G01Q60/36 - CPC Classification Index

ClassID:

171179 ⎘

G01Q60/36 - CPC Classification

Classification description:

Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes DC mode

Sub-classes:

G01Q60/363 » {Contact-mode AFM} 17
G01Q60/366 » {Nanoindenters, i.e. wherein the indenting force is measured} 56

Recent Application in this class:

20210190819

2021-06-24

Truncated nonlinear interferometer-based atomic force microscopes

20160274143

2016-09-22

Dual-probe scanning probe microscope

20150241470

2015-08-27

Methods, systems, and computer readable media for dual resonance frequency enhanced electrostatic force microscopy

20150121576

2015-04-30

Determination of local contact potential difference by noncontact atomic force microscopy

20140020141

2014-01-16

Mode-synthesizing atomic force microscopy and mode-synthesizing sensing

20130298294

2013-11-07

Feedback controller in probe microscope utilizing a switch and a inverter

20120291161

2012-11-15

Cantilever for magnetic force microscope and method of manufacturing the same

20120047610

2012-02-23

CANTILEVER-BASED OPTICAL INTERFACE FORCE MICROSCOPE

20110231965

2011-09-22

Mode synthesizing atomic force microscopy and mode-synthesizing sensing