METHOD FOR DETECTING SEMICONDUCTOR CARRIERS USING A NANOMETER-SCALE MICROWAVE PROBE INTEGRATED WITH AN ATOMIC FORCE MICROSCOPE

Atomic-force Microscopy for Identification of Surfaces

Atomic Force Microscope Based Infrared Spectroscopy With Multiple Laser Pulse Repetition Rate Excitation And Optional Force Volume Operation

PHOTOTHERMAL IMAGING DEVICE AND SYSTEM

TECHNOLOGIES FOR PHOTOTHERMAL ACTION-BASED TWO-DIMENSIONAL INFRARED SPECTROSCOPY WITH HIGH SPATIAL RESOLUTION

SCANNING METHOD AND DEVICE FOR SCANNING PROBE MICROSCOPE BASED ON HIGH-SPEED INSTANTANEOUS FORCE CONTROL

Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IR

TRANSITIONAL TAPPING ATOMIC FORCE MICROSCOPY FOR HIGH-RESOLUTION IMAGING

Atomic-force microscopy for identification of surfaces

Photothermal imaging device and system

Atomic-force microscopy for identification of surfaces

Scanning probe microscope and method for resonance-enhanced detection using a range of modulation frequencies

AFM imaging with creep correction

Phase-shift-based amplitude detector for a high-speed atomic force microscope

Active bimodal AFM operation for measurements of optical interaction

Atomic-force microscopy for identification of surfaces

System for measuring the absorption of a laser emission by a sample

Scanning probe microscope and a method for operating thereof

Phase-shift-based amplitude detector for a high-speed atomic force microscope

Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy

Sharpening method for probe tip of atomic force microscope (AFM)

Method and apparatus of atomic force microscope based infrared spectroscopy with controlled probing depth

Photothermal imaging device and system

Method for detecting cell surface holes using atomic force microscope

Surface sensitive atomic force microscope based infrared spectroscopy

Method and apparatus of operating a scanning probe microscope

Frequency modulation detection for photo induced force microscopy

Feedback correction in sub-resonant tapping mode of an atomic force microscope

Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy

METHOD OF MODIFYING A SURFACE OF A SAMPLE, AND A SCANNING PROBE MICROSCOPY SYSTEM

Heterodyne scanning probe microscopy method and system

Method of operating an AFM

Determining interaction forces in a dynamic mode AFM during imaging

Coupled multiscale positioning of arrays of parallel, independently actuated and simultaneously driven modular scanning probe microscopes for high-throughput, in-line, nanoscale measurement of flexible, large area, and roll-to-roll processes

Method of performing surface measurements on a surface of a sample, and scanning probe microscopy system therefore

Scanning probe microscope and scanning method thereof

Photothermal imaging device and system

Method for in-line measurement of quality of microarray

Method and apparatus of operating a scanning probe microscope

Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy

Infrared characterization of a sample using oscillating mode

Method and apparatus of operating a scanning probe microscope

High speed adaptive-multi-loop mode imaging atomic force microscopy

Method and apparatus of operating a scanning probe microscope

Non-destructive, wafer scale method to evaluate defect density in heterogeneous epitaxial layers

Method and apparatus of operating a scanning probe microscope

Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode

Force detection for microscopy based on direct tip trajectory observation

Systems and methods for non-destructive surface chemical analysis of samples

Intermittent contact resonance atomic force microscope and process for intermittent contact resonance atomic force microscopy

Method and apparatus to compensate for deflection artifacts in an atomic force microscope

Method and apparatus of tuning a scanning probe microscope

Methods and systems for optimizing frequency modulation atomic force microscopy

Method for controlling a scanning microscope

Method and apparatus of operating a scanning probe microscope

Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode

Scanning probe microscope

Method and apparatus of tuning a scanning probe microscope

Measurement of the surface potential of a material

Ultra-low damping imaging mode related to scanning probe microscopy in liquid

Digital Q control for enhanced measurement capability in cantilever-based instruments

Multiple modulation heterodyne infrared spectroscopy

Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantilevers

METHOD FOR DETECTING BIOLOGICAL MARKERS BY AN ATOMIC FORCE MICROSCOPE

Dynamic probe detection system

Method of aligning a first article relative to a second article

Dynamic mode AFM apparatus

ATOMIC FORCE MICROSCOPE INCLUDING ACCELEROMETER

Scanning probe microscope

Scanning probe in pulsed-force mode, digital and in real time

Intermodulation scanning force spectroscopy

Coupled mass-spring systems and imaging methods for scanning probe microscopy

Measurement and Mapping of Molecular Stretching and Rupture Forces

Method and apparatus of operating a scanning probe microscope

Detection of macromolecular complexes with harmonic cantilevers

Method for using an atomic force microscope

Chemical sensor with oscillating cantilevered probe

Method of using an atomic force microscope and microscope

Detection of macromolecular complexes on ultraflat surfaces with harmonic cantilevers

Scanning probe microscope

Method of operating an atomic force microscope in tapping mode with a reduced impact force

Surface scanning method

Digital Q control for enhanced measurement capability in cantilever-based instruments

Higher harmonics atomic force microscope

Scanning probe microscope and sample observation method using the same

Atomic force microscope using a torsional harmonic cantilever

Apparatus for aligning a first article relative to a second article

Digital Q control for enhanced measurement capability in cantilever-based instruments

Method and apparatus of driving torsional resonance mode of a probe-based instrument

Scanning probe microscopy method and apparatus utilizing sample pitch

Scanning probe microscope

Feedback influenced increased-quality-factor scanning probe microscope

PROBE AND METHOD FOR A SCANNING PROBE MICROSCOPE

Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy

System for sensing a sample

Working method using scanning probe

System for Sensing a Sample

Dynamic activation for an atomic force microscope and method of use thereof

Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder

Scanning probe microscope and method

Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy

System for sensing a sample

Scanning probe microscope and specimen surface structure measuring method

Atomic force microscope tip holder for imaging in liquid

Digital control of quality factor in resonant systems including cantilever based instruments

Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure

Probe device

Active probe for an atomic force microscope and method for use thereof

Method and apparatus of driving torsional resonance mode of a probe-based instrument

Chemical sensor with oscillating cantilevered probe and mechanical stop

Measurement system with detection mechanism and method of operation thereof

Non-destructive, wafer scale method to evaluate defect density in heterogeneous epitaxial layers