171237 ⎘
Details of instruments or arrangements of the types included in groups - and; General constructional details; Measuring leads; Measuring probes; Measuring probes High voltage probes
HIGH-VOLTAGE SURGE TESTING
#2ARC SUPPRESSION IN A WAFER TESTING ENVIRONMENT
#3TEST SYSTEM AND METHOD FOR PERFORMING HIGH-VOLTAGE TESTING ON A DEVICE UNDER TEST
#4DIAGNOSTIC AND TESTING MODULE FOR ELECTRICALLY POWERED MACHINE
#5TEST SYSTEM FOR HIGH-VOLTAGE AND HIGH-CURRENT TESTING ON A PLURALITY OF POWER SEMICONDUCTOR DEVICES COMPRISED IN A WAFER, AND CONTACTING SYSTEM
#6VOLTAGE AND CURRENT PROBE ASSEMBLIES FOR RADIO FREQUENCY CURRENT CARRYING CONDUCTORS
#7Test device
#8Probe card for testing power devices under high temperature and high voltage
#9Voltage sensing mechanism
#10Coaxial contact having an open-curve shape
#11High voltage assembly and detector
#12Apparatus for providing a test signal from a device under test (DUT) to a measurement instrument
#13Electrical test probe and testing system using the same
#14APPARATUS AND METHOD FOR AN IMPROVED VOLTAGE DETECTOR
#15Probe systems and methods including electric contact detection
#16Shrouded test probe
#17Transducer for high-voltage measuring technology
#18Probe card and contact inspection device
#19Probe systems and methods including electric contact detection
#20System and method for stripline electrodes for thin-film characterization
#21ELECTRICAL PROBE AND JIG FOR THE SAME
#22Probe card for high voltage testing
#23Failure estimation apparatus and failure estimation method
#24Measurement device
#25System comprising a probe and a measuring device
#26Systems and methods for on-wafer dynamic testing of electronic devices
#27Circuit board testing system
#28Prober
#29Semiconductor evaluation apparatus
#30High-voltage detector monitoring system
#31High voltage interrogator plug with external grounding
#32System and method for monitoring a power line
#33Connector / cable assembly
#34Current application device and manufacturing method of semiconductor element
#35Probe card for power device
#36MEASURING DEVICE, MEASURING METHOD, AND ELEMENT MANUFACTURING METHOD INCLUDING MEASURING METHOD
#37Adjustable measurement device
#38System and method for testing an electronic device
#39System and method to provide talking feature and interactive voice menu in phasing meters
#40Probe assembly for inspecting power semiconductor devices and inspection apparatus using the same, the probe assembly having a probe block, a probe, and a cooling device
#41High voltage detection in power system electrical high voltage line
#42Electrostatic shielding technique on high voltage resistor
#43Electrostatic shielding technique on high voltage diodes
#44Indirect non-contact high voltage measurement on electrical power line
#45Method of implementation of peak hold in a phasing voltmeter
#46Apparatus and method for identifying high risk non-ceramic insulators (NCI) with conductive or high permittivity defects
#47Apparatus and method for inspecting high voltage insulators
#48High voltage sensing mechanism with integrated on-off switch
#49Jig for semiconductor test
#50Test apparatus
#51System and method for improving accuracy of high voltage phasing voltmeters
#52HIGH VOLTAGE CAPACITANCE PROBE
#53Device, probe, and method for the galvanically decoupled transmission of a measuring signal
#54Shielded probe for testing a device under test
#55Shielded probe for testing a device under test
#56Shielded probe with low contact resistance for testing a device under test
#57Shielded probe for testing a device under test
#58Shielded probe for high-frequency testing of a device under test
#59System and method for detecting a contact between an aerial device and an electrical power source