171204 ⎘
Applications, other than SPM, of scanning-probe techniques
Nanolithography methods and products therefor and produced thereby
#302Nanometer scale data storage device and associated positioning system
#303Methods utilizing scanning probe microscope tips and products therefor or produced thereby
#304Methods utilizing scanning probe microscope tips and products thereof or produced thereby
#305Scanning probe microscopy inspection and modification system
#306Read/write device for a mass storage device, and read/write method thereof
#307Low temperature silicided tip
#308Method and apparatus for manipulating a sample
#309Method for fabricating nano pore
#310Contact probe storage FET sensor
#311Data overwriting in probe-based data storage devices
#312Method of manufacturing optical fiber probe and for finishing micro material
#313Field-assisted micro- and nano-fabrication method
#314Object inspection and/or modification system and method
#315Cantilever microstructure and fabrication method thereof
#316Tailoring domain engineered structures in ferroelectric materials
#317Scalable, electro-optically induced force system and method
#318Scalable, electro-optically induced force system and method
#319Metrology technique that provides true flattening
#320Mechanosynthetic tools for a atomic-scale fabrication