171158 ⎘
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields
DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD
#2Systems, method and computer-accessible medium for providing balanced asymmetric interferometry for vibrationally isolated optical scanning probe(s)
#3System and method for preparing cryo-em grids
#4Frequency modulation detection for photo induced force microscopy
#5Sample container mounting member and sample container sealing method
#6Scanning probe microscope and light intensity adjusting method
#7Scanning probe microscope
#8SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
#9High magnetic field scanning probe microscope employing liquid helium-free room-temperature bore superconducting magnet
#10Sample vessel retention structure for scanning probe microscope
#11Scanning probe microscope with a reduced Q-factor
#12Modular Atomic Force Microscope
#13Modular atomic force microscope with environmental controls
#14Modular atomic force microscope with environmental controls
#15Leveling apparatus and atomic force microscope including the same
#16Sealed AFM cell
#17Scanning probe microscope
#18Modular atomic force microscope
#19Reducing Noise In Atomic Force Microscopy Measurements
#20Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same
#21Method and apparatus for measuring electrical properties in torsional resonance mode
#22Method and apparatus for measuring electrical properties in torsional resonance mode
#23Scanning probe microscopy system and method of measurement by the same