171164 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; Multiple-type SPM, i.e. involving more than one SPM techniques SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes
#2System and method for a non-tapping mode scattering-type scanning near-field optical microscopy
#3SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OBTAINING SAID SYSTEM
#4Micro-optomechanical system and method for the production thereof
#5Methods and systems for scanning probe sample property measurement and imaging
#6System and method for a non-tapping mode scattering-type scanning near-field optical microscopy
#7Method and device for superimposing at least two images of a photolithographic mask
#8Compact probe for atomic-force microscopy and atomic-force microscope including such a probe
#9Scanning resonator microscopy
#10Method and apparatus for chemical and optical imaging with a broadband source
#11Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression
#12SNOM SYSTEM WITH LASER-DRIVEN PLASMA SOURCE
#13Evaluation system and a method for evaluating a substrate
#14Near-field optical probe manufacturing using organo-mineral material and sol-gel process
#15Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus
#16Scanning probe microscope and method of observing sample using the same
#17Device and method for an atomic force microscope for the study and modification of surface properties
#18Scanning probe microscope and method of observing sample using the same
#19Cantilever for scanning probe microscope and scanning probe microscope equipped with it
#20Method and system for near-field spectroscopy using targeted deposition of nanoparticles
#21Scanning device with a probe having an organic material
#22Microscope probe having an ultra-tall tip
#23Optical microcantilever
#24Object inspection and/or modification system and method
#25Optical microcantilever, manufacturing method thereof, and optical microcantilever holder
#26High aspect ratio micromechanical probe tips and methods of fabrication
#27Method and apparatus for evanescent filed measuring of particle-solid separation
#28Object inspection and/or modification system and method
#29Optical microcantilever
#30Integrated III-V/silicon atomic force microscopy active optical probe
#31VCSEL-based resonant-cavity-enhanced atomic force microscopy active optical probe