171194 ⎘
General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group
Sub-classes:A PROBE CASSETTE AND METHOD FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE PROBE DEVICES FOR A PROBE BASED SYSTEM
#2Sharpening method for probe tip of atomic force microscope (AFM)
#3Measurement system
#4Probe system and method for receiving a probe of a scanning probe microscope
#5Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof
#6Cleaning station for atomic force microscope
#7Liquid-tight container for storing and transporting AFM probes
#8Method of preserving a sensor in a container and a container containing a sensor and a storage solution
#9Method for automatically loading a probe assembly
#10Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope
#11THERMOMECHANICALLY-ACTIVATED TIP SHAPE AND REGISTRY RESTORATION FOR PROBE ARRAY DEVICES UTILIZING THERMOMECHANICALLY-ACTIVATED POLYMERS
#12Method and apparatus for reducing tip-wear of a probe
#13Scanning probe apparatus with in-situ measurement probe tip cleaning capability
#14Apparatus and method of transporting and loading probe devices of a metrology instrument
#15APPARATUS AND METHOD OF TRANSPORTING AND LOADING PROBE DEVICES OF A METROLOGY INSTRUMENT
#16Probe washing method of scanning probe microscope
#17Conductive transparent probe and probe control apparatus
#18Conductive transparent probe and probe control apparatus
#19Conductive transparent probe and probe control apparatus
#20Laser stimulated atom probe characterization of semiconductor and dielectric structures