171162 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof Multiple-type SPM, i.e. involving more than one SPM techniques
Sub-classes:Scanning probe microscope with case and elastic body
#2Method for producing a probe suitable for scanning probe microscopy
#3Numerically controlled rotary probe switching device based on environment-controllable atomic force microscope
#4SCANNING ION CONDUCTANCE MICROSCOPY
#5Methods, systems, and computer readable media for dual resonance frequency enhanced electrostatic force microscopy
#6System and method for providing electromagnetic imaging through electroquasistatic sensing
#7Apparatus and a method for investigating a sample by means of several investigation methods
#8Measurement of the surface potential of a material
#9Real space mapping of ionic diffusion and electrochemical activity in energy storage and conversion materials
#10DETECTION AND CHARACTERIZATION OF LASER-INDUCED HEAT AFFECTED ZONES ON POLYMER BASED DEVICES
#11Lab-on-a-pipette
#12Probe Microscope
#13Multifunctional micropipette biological sensor
#14System and method for providing electromagnetic imaging through magnetoquasistatic sensing
#15System and method for providing electromagnetic imaging through electroquasistatic sensing
#16NEAR FIELD SCANNING MEASUREMENT-ALTERNATING CURRENT-SCANNING ELECTROCHEMICAL MICROSCOPY DEVICES AND MEHTODS OF USE THEREOF
#17Probe arrangement
#18Spin microscope based on optically detected magnetic resonance
#19Apparatus for detecting magnetic signals and signals of electric tunneling
#20Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
#21Sensors for electrochemical, electrical or topographical analysis
#22Electrical scanning probe microscope apparatus