171719 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices; Circuits therefor for testing bipolar transistors for measuring noise
ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE
#2Noise parameter determination of scalable devices
#3Noise measurement system
#4Electric circuit evaluation method and electric circuit
#5Using a shared local oscillator to make low-noise vector measurements
#6Threshold voltage based power transistor operation
#7Noise parameter measurement system
#8Method for asynchronous impulse response measurement between separately clocked systems