171181 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes; DC mode Nanoindenters, i.e. wherein the indenting force is measured
METHODS OF PRODUCING SINGLE PHOTON EMITTERS ON SUBSTRATES, AND DEVICES, AND CHIPS
#2Controlled Indentation Instrumentation Working in Dynamical Mechanical Analysis Mode
#3Nanomechanical profiling of breast cancer molecular subtypes
#4Large radius probe
#5METHODS OF PRODUCING SINGLE PHOTON EMITTERS ON SUBSTRATES, AND DEVICES, AND CHIPS
#6Heterodyne scanning probe microscopy method and scanning probe microscopy system
#7Thin free-standing oxide membranes
#8Modified method to fit cell elastic modulus based on Sneddon model
#9Large radius probe
#10MEMS-based nanoindentation force sensor with electro-thermal tip heating
#11Large radius probe
#12Apparatus and method for two dimensional nanoindentation
#13MEMS nanoindenter chip with indenter probe and reference probe
#14Nanomechanical profiling of breast cancer molecular subtypes
#15Surface measurement probe
#16METHOD FOR PREDICTING CANCER PROGRESSION BY NANOMECHANICAL PROFILING
#17Instrument changing assembly and methods
#18Measuring head for nanoindentation instrument and measuring method
#19Interface of a microfabricated scanning force sensor for combined force and position sensing
#20Nanoindenter multimodal microscope objective for mechanobiology
#21Arrangement and method for the synchronous determination of the shear modulus and of the Poisson's number on samples of elastically isotropic and anisotropic materials
#22SAMPLE FIXING MEMBER FOR NANO INDENTER
#23Probe tip heating assembly
#24Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoring
#25Method for eliminating horizontal offset of traction testing device and traction testing device thereof
#26Method and apparatus for nanomechanical measurement using an atomic force microscope
#27Mechanical testing instruments including onboard data
#28Nanomechanical testing system
#29Method of measuring an interaction force
#30Microelectromechanical transducer and test system
#31High resolution, high speed multi-frequency dynamic study of visco-elastic properites
#32Nanoindenter
#33Micromachined comb drive for quantitative nanoindentation
#342-D MEMS tribometer with comb drives
#35Indenter assembly
#36Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoring
#37Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopy
#38Nanoindenter tip for uniaxial tension and compression testing
#39Coupled mass-spring systems and imaging methods for scanning probe microscopy
#40Scanning probe microscope with independent force control and displacement measurements
#41Nanoindenter
#42Micromachined comb drive for quantitative nanoindentation
#43Digital damping control of nanomechanical test instruments
#44Measuring head for nanoindentation instrument and measuring method using same
#45Method and apparatus for obtaining quantitative measurements using a probe based instrument
#46Method, Apparatus, and Nanoindenter for Determining an Elastic Ratio of Indentation Work
#47Device and method for optical nanoindentation measurement
#48Nanoindentation surface analysis method
#49MEMS nanoindenter
#50AFM probe with variable stiffness
#51Nanoindenter
#52Nanoindentation surface analysis tool and method
#53Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopy
#54Atomic force microscope with probe with improved tip movement
#55Method and apparatus for obtaining quantitative measurements using a probe based instrument
#56Method for observation of microstructural surface features in heterogeneous materials
#57Measurement device for electron microscope
#58System and method for the analysis of atomic force microscopy data
#59Systems and methods for testing mechanical properties of ultra-soft materials