification system
#283Scanning probe microscope and specimen observation method
#284High sensitivity scanning probe system
#285Measurement device for electron microscope
#286Method to transiently detect samples in atomic force microscopes
#287Apparatus and method for a scanning probe microscope
#288Object inspection and/or modification system and method
#289Multiple local probe measuring device and method
#290Electrical scanning probe microscope apparatus
#291Method of and an apparatus for measuring a specimen by means of a scanning probe microscope
#292Scanning probe microscope and measurement method using the same
#293Method for adjusting laser path of terahertz near-field system
#294Metal coated spike array
#295Scanning probe microscope
#296Atomic-force microscope system with integrated fabry-perot resonator