171147 ⎘
Monitoring the movement or position of the probe Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)
#2Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes
#3FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY DEVICE AND METHOD OF CALIBRATING A POSITION OF A PROBE TIP
#4Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#5Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IR
#6AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME
#7Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#8AFM imaging with creep correction
#9Cantilever, scanning probe microscope, and measurement method using scanning probe microscope
#10Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#11Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imaging
#12Method and control unit for demodulation
#13Scanning probe microscope, scan head and method
#14Atomic force microscopy cantilever, system and method
#15Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#16Scanning sensor having a spin defect
#17Cantilever with a collocated piezoelectric actuator-sensor pair
#18Scanning probe microscope with case and elastic body
#19ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD
#20Multiple integrated tips scanning probe microscope
#21Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
#22Scanning probe microscope and cantilever moving method
#23Multiple integrated tips scanning probe microscope
#24Method of controlling a probe using constant command signals
#25SCANNING PROBE MICROSCOPE
#26Method and apparatus of using peak force tapping mode to measure physical properties of a sample
#27Compact probe for atomic-force microscopy and atomic-force microscope including such a probe
#28Photonic probe for atomic force microscopy
#29Multilayer MEMS cantilevers
#30Miniaturized and compact probe for atomic force microscopy
#31Microwave impedance microscopy using a tuning fork
#32Method and apparatus of using peak force tapping mode to measure physical properties of a sample
#33Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample
#34Interface of a microfabricated scanning force sensor for combined force and position sensing
#35Surface force measuring method and surface force measuring apparatus
#36Piezoelectric actuator and method of measuring motion by using the same
#37Scanning probe microscope comprising an isothermal actuator
#38Sensor for low force-noise detection in liquids
#39Scanning probe microscopy cantilever comprising an electromagnetic sensor
#40Atomic force microscope probe, method for preparing same, and uses thereof
#41Detecting responses of micro-electromechanical system (MEMS) resonator device
#42Micro-mechanical component with cantilever integrated electrical functional element
#43SCANNED PROBE MICROSCOPE WITHOUT INTERFERENCE OR GEOMETRIC CONSTRAINT FOR SINGLE OR MULTIPLE PROBE OPERATION IN AIR OR LIQUID
#44Method and apparatus of using peak force tapping mode to measure physical properties of a sample
#45Scanning probe microscope and method for detecting proximity of probes thereof
#46Lab-on-a-pipette
#47Piezoelectric microcantilevers and uses in atomic force microscopy
#48Method of aligning a first article relative to a second article
#49Device and method for an atomic force microscope for the study and modification of surface properties
#50Apparatus and method for investigating surface properties of different materials
#51Microprobe, measurement system and method
#52Quantum tunnelling sensor device and method
#53Cantilevers with integrated piezoelectric actuators for probe microscopy
#54Coupled mass-spring systems and imaging methods for scanning probe microscopy
#55DUAL-TIP CANTILEVER
#56Atomic force microscopy probe
#57Probe sensor with multi-dimensional optical grating
#58Three-dimensional nanoscale metrology using FIRAT probe
#59Three-dimensional imaging and manipulation
#60HEATED CANTILEVER
#61Self displacement sensing cantilever and scanning probe microscope
#62FEEDBACK- ENHANCED THERMO-ELECTRIC TOPOGRAPHY SENSING
#63SCANNING PROBE EPITAXY
#64Piezoresistor height sensing cantilever
#65Nanomanufacturing devices and methods
#66SCANNING PROBE EPITAXY
#67METHOD OF NANOSCALE PATTERNING USING BLOCK COPOLYMER PHASE SEPARATED NANOSTRUCTURE TEMPLATES
#68Cantilever, cantilever system, and probe microscope and adsorption mass sensor including the cantilever system
#69Microelectromechanical System Comprising a Deformable Portion and a Stress Sensor
#70Sensor for observations in liquid environments and observation apparatus for use in liquid environments
#71Resonant MEMS device that detects photons, particles and small forces
#72Probe apparatus for measuring an electron state on a sample surface
#73Metallic thin film piezoresistive transduction in micromechanical and nanomechanical devices and its application in self-sensing SPM probes
#74Miniaturized spring element and method for producing the spring element
#75Piezoelectric microcantilevers and uses in atomic force microscopy
#76Three-dimensional nanoscale metrology using FIRAT probe
#77Sample analysis using cantilever probe
#78Detection of resonator motion using piezoresistive signal downmixing
#79Cantilevers with integrated actuators for probe microscopy
#80Devices for probe microscopy
#81Probe sensor with multi-dimensional optical grating
#82Scanning Microscope With Shape Correction Means
#83PIEZORESISTIVE CANTILEVER BASED NANOFLOW AND VISCOSITY SENSOR FOR MICROCHANNELS
#84Methods of imaging in probe microscopy
#85Apparatus for aligning a first article relative to a second article
#86Method and apparatus for measuring electrical properties in torsional resonance mode
#87Method for analysis through layer-by-layer sample removal using a cantilever probe
#88Probe apparatus for measuring an electron state on a sample surface
#89Overlay measurement methods with firat based probe microscope
#90Nanoscale displacement detector
#91Three-dimensional nanoscale metrology using FIRAT probe
#92Ultrasonically coupled scanning probe microscope
#93Force sensing integrated readout and active tip based probe microscope systems
#94Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure
#95Measuring system for the combined scanning and analysis of microtechnical components comprising electrical contacts
#96Scanning probe microscope
#97Method and device for measuring vibration frequency of multi-cantilever
#98Scanning probe microscope and sample observing method using this and semiconductor device production method
#99Method and apparatus for measuring electrical properties in torsional resonance mode
#100Metallic thin film piezoresistive transduction in micromechanical and nanomechanical devices and its application in self-sensing SPM probes
#101Method for manufacturing a split probe
#102Measurement device for electron microscope
#103Micro-force sensing system