METHOD OF CALIBRATING A PLURALITY OF METROLOGY DEVICES

APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORCE MICROSCOPE

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

High Frequency Passivated AFM Cantilever and Method of Fabrication

Heat Dissipating AFM Probe

Atomic Force Microscope Based Infrared Spectroscopy With Multiple Laser Pulse Repetition Rate Excitation And Optional Force Volume Operation

Probe-Based Instrument and Method Using Torsional Oscillation Sensing

SCANNING PROBE MICROSCOPE

Method and Apparatus of Magnetic Property Measurement Using an AFM Operating in a Force Mapping AFM Mode

PROBES, APPARATUSES AND METHODS FOR USE IN SCANNING PROBE MICROSCOPY

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)

Atomic Force Microscopy Probe with Tilted Tip and Method of Fabrication Thereof

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A MEASURING TIP OF A SCANNING PROBE MICROSCOPE

METHOD OF REMOVING DEFECT OF MASK

Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)

DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE

Defect detection using thermal laser stimulation and atomic force microscopy

Nanoscale scanning sensors

CASSETTE FOR HOLDING A PROBE

METHOD, SYSTEM, COMPUTING DEVICE AND STORAGE MEDIUM FOR OPTICAL MEASUREMENT

IN SITU MECHANICAL CHARACTERIZATION OF A SAMPLE STRAIN

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

Nano robotic system for high throughput single cell DNA sequencing

METHOD FOR MEASURING CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEASURED BY MEANS OF MEASURING APPARATUS USING VARIABLE SET POINT SETTING, ATOMIC MICROSCOPE FOR PERFORMING METHOD, AND COMPUTER PROGRAM STORED IN STORAGE MEDIUM FOR PERFORMING METHOD

METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEASURED, ATOMIC FORCE MICROSCOPE FOR PERFORMING SAME METHOD, AND COMPUTER PROGRAM STORED IN STORAGE MEDIUM TO PERFORM SAME METHOD

BLADE EDGE TIP MEASUREMENT

Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)

A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE PROBE DEVICES FOR A PROBE BASED SYSTEM

Method and system for quantifying degree of blending of virgin and aged asphalt in hot recycled asphalt mixtures (HRAM)

SCANNING PROBE MICROSCOPE (SPM) TIP

APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORCE MICROSCOPE

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

Method for detecting mechanical and magnetic features with nanoscale resolution

Truncated nonlinear interferometer-based sensor system

Large radius probe

Method and device for simultaneous independent motion measurement of multiple probes in atomic force microscope

Integrated dual-probe rapid in-situ switching measurement method and device of atomic force microscope

AFM Imaging with Real Time Drift Correction

Nanoscale scanning sensors

Metrology probe with built-in angle and method of fabrication thereof

AFM imaging with creep correction

SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE

Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope

Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)

Active bimodal AFM operation for measurements of optical interaction

3D multipurpose scanning microscopy probes

Method and control unit for demodulation

Torsion wing probe assembly

REMOTE-EXCITATION TIP-ENHANCED RAMAN SPECTROSCOPY (TERS) PROBE FOR NANOSCALE TERS IMAGING

Atomic force microscopy cantilever, system and method

Truncated non-linear interferometer-based sensor system

Method and apparatus for detecting ferroelectric signal

High speed atomic force profilometry of large areas

Energy beam input to atom probe specimens from multiple angles

Method for measuring damage of a substrate caused by an electron beam

SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING PHYSICAL QUANTITY USING SCANNING PROBE MICROSCOPE

Micromechanical sensor with optical transduction

Device and method for analyzing a defect of a photolithographic mask or of a wafer

Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)

Truncated nonlinear interferometer-based atomic force microscopes

Large radius probe

Cantilever-free scanning probe microscopy

Nano-indent process for creating single photon emitters in a two-dimensional materials platform

Sharpening method for probe tip of atomic force microscope (AFM)

Device for analyzing impact and puncture resistance

Pattern height information correction system and pattern height information correction method

High-sensitivity, low thermal deflection, stress-matched atomic force microscopy and scanning thermal microscopy probes

Atomic force microscopy tips for interconnection

Cantilever with a collocated piezoelectric actuator-sensor pair

Method and apparatus of atomic force microscope based infrared spectroscopy with controlled probing depth

METHOD AND SYSTEM FOR AT LEAST SUBSURFACE CHARACTERIZATION OF A SAMPLE

Method and apparatus for correcting responsivity variation in photothermal imaging

Method and apparatus for measuring magnetic field strength

Chip carrier exchanging device and atomic force microscopy apparatus having same

Atomic force microscope based instrumentation for probing nanoscale charge carrier dynamics with improved temporal and spatial resolution

AFM with suppressed parasitic signals

Scanned probe mounting design

Torsion wing probe assembly

Handling device for handling a measuring probe

Device integrated with scanning probe for optical nanofocusing and near-field optical imaging

ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD

Thermally stable, drift resistant probe for a scanning probe microscope and method of manufacture

Method, atomic force microscopy system and computer program product

Surface sensitive atomic force microscope based infrared spectroscopy

Atomic force microscopy based on nanowire tips for high aspect ratio nanoscale metrology/confocal microscopy

THE USE OF MECHANICAL (ACOUSTIC/SUBSONIC) VIBRATION FOR A NOVEL PARADIGM IN REGENERATIVE MEDICINE AND HUMAN WELL BEING

Testing device and method for measuring adhesion force between gas hydrate and mineral particles

Multi-axis positioning device

SUBSTRATE CLEANING METHOD, SUBSTRATE CLEANING APPARATUS, SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING SYSTEM, MACHINE LEARNING DEVICE, AND PREDICTION DEVICE

Diamond probe hosting an atomic sized defect

Frequency modulation detection for photo induced force microscopy

High speed atomic force profilometry of large areas

Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)

Passive semiconductor device assembly technology

Data processing device for scanning probe microscope

Method of and system for performing detection on or characterization of a sample

Method of and system for determining an overlay or alignment error between a first and a second device layer of a multilayer semiconductor device

Method of and system for detecting structures on or below the surface of a sample using a probe including a cantilever and a probe tip

Atomic force microscopy device, method and lithographic system

Method and apparatus for chemical mapping by selective dissolution

Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope

Large radius probe

Method and apparatus for atomic probe tomography

Multiple integrated tips scanning probe microscope with pre-alignment components

Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope

Method and apparatus for measuring magnetic field strength

Plasmonic ultrasensitive multiplex analysis platform for hyperspectral molecular sensing

Method of controlling a probe using constant command signals

AFM with suppressed parasitic signals

Microfluidic cell for atomic force microscopy

Characterizing a height profile of a sample by side view imaging

SNOM device using heterodyne detection

METHODS AND SYSTEMS FOR CHEMICALLY ENCODING HIGH-RESOLUTION SHAPES IN SILICON NANOWIRES

METROLOGY DEVICES AND METHODS FOR INDEPENDENTLY CONTROLLING A PLURALITY OF SENSING PROBES

Scanning probe microscopy utilizing separable components

Method for calibrating and imaging using multi-tip scanning probe microscope

NANOSCALE SCANNING SENSORS

Apparatus for measuring the roughness of a workpiece surface

Cantilever for atomic force microscopy

Top-cover for a controlled environmental system, top-cover-set and controlled environmental system compatible with probe based techniques and procedure to control the environment for a sample

Method of fabricating nano-scale structures on the edge and nano-scale structures fabricated on the edge using the method

Compact probe for atomic-force microscopy and atomic-force microscope including such a probe

Photonic probe for atomic force microscopy

Multilayer MEMS cantilevers

Miniaturized and compact probe for atomic force microscopy

Scanning resonator microscopy

Bio-microelectromechanical system transducer and associated methods

Joggle jointed detection apparatus

Detection device having attached probe

Device and method for analysing a defect of a photolithographic mask or of a wafer

Stimulating an optical sensor using optical radiation pressure

Method and apparatus for ultrasensitive quantification of microRNA using an atomic force microscope and a hybrid binding domain

Dynamic sweep-plow microcantilever device and methods of use

Method of measuring a topographic profile and/or a topographic image

Nanoantenna scanning probe tip, and fabrication methods

Three arm Y-shaped bisbiotin ligand

Harmonic feedback atomic force microscopy

Optical beam positioning unit for atomic force microscope

Reconstruction Of Scanning Probe Microscopy Cantilever Tip

Cantilever attachment fitting and scanning probe microscope provided therewith

SCANNING PROBE MICROSCOPE PROBER EMPLOYING SELF-SENSING CANTILEVER

Apparatus for scanning nano structure with plural AFM probes and method thereof

Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materials

Scanning probe microscope head design

METHODS AND SYSTEMS FOR CHEMICALLY ENCODING HIGH-RESOLUTION SHAPES IN SILICON NANOWIRES

Head limiting movement range of laser spot and atomic force microscope having the same

Metrological scanning probe microscope

Method and apparatus for inspecting process solution, and sample preparation apparatus in inspection

Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light Source

Scanning probe microscope head design

Surface force measuring method and surface force measuring apparatus

System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing

ATOMIC FORCE MICROSCOPY USING CORRELATED PROBE OSCILLATION AND PROBE-SAMPLE BIAS VOLTAGE

High heating rate thermal desorption for molecular surface sampling

Nanoscale scanning sensors

Measurement of surface energy components and wettability of reservoir rock utilizing atomic force microscopy

High throughput scanning probe microscopy device

Force measurement with real-time baseline determination

Scanning probe microscope with improved feature location capabilities

AFM-coupled microscale radiofrequency probe for magnetic resonance imaging and spectroscopy

Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof

Mechanical detection of Raman resonance

Electrochemically-grown nanowires and uses thereof

System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing

MONOLITHIC INTERFEROMETRIC ATOMIC FORCE MICROSCOPY DEVICE

Interferometric atomic-force microscopy device and method

Scanning probe microscopy cantilever comprising an electromagnetic sensor

MULTI-HEAD PROBE AND MANUFACTURING AND SCANNING METHODS THEREOF

Sample probes and methods for sampling intracellular material

Method for staging cancer progression by AFM

Method and apparatus for nanomechanical measurement using an atomic force microscope

System and method for high-speed atomic force microscopy with switching between two feedback loops

Near-field optical probe manufacturing using organo-mineral material and sol-gel process

Feedback controller in probe microscope utilizing a switch and a inverter

Image force microscopy of molecular resonance

Atomic force microscope probe, method for preparing same, and uses thereof

Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy

Magnetic field observation device and magnetic field observation method

Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source

Method for spatially manipulating a microscopic object and device for conducting said method

Method of determining a spring constant of a cantilever and scanning probe microscope using the method

Thermal probe

High resolution AFM tips containing an aluminum-doped semiconductor nanowire

Production scale fabrication method for high resolution AFM tips

Tip-mounted nanowire light source instrumentation

Apparatus and method for combined micro-scale and nano-scale C-V, Q-V, and I-V testing of semiconductor materials

Video rate-enabling probes for atomic force microscopy

Production scale fabrication method for high resolution AFM tips

Spatially resolved thermal desorption/ionization coupled with mass spectrometry

Scanning probe having integrated silicon tip with cantilever

CANTILEVER-BASED OPTICAL INTERFACE FORCE MICROSCOPE

Video rate-enabling probes for atomic force microscopy

Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantilevers

Flexibly displaceable coupling device for acoustically excited atomic force microscopy with acoustic excitation of the sample

High frequency deflection measurement of IR absorption

Piezoelectric microcantilevers and uses in atomic force microscopy

Cantilever-based optical fiber probe interfacial force microscope for partial immersion in liquid

Dynamic probe detection system

Atomic force microscopes and methods of measuring specimens using the same

Fast microscale actuators for probe microscopy

Cantilever with paddle for operation in dual-frequency mode

Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer

Apparatus and method for investigating surface properties of different materials

ATOMIC FORCE MICROSCOPE INCLUDING ACCELEROMETER

Scanning probe microscope

Device for oscillation excitation of an elastic bar fastened on one side in an atomic force microscope

Method and apparatus for characterizing a probe tip

Cantilevers with integrated piezoelectric actuators for probe microscopy

Probe and cantilever

Coupled mass-spring systems and imaging methods for scanning probe microscopy

ULTRASOFT ATOMIC FORCE MICROSCOPY DEVICE AND METHOD

PROBE SYSTEM COMPRISING AN ELECTRIC-FIELD-ALIGNED PROBE TIP AND METHOD FOR FABRICATING THE SAME

Atomic force microscopy devices, arrangements and systems

Atomic force microscopy probe

Probe sensor with multi-dimensional optical grating

Three-dimensional nanoscale metrology using FIRAT probe

METHOD FOR GROWING A CARBON NANOTUBE ON A NANOMETRIC TIP

APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q-V, AND I-V TESTING OF SEMICONDUCTOR MATERIALS

Surface analysis and measurement method based on flow resistance of fluid and atomic force microscope using the method

FEEDBACK- ENHANCED THERMO-ELECTRIC TOPOGRAPHY SENSING

Method for producing tapered metallic nanowire tips on atomic force microscope cantilevers

Flow velocity and pressure measurement using a vibrating cantilever device

NANOSTRUCTURE DEVICES AND FABRICATION METHOD

Tool tips with scanning probe microscopy and/or atomic force microscopy applications

Preamplifying cantilever and applications thereof

Sidewall tracing nanoprobes, method for making the same, and method for use

MECHANICAL VIBRATOR AND PRODUCTION METHOD THEREFOR

Microelectromechanical System Comprising a Deformable Portion and a Stress Sensor

Atomic force microscope

Nanostructure devices and fabrication method

Method of fabricating a probe device for a metrology instrument and a probe device produced thereby

Method for microfabricating a probe with integrated handle, cantilever, tip and circuit

Diamond film deposition and probes

SCANNING PROBE MICROSCOPE AND MEASURING METHOD THEREBY

Dual carbon nanotubes for critical dimension metrology on high aspect ratio semiconductor wafer patterns

Method for fabricating SPM and CD-SPM nanoneedle probe using ion beam and SPM and CD-SPM nanoneedle probe thereby

Rocking Y-shaped probe for critical dimension atomic force microscopy

Oscillating scanning probe microscope

Metallic thin film piezoresistive transduction in micromechanical and nanomechanical devices and its application in self-sensing SPM probes

PROBE AND CANTILEVER

Fast-scanning SPM and method of operating same

Fast Tip Scanning For Scanning Probe Microscope

Probe device for a metrology instrument and method of fabricating the same

Measuring probe, sample surface measuring apparatus and sample surface measuring method

Piezoelectric microcantilevers and uses in atomic force microscopy

Optical device comprising a cantilever and method of fabrication and use thereof

AFM tweezers, method for producing AFM tweezers, and scanning probe microscope

Nanotweezer and scanning probe microscope equipped with nanotweezer

Electronic device containing carbon nanotubes

Scanning probe microscopy inspection and modification system

Sample manipulating apparatus

Three-dimensional nanoscale metrology using FIRAT probe

Probe arrangement

Tweezer-equipped scanning probe microscope and transfer method

Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same

High frequency deflection measurement of IR absorption

Probe for a scanning probe microscope and method of manufacture

Probe system comprising an electric-field-aligned probe tip and method for fabricating the same

Method for fabricating probe for use in scanning probe microscope

Factory-alignable compact cantilever probe

INTERMEDIATE PROBE STRUCTURES FOR ATOMIC FORCE MICROSCOPY

Video rate-enabling probes for atomic force microscopy

Cantilevers with integrated actuators for probe microscopy

AFM probe with variable stiffness

Devices for probe microscopy

Method of observing and method of working diamond stylus for working of atomic force microscope

Microscope probe having an ultra-tall tip

Oscillator and method of making for atomic force microscope and other applications

Cantilever holder and scanning probe microscope including the same

Cantilever with carbon nano-tube for AFM

Scanning probe microscopy inspection and modification system

Sample operation apparatus

Nanotube-Based Nanoprobe Structure and Method for Making the Same

Method and apparatus of scanning a sample using a scanning probe microscope

Carbon nanotube detection system

Method of calibrating a caliper AFM

Probe sensor with multi-dimensional optical grating

Atomic force microscope

Atomic force microscope using a torsional harmonic cantilever

Method of Producing Nanostructure Tips

Atomic force microscope cantilever including field effect transistor and method for manufacturing the same

ATOMIC FORCE MICROSCOPE CANTILEVER AND METHOD FOR MANUFACTURING THE SAME

Methods of imaging in probe microscopy

Semiconductor probe with high resolution resistive tip and method of fabricating the same

Atomic force microscope tip arrays and methods of manufacturing same

Amyloid beta protein channel structure and uses thereof in identifying potential drug molecules for neurodegenerative diseases

Cantilever probes for nanoscale magnetic and atomic force microscopy

Integrated system for simultaneous inspection and manipulation

Novel ultrananocrystalline diamond probes for high-resolution low-wear nanolithographic techniques

Optical microcantilever

Electronic device containing a carbon nanotube

Atomic force microscope

High aspect ratio AFM probe and method of making

Short and thin silicon cantilever with tip and fabrication thereof

Method and apparatus of driving torsional resonance mode of a probe-based instrument

Overlay measurement methods with firat based probe microscope

Nanoscale displacement detector

Integrated displacement sensors for probe microscopy and force spectroscopy

Three-dimensional nanoscale metrology using FIRAT probe

Gas filled reactive atomic force microscope probe