171180 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes; DC mode Contact-mode AFM
Active bimodal AFM operation for measurements of optical interaction
#2System for measuring the absorption of a laser emission by a sample
#3Scanning probe microscope and a method for operating thereof
#4Atomic force microscopy tips for interconnection
#5Scanning probe microscope
#6Device for the volumetric analysis of an organic or inorganic sample
#7Method for in-line measurement of quality of microarray
#8Atomic force microscopy controller and method
#9Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
#10Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
#11Automatic gain tuning in atomic force microscopy
#12METHOD FOR AUTOMATIC ADJUSTMENT OF THE APPLIED FORCE AND CONTROL OF THE FORCE DRIFT IN AN ATOMIC FORCE MICROSCOPE DURING CONTACT MODE IMAGING
#13Mode synthesizing atomic force microscopy and mode-synthesizing sensing
#14Wear-less operation of a material surface with a scanning probe microscope
#15Atomic force microscope apparatus
#16Method for evaluating semiconductor wafer, apparatus for evaluating semiconductor wafer, and method for manufacturing semiconductor wafer
#17Scanning probe microscopy apparatus and techniques