Optical microcantilever, manufacturing method thereof, and optical microcantilever holder

Oscillator for atomic force microscope and other applications

Cantilever and inspecting apparatus

Semiconductor probe with high resolution resistive tip and method of fabricating the same

Oscillator and method of making for atomic force microscope and other applications

Probe for an atomic force microscope

Scanning probe microscopy inspection and modification system

Integrated displacement sensors for probe microscopy and force spectroscopy

Force sensing integrated readout and active tip based probe microscope systems

High aspect ratio micromechanical probe tips and methods of fabrication

Three-dimensional structure composed of silicon fine wires, method for producing the same, and device including the same

System for wide frequency dynamic nanomechanical analysis

Method for manufacturing a one-dimensional nano-structure-based device

Liquid-based gravity-driven etching-stop technique for controlling structure dimension

PROBE AND METHOD FOR A SCANNING PROBE MICROSCOPE

Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy

Adaptable end effector for atomic force microscopy based nano robotic manipulators

Probe for a scanning probe microscope and method of manufacture

Sensors for electrochemical, electrical or topographical analysis

Method and device for measuring vibration frequency of multi-cantilever

Carbon nanotube excitation system

Probe for a scanning microscope

Drive head and personal atomic force microscope having the same

Cantilever

Surface texture measuring probe and microscope utilizing the same

Probe for a scanning probe microscope and method for fabricating same

Caliper method, system, and apparatus

Electronic device containing a carbon nanotube

Protein structures and protein fibres

Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy

Probes for use in scanning probe microscopes and methods of fabricating such probes

Method for manufacturing single wall carbon nanotube tips

Three-dimensional structural body composed of silicon fine wire, its manufacturing method, and device using same

Atomic force microscope tip holder for imaging in liquid

Cantilever probes for nanoscale magnetic and atomic force microscopy

High aspect ratio tip atomic force microscopy cantilevers and method of manufacture

Scanning probe microscopy inspection and modification system

Method of forming atomic force microscope tips

SPM cantilever and fabricating method thereof

Metallic thin film piezoresistive transduction in micromechanical and nanomechanical devices and its application in self-sensing SPM probes

Method for making probes for atomic force microscopy

Oscillating scanning probe microscope

Cantilever microstructure and fabrication method thereof

Optical microcantilever

System for wide frequency dynamic nanomechanical analysis

Sensing mode atomic force microscope

Method and apparatus of driving torsional resonance mode of a probe-based instrument

AFM cantilevers and methods for making and using same

Measurement system with detection mechanism and method of operation thereof

Measurement system with detection mechanism and method of operation thereof

Optomechanical force sensors, cantilevers, and systems thereof

Ultra-sharp nanoprobes and methods

Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode

Method of making thin film probe tip for atomic force microscopy