171163 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; Multiple-type SPM, i.e. involving more than one SPM techniques STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
Method of examining a sample in a scanning tunneling microscope using tip-to-sample distance variations
#2DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
#3Multiple integrated tips scanning probe microscope
#4Multiple integrated tips scanning probe microscope
#5Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample
#6Sensor for noncontact profiling of a surface
#7Probe microscope and measurement method using the same
#8Scanning probe microscopy inspection and modification system
#9Local injector of spin-polarized electrons with semiconductor tip under light excitation
#10Scanning probe microscopy inspection and modification system
#11Tip structure for scanning devices, method of its preparation and devices thereon
#12Microcoaxial probes made from strained semiconductor bilayers
#13Object inspection and/or modification system and method
#14Scanning probe microscopy inspection and modification system
#15Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
#16Scanning probe characterization of surfaces
#17Probe for a scanning microscope
#18Scanning probe microscopy inspection and modification system
#19Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes
#20Object inspection and/or modification system and method