ClassID:

171204

G01Q80/00 - page 2 - CPC Classification

Classification description:

Applications, other than SPM, of scanning-probe techniques

Recent Application in this class:
#301
20050191434
2005-09-01

Nanolithography methods and products therefor and produced thereby

#302
20050190684
2005-09-01

Nanometer scale data storage device and associated positioning system

#303
20050181132
2005-08-18

Methods utilizing scanning probe microscope tips and products therefor or produced thereby

#304
20050172704
2005-08-11

Methods utilizing scanning probe microscope tips and products thereof or produced thereby

#305
20050172703
2005-08-11

Scanning probe microscopy inspection and modification system

#306
20050162932
2005-07-28

Read/write device for a mass storage device, and read/write method thereof

#307
20050157562
2005-07-21

Low temperature silicided tip

#308
20050145021
2005-07-07

Method and apparatus for manipulating a sample

#309
20050142298
2005-06-30

Method for fabricating nano pore

#310
20050135224
2005-06-23

Contact probe storage FET sensor

#311
20050122786
2005-06-09

Data overwriting in probe-based data storage devices

#312
20050115922
2005-06-02

Method of manufacturing optical fiber probe and for finishing micro material

#313
20050112505
2005-05-26

Field-assisted micro- and nano-fabrication method

#314
20050056783
2005-03-17

Object inspection and/or modification system and method

#315
20050051515
2005-03-10

Cantilever microstructure and fabrication method thereof

#316
20050023462
2005-02-03

Tailoring domain engineered structures in ferroelectric materials

#317
17539855
2023-03-14

Scalable, electro-optically induced force system and method

#318
17001628
2022-02-01

Scalable, electro-optically induced force system and method

#319
16171735
2020-06-23

Metrology technique that provides true flattening

#320
14047674
2016-01-26

Mechanosynthetic tools for a atomic-scale fabrication