ULTRA-MICRO ELECTRODE USING LOW MELTING POINT METAL AND MANUFACTURING METHOD THEREOF

High Frequency Passivated AFM Cantilever and Method of Fabrication

Method For Producing A Substrate Comprising Scanning Probe Microscopy Tips

Atomic Force Microscopy Probe with Tilted Tip and Method of Fabrication Thereof

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A MEASURING TIP OF A SCANNING PROBE MICROSCOPE

Method for processing a measuring probe for recording surface properties or for modifying surface structures in the sub-micrometer range and measuring probe

Method for Producing a Substrate Comprising Multiple Tips for Scanning Probe Microscopy

A Method of Manufacturing a MEMS Device

Method of manufacturing a micro-fluid probe

Nano robotic system for high throughput single cell DNA sequencing

Detection Device for Scanning Probe Microscope

Probe, method of manufacturing a probe and scanning probe microscopy system

A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND A METHOD FOR ITS FABRICATION

Metrology probe with built-in angle and method of fabrication thereof

Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope

Method of providing a MEMS device comprising a pyramidal protrusion, and a mold

Scanning Probe and Electron Microscope Probes and Their Manufacture

METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY

Micro probe array device and manufacturing method of the device

Probe and manufacturing method of probe for scanning probe microscope

Sharpening method for probe tip of atomic force microscope (AFM)

Method for providing a probe device for scanning probe microscopy

Scanning probe and electron microscope probes and their manufacture

Methods for designing and processing a microcantilever-based probe with an irregular cross section applied in an ultra-low friction coefficient measurement at a nanoscale single-point contact

Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope

Probe assembly and testing device

Cantilever and manufacturing method for cantilever

Nanoprocessing and heterostructuring of silk

Scanning probe and electron microscope probes and their manufacture

Scanning probe and electron microscope probes and their manufacture

Forming nanotips

Probe unit for test tools and method of manufacturing the same

Method for manufacturing microcantilever

MULTIFUNCTIONAL GRAPHENE COATED SCANNING TIPS

Measurement of surface energy components and wettability of reservoir rock utilizing atomic force microscopy

Probe configuration and method of fabrication thereof

Method for making a 3D nanostructure having a nanosubstructure, and an insulating pyramid having a metallic tip, a pyramid having nano-apertures and horizontal and/or vertical nanowires obtainable by this method

Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus

Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof

Vertical embedded sensor and process of manufacturing thereof

Laser-enhanced chemical etching of nanotips

AFM-coupled microscale radiofrequency probe for magnetic resonance imaging and spectroscopy

Method of fabricating nanotips with controlled profile

Indented Mold Structures For Diamond Deposited Probes

Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof

System for fabricating nanoscale probe and method thereof

Hybrid microprobe for electrochemical and SERS monitoring, scanning and feedback stimulation and the preparation method thereof

Methods for obtaining hollow nano-structures

Cantilever for magnetic force microscope and method of manufacturing the same

Transferable probe tips

Metal tip for scanning probe applications and method of producing the same

Nanometer-scale sharpening of conductor tips

Video rate-enabling probes for atomic force microscopy

Video rate-enabling probes for atomic force microscopy

Method to reduce wedge effects in molded trigonal tips

Method for making a 3D nanostructure having a nanosubstructure, and an insulating pyramid having a metallic tip, a pyramid having nano-apertures and horizontal and/or vertical nanowires obtainable by this method

DUAL-TIP CANTILEVER

HEATED CANTILEVER

SCANNING PROBE EPITAXY

Piezoresistor height sensing cantilever

Macroscopically manipulable nanoscale devices made from nanotube assemblies

Method of manufacturing an SPM probe with a scanning tip and with an alignment aid located opposite the scanning tip

Nanomanufacturing devices and methods

SCANNING PROBE EPITAXY

METHOD OF NANOSCALE PATTERNING USING BLOCK COPOLYMER PHASE SEPARATED NANOSTRUCTURE TEMPLATES

Nanotip repair and characterization using field ion microscopy

Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof

SPM probe with shortened cantilever

Diamond film deposition and probes

MICROTIPS AND NANOTIPS, AND METHOD FOR THEIR PRODUCTION

Micro-protruding structure

Video rate-enabling probes for atomic force microscopy

Nanometer-scale sharpening of conductor tips

Probe Head Manufacturing Method

Multifunctional probe array system

MULTI-TIP SURFACE CANTILEVER PROBE

SCANNING PROBE MICROSCOPY TIPS COMPOSED OF NANOPARTICLES AND METHODS TO FORM SAME

Cantilever and cantilever manufacturing method

Probe for probe microscope using transparent substrate, method of producing the same, and probe microscope device

Probes and methods of making probes using folding techniques

MICROMECHANICAL SYSTEM

Electric discharge apparatus for controlling the length of a carbon nanotube

Nano tip and fabrication method of the same

Probe for scanning probe microscope and method of producing the same

Manufacturing of micro-objects such as miniature diamond tool tips

Multifunctional probe array system

Method of fabricating resistive probe having self-aligned metal shield

Semiconductor probe having resistive tip with low aspect ratio and method of fabricating the same

Nano-tip fabrication by spatially controlled etching

Methods for assembly and sorting of nanostructure-containing materials and related articles

Method and apparatus of manipulating a sample

Electrostatic nanolithography probe actuation device and method

Processing probe, processing apparatus, and method of manufacturing the processing probe

Method for producing at least one small opening in a layer on a substrate and components produced according ot said method

Semiconductor probe with resistive tip having metal shield thereon

Single-atom tip and preparation method thereof

Method of manufacturing semiconductor probe having resistive tip

Method of fabricating a sharp protrusion

Surface characteristic analysis apparatus

Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus

Method for fractionating single-wall carbon nanotubes

Scanning probe microscope probe with integrated capillary channel

Micro-protruding structure

Method of fabricating a surface probing device

Method and apparatus for manipulating a sample

Microstructures

Vertically aligned nanostructure scanning probe microscope tips

Method of making thin film probe tip for atomic force microscopy

Methods and apparatus to detect a conductive object