Method for Producing a Substrate Comprising Multiple Tips for Scanning Probe Microscopy

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTEM PROBES

Integrated dual-probe rapid in-situ switching measurement method and device of atomic force microscope

Probe for scanning probe microscope and binary state scanning probe microscope including the same

Method and apparatus for examining a measuring tip of a scanning probe microscope

Cantilever, ultrasound acoustic microscopy device comprising the cantilever, method of using the same and lithographic system including the same

Array atomic force microscopy for enabling simultaneous multi-point and multi-modal nanoscale analyses and stimulations

Systems and methods for manufacturing nano-electro-mechanical-system probes

MICRO PROBE ARRAY DEVICE AND MANUFACTURING METHOD OF THE DEVICE

Photodetector for scanning probe microscope

Assembly for detecting the intensity distribution of components of the electromagnetic field in beams of radiation

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Device and method for analyzing a defect of a photolithographic mask or of a wafer

Scanning probe microscope using sensor molecules to improve photo-induced force on samples

Atomic force microscopy system, method for mapping one or more subsurface structures located in a semiconductor device or for monitoring lithographic parameters in a semiconductor device and use of such an atomic force microscopy system

Method for producing a probe suitable for scanning probe microscopy

Multiple integrated tips scanning probe microscope

Systems and methods for manufacturing nano-electro-mechanical-system probes

Method and apparatus for examining a measuring tip of a scanning probe microscope

Method of and atomic force microscopy system for performing subsurface imaging

Systems and methods for manufacturing nano-electro-mechanical-system probes

Alignment system and method

Multiple integrated tips scanning probe microscope with pre-alignment components

Multiple integrated tips scanning probe microscope

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Integrated measurement and micromechanical positioning apparatus for real-time test control

SCANNING PROBE MICROSCOPE

MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND APPLICATIONS

Apparatus and methods for non-destructive inspection using microwave microscopy

Coupled multiscale positioning of arrays of parallel, independently actuated and simultaneously driven modular scanning probe microscopes for high-throughput, in-line, nanoscale measurement of flexible, large area, and roll-to-roll processes

METROLOGY DEVICES AND METHODS FOR INDEPENDENTLY CONTROLLING A PLURALITY OF SENSING PROBES

Linked micromechanical positioning apparatus for real-time testing and measurement

Device and method for measuring and/or modifying surface features on a surface of a sample

Electrical contact auto-alignment strategy for highly parallel pen arrays in cantilever free scanning probe lithography

Method of fabricating nano-scale structures on the edge and nano-scale structures fabricated on the edge using the method

Thermal probe for a near-field thermal microscope and method for generating a thermal map

Compact probe for atomic-force microscopy and atomic-force microscope including such a probe

Apparatus and methods for investigating a sample surface

Device and method for analysing a defect of a photolithographic mask or of a wafer

System and method of performing scanning probe microscopy on a substrate surface

Dual-probe scanning probe microscope

Systems and methods for manufacturing nano-electro-mechanical-system probes

Apparatus for scanning nano structure with plural AFM probes and method thereof

Evaluation system and a method for evaluating a substrate

Dynamic optical head and imaging device using flexible nano film optical structure

High throughput microscopy device

MULTIFUNCTIONAL GRAPHENE COATED SCANNING TIPS

Multiple probe actuation

Multiple probe detection and actuation

Multiple probe actuation

High throughput scanning probe microscopy device

Motion sensor integrated nano-probe N/MEMS apparatus, method, and applications

Leveling apparatus and atomic force microscope including the same

Dual-probe scanning probe microscope

System and method for providing electromagnetic imaging through electroquasistatic sensing

High throughout reproducible cantilever functionalization

Probe head scanning probe microscope including the same

Probe assembly for a scanning probe microscope

USING OPTICAL DEFLECTION OF CANTILEVERS FOR ALIGNMENT

SCANNED PROBE MICROSCOPE WITHOUT INTERFERENCE OR GEOMETRIC CONSTRAINT FOR SINGLE OR MULTIPLE PROBE OPERATION IN AIR OR LIQUID

Scanning probe microscope and method for detecting proximity of probes thereof

Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantilevers

Lab-on-a-pipette

Method of aligning a first article relative to a second article

Method for automatically loading a probe assembly

Apparatus and method for investigating surface properties of different materials

System and method for providing electromagnetic imaging through magnetoquasistatic sensing

Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system

System and method for providing electromagnetic imaging through electroquasistatic sensing

Probe assembly for a scanning probe microscope

Apparatus and process for controlled nanomanufacturing using catalyst retaining structures

Scanning probe microscope and a method to measure relative-position between probes

Atomic force microscope

System and method for the inspection of micro and nanomechanical structures

Array and cantilever array leveling

Measuring device with daisy type cantilever wheel

Nanoindentation surface analysis method

Near-field nano-imager

Nanolithography with use of viewports

Probe arrangement

System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers

SURFACE TREATMENT AND SURFACE SCANNING

Apparatus and method of transporting and loading probe devices of a metrology instrument

Near-field optical apparatus and method using photodetector array

Scanning probe microscopy inspection and modification system

Using optical deflection of cantilevers for alignment

APPARATUS AND METHOD OF TRANSPORTING AND LOADING PROBE DEVICES OF A METROLOGY INSTRUMENT

Multifunctional probe array system

Multi-tipped optical component

MULTI-TIP SURFACE CANTILEVER PROBE

Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometer

Atomic force microscope tip arrays and methods of manufacturing same

Apparatus for aligning a first article relative to a second article

Apparatus for evaluating piezoelectric film, and method for evaluating piezoelectric film

Atomic force microscope

Coherent electron junction scanning probe interference microscope, nanomanipulator and spectrometer with assembler and DNA sequencing applications

Nanoindentation surface analysis tool and method

Programmable molecular manipulating processes

Nanogap series substance capturing, detecting and identifying method and device

Object inspection and/or modification system and method

Deconvolving tip artifacts using multiple scanning probes

Multifunctional probe array system

Electrical feedback detection system for multi-point probes

Scanning probe microscopy inspection and modification system

Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers

Three-dimensional structure composed of silicon fine wires, method for producing the same, and device including the same

Multiple local probe measuring device and method

Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers

Interferometric apparatus utilizing a cantilever array to measure a surface

Electrostatic nanolithography probe actuation device and method

Method and device for measuring vibration frequency of multi-cantilever

Programmable molecular manipulating devices

Programmable molecular manipulating processes

Recording/reproducing apparatus

Surface shape measuring apparatus, surface measuring method, and exposure apparatus

Diffractive optical position detector in an atomic force microscope having a moveable cantilever

Scanning probe for data storage and microscopy

Software synchronization of multiple scanning probes

Surface characteristic analysis apparatus

Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus

Probe storage device

Surface treatment and surface scanning

Fine pattern forming apparatus and fine pattern inspecting apparatus

Three-dimensional structural body composed of silicon fine wire, its manufacturing method, and device using same

Multiple local probe measuring device and method

Scanning probe microscopy inspection and modification system

Near-field optical probe

Method of forming atomic force microscope tips

Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes

Microstructures

Electrical feedback detection system for multi-point probes

Software synchronization of multiple scanning probes

Object inspection and/or modification system and method

Multiple local probe measuring device and method

Dual stage instrument for scanning a specimen