171148 ⎘
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
Sub-classes:Atomic force microscopy apparatus, methods, and applications
#2Atomic force microscopy apparatus, methods, and applications
#3Metrology devices for rapid specimen setup
#4Microscopic image recognition system and method for detecting protein-based molecule
#5Scanning probe system with multiple probes
#6FREQUENCY MEASURING AND CONTROL APPARATUS WITH INTEGRATED PARALLEL SYNCHRONIZED OSCILLATORS
#7Compensation for canonical second order systems for eliminating peaking at the natural frequency and increasing bandwidth
#8High-scan rate positioner for scanned probe microscopy
#9Method and apparatus of tuning a scanning probe microscope
#10Frequency measuring and control apparatus with integrated parallel synchronized oscillators
#11High-scan rate positioner for scanned probe microscopy