171189 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes Resonance
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
#2Scanning sensor having a spin defect
#3Method and apparatus for measuring magnetic field strength
#4Method and system for magnetic resonance imaging
#5Method and apparatus for measuring magnetic field strength
#6Magnetic resonance force detection apparatus and associated methods
#7Method and system for magnetic resonance imaging using slice selective pulses
#8Method and system for magnetic resonance imaging using nitrogen-vacancy centers
#9Magnetic field value measuring device and method for measuring magnetic field value
#10Apparatus for performing magnetic resonance force microscopy on large area samples
#11Apparatus for mechanically robust thermal isolation of components
#12Probe for magnetic resonance force microscopy and method thereof
#13Surface scanning radio frequency antenna for magnetic resonance force microscopy
#14MECHANICAL OSCILLATOR
#15Magnetic resonance force detection apparatus and associated methods
#16Spin-torque probe microscope
#17Spin microscope based on optically detected magnetic resonance
#18Cantilever probes for nanoscale magnetic and atomic force microscopy
#19Magnetic resonance force microscope
#20Method and apparatus for high resolution nuclear magnetic resonance imaging and spectroscopy
#21Cantilever probes for nanoscale magnetic and atomic force microscopy