G01Q60/08 - CPC Classification Index

ClassID:

171165 ⎘

G01Q60/08 - CPC Classification

Classification description:

Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; Multiple-type SPM, i.e. involving more than one SPM techniques MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy

Recent Application in this class:

20240044938

2024-02-08

Nanoscale scanning sensors

20230358829

2023-11-09

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

20230078584

2023-03-16

Magnetic distribution detection method

20220413007

2022-12-29

Nanoscale scanning sensors

20210318352

2021-10-14

SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OBTAINING SAID SYSTEM

20200386832

2020-12-10

Method and apparatus for measuring magnetic field strength

20190146045

2019-05-16

Method and apparatus for measuring magnetic field strength

20150253355

2015-09-10

Nanoscale scanning sensors

20140317789

2014-10-23

Method for controlling a scanning microscope

#10

20120030846

2012-02-02

Atomic force microscopy system and method for nanoscale measurement

#11

20080210864

2008-09-04

Local injector of spin-polarized electrons with semiconductor tip under light excitation

#12

20070235340

2007-10-11

Cantilever probes for nanoscale magnetic and atomic force microscopy

#13

20070216412

2007-09-20

Magnetic resonance force microscope

#14

20060150720

2006-07-13

Probe for a scanning microscope

#15

20050241375

2005-11-03

Cantilever probes for nanoscale magnetic and atomic force microscopy