DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

METHOD FOR FORMING MICRO-PATTERN ON SURFACE OF PRODUCT, AND PRODUCT HAVING MICRO-PATTERN FORMED THEREON BY APPLYING METHOD

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MICROSCOPY/LITHOGRAPHY TIPS

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVICE FOR REMOVING AND COLLECTING PARTICLES THEREFROM

Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device

METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVICE FOR REMOVING AND COLLECTING PARTICLES THEREFROM

Self-packing three-arm thermal scanning probe for micro-nano manufacturing

METHOD AND APPARATUS FOR PROCESSING A SAMPLE

CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEMPERATURE

Debris removal from high aspect structures

SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE

SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-SITU TIP CONDITIONING

Systems and methods for mechanosynthesis

Cantilever, ultrasound acoustic microscopy device comprising the cantilever, method of using the same and lithographic system including the same

Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software

PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD

Systems and methods for mechanosynthesis

Device, and Method of Manufacture, for use in Mechanically Cleaning Nanoscale Debris from a Sample Surface

System and method for autonomous scanning probe microscopy with in-situ tip conditioning

Initiating and monitoring the evolution of single electrons within atom-defined structures

Debris removal in high aspect structures

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Device and method for analyzing a defect of a photolithographic mask or of a wafer

Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software

Nano-indent process for creating single photon emitters in a two-dimensional materials platform

Systems and methods for mechanosynthesis

Phononic system to achieve quantum-analogue phase-based unitary operations

Initiating and monitoring the evolution of single electrons within atom-defined structures

Tuning local conductances of molecular networks: applications to artificial neural networks

Method, atomic force microscopy system and computer program product

Depassivation lithography by scanning tunneling microscopy

Thermal nanolithography method and system

A SYSTEM FOR MICRODROPLET MANIPULATION

METHOD OF MODIFYING A SURFACE OF A SAMPLE, AND A SCANNING PROBE MICROSCOPY SYSTEM

Debris removal in high aspect structures

Debris removal from high aspect structures

Build Sequences for Mechanosynthesis

Systems and methods for mechanosynthesis

Scanning probe inspector

Method of preparing sample surface, method of analyzing sample surface, field-enhanced oxidation probe, and scanning probe microscope including field-enhanced oxidation probe

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Cell for electrochemical measurement

Electrospray imaging and deposition

Technique for three-dimensional nanoprinting

Build sequences for mechanosynthesis

Electrical contact auto-alignment strategy for highly parallel pen arrays in cantilever free scanning probe lithography

Systems and methods for nano-tribological manufacturing of nanostructures

Build sequences for mechanosynthesis

Method and system for positioning using near field transducers, particularly suited for positioning electronic chips

Device and method for analysing a defect of a photolithographic mask or of a wafer

Poly(thioaminal) probe based lithography

In situ tribometer and methods of use

NANOPATTERNING OF PHASE CHANGE MATERIALS VIA HEATED PROBE

Methods and Apparatus for Nanolapping

Dynamic sweep-plow microcantilever device and methods of use

Poly(thioaminal) probe based lithography

DIAMOND DELAYERING FOR ELECTRICAL PROBING

Method and apparatus for nanolapping

Targeted sequencing of biomolecules by pulling through a liquid-liquid interface with an atomic force microscope

Debris removal from high aspect structures

Debris removal in high aspect structures

Apparatus for scanning nano structure with plural AFM probes and method thereof

Microfluidic surface processing device and method

Targeted sequencing of biomolecules by pulling through a liquid-liquid interface with an atomic force microscope

Methods and apparatus for nanofabrication using a pliable membrane mask

Build sequences for mechanosynthesis

Methods, devices, and systems for forming atomically precise structures

MULTIFUNCTIONAL GRAPHENE COATED SCANNING TIPS

Microfluidic surface processing device and method

Redox-active structures and devices utilizing the same

Targeted sequencing of biomolecules by pulling through a liquid-liquid interface with an atomic force microscope

Methods and Apparatuses for Specimen Lift-Out and Circuit Edit Using Needle Arrays

Leveling apparatus and atomic force microscope including the same

Microprobe and microprobe manufacturing method

Redox-active structures and devices utilizing the same

Nanopositioning substrate preparation apparatus and preparation method using dip pen nanolithography with a single tip or multiple tips using atomic force microscope (AFM)

Fluid delivery for scanning probe microscopy

Passive, reversible deformation sensor

Sample probes and methods for sampling intracellular material

Microfluidic surface processing device and method

Magnetic storage device

Optical head

Method for spatially manipulating a microscopic object and device for conducting said method

Methods of manufacturing diamond capsules

USING OPTICAL DEFLECTION OF CANTILEVERS FOR ALIGNMENT

METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THEREFOR OR PRODUCED THEREBY

Method of manufacturing silicon optoelectronic device, silicon optoelectronic device manufactured by the method, and image input and/or output apparatus using the silicon optoelectronic device

Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material

Growth of nanotubes from patterned and ordered nanoparticles

PROBE, METHOD FOR MANUFACTURING PROBE, PROBE MICROSCOPE, MAGNETIC HEAD, METHOD FOR MANUFACTURING MAGNETIC HEAD, AND MAGNETIC RECORDING/REPRODUCING DEVICE

NANOMACHINING METHOD AND APPARATUS

FLUID DELIVERY FOR SCANNING PROBE MICROSCOPY

Nanotipped device and method

Method for fabricating high aspect ratio nanostructures

CUTTING DEVICE FOR CUTTING GRAPHENE AND A METHOD FOR CUTTING GRAPHENE USING A CUTTING DEVICE

Ultrahigh density patterning of conducting media

Optical grid for high precision and high resolution method of wafer-scale nanofabrication

Method of aligning a first article relative to a second article

Ultrahigh density patterning of conducting media

COMPACT NANOFABRICATION APPARATUS

Methods and Apparatus for Nanolapping

Seek-scan probe (SSP) memory with sharp probe tips formed at CMOS-compatible temperatures

Thermochemical nanolithography components, systems, and methods

Microchannel forming method and nanotipped dispensing device having a microchannel

Scanning probe-based lithography method

LEVELING DEVICES AND METHODS

Methods utilizing scanning probe microscope tips and products thereof or produced thereby

Laser-assisted nanomaterial deposition, nanomanufacturing, in situ monitoring and associated apparatus

Patterning nano-scale patterns on a film comprising unzipping polymer chains

Scanning Impedance Microscopy (SIM) To Map Local Impedance In A Dielectric Film

Mass spectrometry apparatus and method using the apparatus

Large area, homogeneous array fabrication including leveling with use of bright spots

HIGH-THROUGHPUT LOCAL OXIDATION NANOLITHOGRAPHIC PROCESS

DUAL-TIP CANTILEVER

Large area, homogeneous array fabrication including controlled tip loading vapor deposition

METHOD FOR PATTERNING NANO-SCALE PATTERNS OF MOLECULES ON A SURFACE OF A MATERIAL

Data storage medium and method for scanning a storage medium

Determining a repairing form of a defect at or close to an edge of a substrate of a photo mask

HEATED CANTILEVER

Fluid delivery for scanning probe microscopy

Near-field optical head having tapered hole for guiding light beam

Near field light generating device, optically assisted magnetic recording head, optically assisted magnetic recording device, near field optical microscope and near field light exposure apparatus

SCANNING PROBE EPITAXY

Piezoresistor height sensing cantilever

Methods utilizing scanning probe microscope tips and products therefor or produced thereby

Nanomanufacturing devices and methods

Microchannel forming method and nanotipped dispensing device having a microchannel

SCANNING PROBE EPITAXY

METHOD OF NANOSCALE PATTERNING USING BLOCK COPOLYMER PHASE SEPARATED NANOSTRUCTURE TEMPLATES

Scanning probe assisted localized CNT growth

FOREIGN OBJECT REMOVAL METHOD AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

Methods utilizing scanning probe microscope tips and products therefor or produced thereby

Apparatus and process for controlled nanomanufacturing using catalyst retaining structures

Device and method for sensing a position of a probe

Massively parallel lithography with two-dimensional pen arrays

Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material

System and a method for improved crosshatch nanomachining of small high aspect three dimensional structures by creating alternating superficial surface channels

Folded beam suspension for probe

Field-aided preferential deposition of precursors

THERMOMECHANICALLY-ACTIVATED TIP SHAPE AND REGISTRY RESTORATION FOR PROBE ARRAY DEVICES UTILIZING THERMOMECHANICALLY-ACTIVATED POLYMERS

THERMAL CONTROL OF DEPOSITION IN DIP PEN NANOLITHOGRAPHY

DEVICE FORMED BY PROBE-BASED LITHOGRAPHY UTILIZING THERMOMECHANICALLY ACTIVATED POLYMERS

Dielectrophoretic tweezers apparatus and methods

Driving apparatus

Dielectrophoretic tweezers apparatus and methods

Optical head for near-field recording and reproducing device

Array and cantilever array leveling

Optical component operating in near-field transmission

Cantilever with pivoting actuation

Independently-addressable, self-correcting inking for cantilever arrays

METHOD AND SYSTEM FOR IMPROVING DOMAIN FORMATION IN A FERROELECTRIC MEDIA AND FOR IMPROVING TIP LIFETIME

Preload modulation to reduce head motion hysteresis

Scanning probe-based lithography method

Installation and method of nanofabrication

PHOTOMASK DEFECT CORRECTION DEVICE AND PHOTOMASK DEFECT CORRECTION METHOD

System and methods of laser assisted field induced oxide nanopatterning

Quantum device, manufacturing method of the same and controlling method of the same

Direct nanoscale patterning of metals using polymer electrolytes

PHOTOMASK DEFECT CORRECTION DEVICE AND PHOTOMASK DEFECT CORRECTION METHOD

Near-field optical head and information recording apparatus

COMPACT NANOFABRICATION APPARATUS

Probe for scanning over a substrate and a data storage device

Probe for scanning over a substrate and data storage device

AFM tweezers, method for producing AFM tweezers, and scanning probe microscope

Nanotweezer and scanning probe microscope equipped with nanotweezer

SURFACE-TREATED FERROELECTRIC MEDIA FOR USE IN SYSTEMS FOR STORING INFORMATION

Scanning probe microscopy inspection and modification system

Sample manipulating apparatus

Nanolithography with use of viewports

Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus

Data storage device

Apparatus for focusing plasmon waves

MEMS nanoindenter

Direct write nanolithographic deposition of nucleic acids from nanoscopic tips

Apparatus and Method for Nano-Scale Electric Discharge Machining

Diamond structures as fuel capsules for nuclear fusion

Read/write tip, head and device, and use thereof, and method for manufacturing same

Ultrahigh density patterning of conducting media

Information recording/reproducing device having head covering by resistance element

SURFACE TREATMENT AND SURFACE SCANNING

Seek-scan probe (SSP) memory with sharp probe tips formed at CMOS-compatible temperatures

Nanospot Welder and Method

Local injector of spin-polarized electrons with semiconductor tip under light excitation

Methods and apparatus for nanolapping

Surface and site-specific polymerization by direct-write lithography

Optimized ridge apertures for thermally assisted magnetic recording

Scanning Probe Microscope, Nanomanipulator with Nanospool, Motor, nucleotide cassette and Gaming application

Probe for scanning over a substrate and a data storage device

Nanotipped device and method

Methods for manufacturing optical fiber probe and for processing micromaterial

Scanning probe microscopy inspection and modification system

Semiconductor probe having resistive tip and method of fabricating the same

Nanolithography methods and products therefor and produced thereby

Method of correcting opaque defect of chrome mask, in which atomic force microscope fine working apparatus has been used

Tip structure for scanning devices, method of its preparation and devices thereon

Using optical deflection of cantilevers for alignment

Fast dip for reduced wicking in nanolithograhic ink delivery

Probe Head Manufacturing Method

Probe for scanning over a substrate and a data storage device

Optical head capable of providing a subwavelength beams

Optically controllable device

CANTILEVER WITH CONTROL OF VERTICAL AND LATERAL POSITION OF CONTACT PROBE TIP

Multifunctional probe array system

Method of correcting opaque defect of photomask using atomic force microscope fine processing device

Probe, manufacturing method of the probe, recording apparatus, and reproducing apparatus

Processing method using atomic force microscope microfabrication device

Redox-active structures and devices utilizing the same

Apparatus for aligning a first article relative to a second article

Optical near-field generator and near-field optical recording and reproduction apparatus

Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly

Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography

Pattern transfer by solid state electrochemical stamping

Method of selective removal of organophosphonic acid molecules from their self-assembled monolayer on Si substrates

Preparation of nanometric arrays of biomolecules on oligo- or poly(ethylene glycol) films on silicon surfaces

Information media and method and apparatus for writing and reproducing information using the same

Programmable molecular manipulating processes

Magnetic head and information storage apparatus

X-Y stage driver having locking device and data storage system having the X-Y stage driver

Automated nanoassembly

Method of reproducing information using semiconductor probe and device adopting the semiconductor probe

Data storage device utilizing carbon nanotubes and method for operating

Nanotipped device and method

Nanospot welder and method

Semiconductor probe and method of writing and reading information using the same

Object inspection and/or modification system and method

Direct write nanolithography using heated tip

Phase separation in patterned structures

NEAR-FIELD LIGHT GENERATING DEVICE

Device and method for sensing topographical variations on a surface using a probe

Multifunctional probe array system

Precision resonance frequency tuning method for photonic crystal structures

Method of fabricating resistive probe having self-aligned metal shield

Semiconductor probe having resistive tip with low aspect ratio and method of fabricating the same

Scanning probe microscopy inspection and modification system

Patterned media for a high density data storage device

Method for forming a reinforced tip for a probe storage device

Probe for data storage apparatus

Fabricating nanoscale and atomic scale devices

Apparatus for focusing plasmon waves

Optical head, information storage apparatus, optical head design apparatus, and optical head design program storage medium

Scanning probe device and processing method of scanning probe

Scanning probe device and processing method by scanning probe

Method of fabricating semiconductor probe with resistive tip

Method of manufacturing silicon optoelectronic device, silicon optoelectronic device manufactured by the method, and image input and/or output apparatus using the silicon optoelectronic device

Method of preparing silver nano-structure by means of scanning turnneling microscopy

Biomarker sensors and method for multi-color imaging and processing of single-molecule life signatures

Method and apparatus of manipulating a sample

Method and device for surfactant activated Dip-Pen Nanolithography

Nanometer scale data storage device and associated positioning system

Electrostatic nanolithography probe actuation device and method

Adaptable end effector for atomic force microscopy based nano robotic manipulators

Method and device enabling capacitive probe-based data storage readout

Nanospot welder and method

Processing probe, processing apparatus, and method of manufacturing the processing probe

Electronic and optoelectronic devices having nanoparticles configured by patterned ferroelectric material

Semiconductor probe with resistive tip having metal shield thereon

Optical head capable of providing a subwavelength beams

Fluid delivery for scanning probe microscopy

Method for forming optical aperture, near-field optical head, method for fabricating near-field optical head, and information recording/reading apparatus

Method for forming quantum dots

Near-field light generating method and near-field optical head using a light blocking metal film having a fine opening whose size is not more than a wavelength of irradiated light, and near-field optical microscope having the optical head

Thin film and method for manufacturing same

Method of manufacturing silicon optoelectronic device, silicon optoelectronic device manufactured by the method, and image input and/or output apparatus using the silicon optoelectronic device

Quantum device, manufacturing method of the same and controlling method of the same

Programmable molecular manipulating devices

Programmable molecular manipulating processes

Recording/reproducing apparatus

Scanning probe-based lithography method

Parallel, individually addressable probes for nanolithography

Electrostatically driven carbon nanotube gripping device

Pyramid-shaped near field probe using surface plasmon wave

Method of fabricating oxide film

Scanning probe for data storage and microscopy

Thermal control of deposition in dip pen nanolithography

Precision machining method using a near-field scanning optical microscope

Cantilever-type near-field probe for optical data storage and method of manufacturing the same

Method of removing particle of photomask using atomic force microscope

Method of fabricating a sharp protrusion

Integrated metallic contact probe storage device

Probe storage device

Photomask defect correction method employing a combined device of a focused electron beam device and an atomic force microscope

Surface treatment and surface scanning

Surface and site-specific polymerization by direct-write lithography

Fine pattern forming apparatus and fine pattern inspecting apparatus

Stylus system for modifying small structures

Processing method using probe of scanning probe microscope

Method of processing vertical cross-section using atomic force microscope

Physical nano-machining with a scanning probe system for integrated circuit modification

Storage device having first and second magnetic elements that interact magnetically to indicate a storage state

Cantilever-type near-field probe for optical data storage and method of manufacturing the same

Electronic and optoelectronic devices and methods for preparing same

Methods for writing and reading highly resolved domains for high density data storage

Self-aligned coating on released MEMS

Device and method for maskless AFM microlithography

Scanning probe device and processing method by scanning probe

Method for modifying existing micro-and nano-structures using a near-field scanning optical microscope

Scanning probe microscope and measuring method by means of the same

Scratch repairing processing method and scanning probe microscope (SPM) used therefor

Track-based metrology method and apparatus