171187 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes Probes, their manufacture, or their related instrumentation, e.g. holders
Atomic force microscopy apparatus, methods, and applications
#2Atomic force microscopy apparatus, methods, and applications
#3System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
#4System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
#5Signal coupling system for scanning microwave microscope
#6Microwave resonator and microwave microscope including the same
#7Apparatus and method for scanning capacitance microscopy and spectroscopy
#8Method and apparatus for measuring electrical properties in torsional resonance mode
#9Scanning capacitance microscope, method of driving the same, and recording medium storing program for implementing the method
#10Telegraph signal microscopy device and method
#11Semiconductor probe, method of manufacturing the same, and method and apparatus for analyzing semiconductor surface using semiconductor probe
#12Method and apparatus for measuring electrical properties in torsional resonance mode
#13Electrical scanning probe microscope apparatus