171188 ⎘
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
Sub-classes:Super resolution for magneto-optical microscopy
#2Apparatus and method for measuring micrometer scale features of electronic component over millimeter scale distances to nanometer scale precision
#3Magnetic field value measuring device and method for measuring magnetic field value
#4Method and apparatus for inspecting process solution, and sample preparation apparatus in inspection
#5Apparatus and method for correlating images of a photolithographic mask
#6Magnetic field observation device and magnetic field observation method
#7Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus
#8Methods for detecting and imaging magnetic metalloproteins
#9Apparatus and method of obtaining field by measurement
#10Method and device for analyzing distribution of coercive force in vertical magnetic recording medium using magnetic force microscope
#11Cantilever probes for nanoscale magnetic and atomic force microscopy
#12Methods and systems for controlling motion of and tracking a mechanically unattached probe
#13Methods and systems for controlling motion of and tracking a mechanically unattached probe
#14Magnetic field generator device for calibration of magnetic force microscope
#15Cantilever probes for nanoscale magnetic and atomic force microscopy
#16Probe for an atomic force microscope and method for making such a probe
#17System and method for estimating the magnetization states of a nanomagnet array