171145 ⎘
Monitoring the movement or position of the probe
Sub-classes:METHOD OF AND SCANNING PROBE MICROSCOPY SYSTEM FOR MEASURING A TOPOGRAPHY OF A SIDE WALL OF A STRUCTURE ON A SURFACE OF A SUBSTRATE
#2PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM
#3METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE
#4MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD
#5DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
#6Probe tip X-Y location identification using a charged particle beam
#7Method and device for measuring dimension of semiconductor structure
#8Active noise isolation for tunneling applications (ANITA)
#9Method and apparatus of operating a scanning probe microscope
#10Real-time direct measurement of mechanical properties in-situ of scanning beam microscope
#11METHOD OF MODIFYING A SURFACE OF A SAMPLE, AND A SCANNING PROBE MICROSCOPY SYSTEM
#12Method of and system for performing defect detection on or characterization of a layer of a semiconductor element or semi-manufactured semiconductor element
#13Material Property Measurements Using Multiple Frequency Atomic Force Microscopy
#14Systems and methods for detection of blank fields in digital microscopes
#15Method and apparatus of using peak force tapping mode to measure physical properties of a sample
#16MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND APPLICATIONS
#17A METHOD TO MEASURE NANOSCALE MECHANICAL PROPERTIES USING ATOMIC FORCE MICROSCOPY WITHOUT INITIALLY CHARACTERIZING CANTILEVER TIP GEOMETRY
#18Method of performing surface measurements on a surface of a sample, and scanning probe microscopy system therefore
#19AM/FM measurements using multiple frequency atomic force microscopy
#20Scanning probe microscopy system for mapping high aspect ratio nanostructures on a surface of a sample
#21Method and apparatus of operating a scanning probe microscope
#22Detection device having attached probe
#23Scanning probe system with multiple probes
#24Electron vibrometer and determining displacement of a cantilever
#25Method and apparatus of operating a scanning probe microscope
#26Systems and devices for non-destructive surface chemical analysis of samples
#27Method of measuring a topographic profile and/or a topographic image
#28Measuring method for atomic force microscope
#29Method and apparatus of operating a scanning probe microscope
#30Method and apparatus of using peak force tapping mode to measure physical properties of a sample
#31Material property measurements using multiple frequency atomic force microscopy
#32Method and apparatus of operating a scanning probe microscope
#33Minute object characteristics measuring apparatus
#34Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode
#35Probe microscope with probe movement from heating
#36Force detection for microscopy based on direct tip trajectory observation
#37Signal detection circuit and scanning probe microscope
#38Scanning probe microscope and scanning probe microscopy
#39Three-dimensional fine movement device
#40Interface of a microfabricated scanning force sensor for combined force and position sensing
#41Method and device for controlling a scanning probe microscope
#42Methods, devices, and systems for forming atomically precise structures
#43High throughput microscopy device
#44Band excitation method applicable to scanning probe microscopy
#45MICROELECTROMECHANICAL SYSTEM AND METHODS OF USE
#46Motion sensor integrated nano-probe N/MEMS apparatus, method, and applications
#47Actuator position calculation device, actuator position calculation method, and actuator position calculation program
#48Method of investigating a sample surface
#49Method and apparatus of operating a scanning probe microscope
#50Method and apparatus of using peak force tapping mode to measure physical properties of a sample
#51Method and apparatus of operating a scanning probe microscope
#52Method of controlling frequency modulated-atomic force microscope
#53Atomic force microscope system using selective active damping
#54Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoring
#55Scanning probe microscopy cantilever comprising an electromagnetic sensor
#56Band excitation method applicable to scanning probe microscopy
#57Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode
#58Electrical-mechanical complex sensor for nanomaterials
#59Displacement detection mechanism and scanning probe microscope using the same
#60Method and apparatus of using peak force tapping mode to measure physical properties of a sample
#61Material property measurements using multiple frequency atomic fore microscopy
#62Method and apparatus for measuring cantilever deflection in constrained spaces
#63Method of aligning a first article relative to a second article
#64Method and apparatus of operating a scanning probe microscope
#65Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoring
#66Band excitation method applicable to scanning probe microscopy
#67Method and apparatus of operating a scanning probe microscope
#68Method and apparatus for determining the cell activation of a target cell by an activator
#69Band excitation method applicable to scanning probe microscopy
#70Material property measurements using multiple frequency atomic force microscopy
#71Scanning probe microscopy inspection and modification system
#72Analog High Sensitivity Continuous Phase and Amplitude Detection Device for a Harmonic Microcantilever Sensor
#73Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same
#74Apparatus for aligning a first article relative to a second article
#75Object inspection and/or modification system and method
#76Scanning probe microscopy inspection and modification system
#77Scanning probe microscopy inspection and modification system
#78Object inspection and/or modification system and method
#79Scanning probe microscope