171714 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices Circuits therefor
Sub-classes:METHOD AND APPARATUS FOR EVALUATING DEGREE OF DEGRADATION OF ACTIVE REGION OF TRANSISTOR
#2MANAGING ARRANGEMENTS OF TRANSISTORS IN CIRCUITS FOR GENERATING SAMPLES FROM A TARGET DISTRIBUTION
#3INSPECTION APPARATUS
#4STATE PREDICTION DEVICE, STATE PREDICTION METHOD AND STATE PREDICTION SYSTEM
#5Fully Automated Diagnostic System and Method for Fault Detection in Ratio-Metric Signal Paths
#6INSPECTION APPARATUS, INSPECTION SYSTEM, INSPECTION METHOD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#7SYSTEM FOR DETERMINING TRANSISTOR OPERATING CHARACTERISTICS
#8MEASURING METHOD AND MANUFACTURING METHOD
#9INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
#10TEST SYSTEM FOR HIGH-VOLTAGE AND HIGH-CURRENT TESTING ON A PLURALITY OF POWER SEMICONDUCTOR DEVICES COMPRISED IN A WAFER, AND CONTACTING SYSTEM
#11DEGRADATION DIAGNOSIS SYSTEM, DEGRADATION DIAGNOSIS METHOD, AND POWER CONVERTER
#12SYSTEM AND METHOD FOR DETERMINING ELECTRONIC DEVICE THERMAL RESISTANCE CHARACTERISTICS
#13NOISE ANALYSIS APPARATUS, NOISE ANALYSIS METHOD, AND PROGRAM
#14MONITOR STRUCTURES FOR MEASURING DEVICE IMPEDANCE
#15SEMICONDUCTOR DEVICE
#16CONTACT RESISTANCE MEASUREMENT METHOD
#17System and Methods for Detecting a Switching Semiconductor in Circuit Interrupters
#18Method for monitoring a semiconductor switch for failure and inverter switching
#19METHOD FOR CHARACTERIZING IN PULSE MODE A III-V SEMICONDUCTOR TRANSISTOR AND ASSOCIATED TEST BED
#20TEST METHOD FOR IMPROVING IO DEVICE YIELD
#21Integrated circuit die test architecture
#22SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#23POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD FOR OPERATING PROBE SYSTEM, AND METHOD FOR UTILIZING PROBE SYSTEM TO PRODUCE A TESTED SEMICONDUCTOR DEVICE
#24Test circuit of semiconductor apparatus and test system including the same
#25SEMICONDUCTOR DEVICE INCLUDING DETECTION STRUCTURE
#26CALCULATION METHOD AND CALCULATION DEVICE
#27TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT
#28MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE
#29TRANSMITTING AND RECEIVING CIRCUIT AND TEST DEVICE INCLUDING THE SAME
#30CIRCUITRY AND METHODS FOR MONITORING POWER CONVERSION CIRCUITRY
#31Noise monitoring apparatus, noise monitoring system and a noise monitoring method
#32MEASURING EQUIPMENT AND MEASURING METHOD FOR MEASURING ELECTRONIC PROPERTIES AND OPTICAL PROPERTIES
#33Method for reduction of SIC MOSFET gate voltage glitches
#34Integrated circuit die test architecture
#35Digital loop dual-stage source measure unit
#36Methods and apparatus for testing inaccessible interface circuits in a semiconductor device
#37GATE VOLTAGE DETERMINATION APPARATUS, GATE VOLTAGE DETERMINATION METHOD, GATE DRIVING CIRCUIT AND SEMICONDUCTOR CIRCUIT
#38TEST VEHICLE AND TEST METHOD FOR MICROELECTRONIC DEVICES
#39Two-domain two-stage sensing front-end circuits and systems
#40Semiconductor testing device, semiconductor testing method, and manufacturing method for semiconductor device
#41Drive device for voltage-controlled semiconductor element
#42Semiconductor device and test system
#43Method for determining material parameters of a multilayer test sample
#44Method for estimating parameters of a junction of a power semi-conductor element and power unit
#45Integrated circuit die test architecture
#46Model parameter test structures for transistors and preparation methods thereof
#47METHOD FOR DETERMINING A CET MAP, METHOD FOR DETERMINING THE ACTIVATION ENERGY OF A TYPE OF DEFECT AND ASSOCIATED DEVICE
#48Memory controller with integrated test circuitry
#49EQUIPMENT SENSING CIRCUIT BOARD AND OPERATION METHOD THEREOF
#50Semiconductor device and inspection method
#51Electrical characteristic inspection device for semiconductor device and electrical characteristic inspection method for semiconductor device
#52Gate-driving circuit and device
#53Universal switching platform and method for testing dynamic characteristics of a device
#54Two-domain two-stage sensing front-end circuits and systems
#55Micro device arrangement in donor substrate
#56CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS
#57Prognostic health management for power devices
#58Defect detection structures, semiconductor devices including the same, and methods of detecting defects in semiconductor dies
#59Performance-screen ring oscillator with switchable features
#60Test system and the method for testing a semiconductor device
#61Semiconductor device including temperature sensing circuit
#62Integrated circuit die test architecture
#63Testing structure and testing method
#64Optical probe, optical probe array, test system and test method
#65Coaxial socket of impedance matching structure for semiconductor chip testing and manufacturing method thereof
#66Memory controller with integrated test circuitry
#67Method and device for testing array substrate, and computer readable storage medium
#68Semiconductor devices including through electrodes
#69Circuit layout similarity metric for semiconductor testsite coverage
#70Drive device, power supply system, and method of testing drive device
#71Test circuit and test method for display panels
#72Inspection apparatus of semiconductor device and method for inspecting semiconductor device
#73ESD hard backend structures in nanometer dimension
#74Failure positioning method
#75Method of testing an interconnection substrate and apparatus for performing the same
#76Two die sides with PTI. PTO. TDI, TCK, TMS, TDO, PTIO contact points method
#77Micro device arrangement in donor substrate
#78Current detection circuit
#79Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of DUTs and to pre-test a pre-test subset of a plurality of DUTs, which is a subset of the test subset, with a pre-test
#80Method for the characterization and monitoring of integrated circuits
#81Gate charge measurements using two source measure units
#82Structure and method for testing semiconductor device
#83Inspection method for micro LED
#84Method for the characterization and monitoring of integrated circuits
#85Memory controller with integrated test circuitry
#86Power supply protective device, power supply device and switch failure diagnosing method
#87Semiconductor device
#88Inspection device, inspection system, intelligent power module, inspection method, and computer program product
#89Semiconductor device and test method
#90Voltage suppressor test circuit and method of testing a voltage suppressor
#91Memory systems and power management apparatuses including secondary power devices, and related methods of operation
#92Electrically-verifiable fuses and method of fuse verification
#93ESD hard backend structures in nanometer dimension
#94Semiconductor device inspection apparatus, semiconductor device inspection method, program thereof, semiconductor apparatus, and manufacturing method therefor
#95In-field system test security
#96In-field system testing
#97Semiconductor device
#98METHOD OF FORMING SURFACE PROTRUSIONS ON AN ARTICLE AND THE ARTICLE WITH THE PROTRUSIONS ATTACHED
#99Apparatus and methods for integrated MEMS devices
#100Stack die gating having test control input, output, and enable
#101Failure detection circuit, failure detection system and failure detection method
#102Detection method and detection device of process corner of mos transistor
#103SEMICONDUCTOR DEVICE TESTING
#104Peak current evaluation system and peak current evaluation method
#105Contact-via chain as corrosion detector
#106Test system for measuring propagation delay time of transmission line
#107TFT device for measuring contact resistance and measurement method for contact resistance
#108SENSOR DEVICE
#109Pipe structure and semiconductor module testing equipment including the same
#110Micro device arrangement in donor substrate
#111Power supply protective device, power supply device and switch failure diagnosing method
#112Methods, apparatus and system for screening process splits for technology development
#113Apparatus and methods for integrated MEMS devices
#114Test port, decompressor, compactor with I/O on opposite die surfaces
#115Wafer testing system and associated methods of use and manufacture
#116Sensor device having inductors, analog and logic circuits for detecting power flowing through a powerline
#117IC TOP/BOTTOM SURFACES COUPLED TO TEST, SCAN, AND COMPARATOR CIRCUITRY
#118State determination apparatus
#119ESD hard backend structures in nanometer dimension
#120Impedance matching device for reducing reflection loss by splitting digital signal and test system having the same
#121Granular dynamic test systems and methods
#122Independent test partition clock coordination across multiple test partitions
#123Dynamic independent test partition clock
#124Scan system interface (SSI) module
#125Method and system for dynamic standard test access (DSTA) for a logic block reuse
#126Test partition external input/output interface control for test partitions in a semiconductor
#127Wafer level electrical test for optical proximity correction and/or etch bias
#128TFT device for measuring contact resistance and measurement method for contact resistance
#129Method for the characterization and monitoring of integrated circuits
#130Semiconductor device and semiconductor system
#131Addressable test circuit and test method for key parameters of transistors
#132Semiconductor device
#133Test board, test equipment, test system, and test method
#134Auxiliary test device, test board having the same, and test method thereof
#135System and method for deducing charge density gradients in doped semiconductors
#136Semiconductor device and method for testing the semiconductor device
#137System and method for identifying significant and consumable-insensitive trace features
#138Method for auto-calibrating semiconductor component tester
#139Method for the characterization and monitoring of integrated circuits
#140Method and apparatus for RFID tag testing
#141Methods and apparatus for testing inaccessible interface circuits in a semiconductor device
#142Methods, apparatus and system for voltage ramp testing
#143Processing apparatus, ion implantation apparatus and ion implantation method
#144Test setting circuit, semiconductor device, and test setting method
#145Contactless damage inspection of perimeter region of semiconductor device
#146System and method for calibrating chips in a 3D chip stack architecture
#147Testing of semiconductor packages with integrated antennas
#148Triaxial DC-AC connection system
#149Devices under test
#150Semiconductor module with gripping sockets, methods for gripping, for moving and for electrically testing a semiconductor module
#151Semiconductor device with test mode circuit
#152Test system that performs simultaneous tests of multiple test units
#153Method of characterizing a device
#154Electric field concentration location observation device and electric field concentration location observation method
#155WAFER MAP IDENTIFICATION SYSTEM FOR WAFER TEST DATA
#156Method and strategy for multiplexing battery cycler hardware
#157Method of Manufacturing a Semiconductor Device
#158Semiconductor apparatus
#159Circuit to detect previous use of computer chips using passive test wires
#160Programmable stitch chaining of die-level interconnects for reliability testing
#161Continuous capacitor health monitoring and power supply system
#162CHIP INSTRUMENTATION FOR IN-SITU CLOCK DOMAIN CHARACTERIZATION
#163Inter-terminal capacitance measurement method for three-terminal device and apparatus for the same
#164Semiconductor device for verifying operation of through silicon vias
#165Semiconductor wafer and method of concurrently testing circuits formed thereon
#166Semiconductor wafer and method of concurrently testing circuits formed thereon
#167Semiconductor chip having transistor degradation reversal mechanism
#168Parametric test program generator
#169CHIP TO PACKAGE INTERACTION TEST VEHICLE AND METHOD FOR TESTING CHIP TO PACKAGE INTERACTION USING THE SAME
#170Method for the characterization and monitoring of integrated circuits
#171Semiconductor device and operating method thereof
#172Test circuit and method
#173Method of forming surface protrusions on an article and the article with the protrusions attached
#174SEMICONDUCTOR SYSTEM AND OPERATING METHOD THEREOF
#175Semiconductor wafers, and testing methods thereof
#176Programmable addressable test chip
#177Kill die subroutine at probe for reducing parametric failing devices at package test
#178Multiple defect diagnosis method and machine readable media
#179METHOD AND EQUIPMENT FOR TESTING SEMICONDUCTOR APPARATUSES SIMULTANEOUSLY AND CONTINUOUSLY
#180Semiconductor system that tests the connectivity between a metal and a bump that are formed in the upper portion of a penetrating electrode
#181Display substrate, method of testing the display substrate and display apparatus having the display substrate
#182Voltage-driven intelligent characterization bench for semiconductor
#183Semiconductor abnormality detection circuit
#184Field triage of EOS failures in semiconductor devices
#185Automated test system with edge steering
#186Test circuit and method of semiconductor integrated circuit
#187APPARATUS AND METHOD OF TESTING AN ELECTRONIC DEVICE
#188TEST PROBE AND MACHINING METHOD THEREOF
#189IC top/bottom surfaces coupled to test, scan, and comparator circuitry
#190METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND PROBING ASSEMBLY FOR USE THEREIN
#191On chip bias temperature instability characterization of a semiconductor device
#192Electronic device, test board, and semiconductor device manufacturing method
#193Semiconductor device and operating method of semiconductor device
#194Organic light-emitting display device and method of detecting defect in the organic light-emitting display device
#195Semiconductor test and monitoring structure to detect boundaries of safe effective modulus
#196Addressable test circuit and test method for key parameters of transistors
#197DEVICE FOR CALCULATING ROUND-TRIP TIME OF MEMORY TEST USING PROGRAMMABLE LOGIC
#198Wafer debonding using mid-wavelength infrared radiation ablation
#199Adhesives for bonding handler wafers to device wafers and enabling mid-wavelength infrared laser ablation release
#200Reconfigurable semiconductor device
#201Wafer testing system and associated methods of use and manufacture
#202Non-intrusive monitoring and control of integrated circuits
#203System and method for calibrating chips in a 3D chip stack architecture
#204Method for testing a plurality of transistors in a target chip
#205Line detecting apparatus and method for array substrate
#206Power semiconductor module comprising a power electronics circuit and an arrangement for measuring and transferring measurement data
#207Semiconductor device, manufacturing method thereof, and measuring method thereof
#208Detection of defective electrical connections
#2094 port L-2L de-embedding method
#210PROCESS DETECTION CIRCUIT
#211Chip-on-wafer process control monitoring for chip-on-wafer-on-substrate packages
#212DELAY MEASUREMENT DEVICE, METHOD AND MEDIUM
#213Probe card and test apparatus including the same
#214Processing apparatus and ion implantation apparatus
#215SMU RF transistor stability arrangement
#216SYSTEM AND METHOD OF DETECTION AND ANALYSIS FOR SEMICONDUCTOR CONDITION PREDICTION
#217Pixel test in a liquid crystal on silicon chip
#218Detecting TSV defects in 3D packaging
#219Apparatus for testing switching of power semiconductor module
#220SYSTEMS AND METHODS FOR FRACTURE DETECTION IN AN INTEGRATED CIRCUIT
#221Circuits for self-reconfiguration or intrinsic functional changes of chips before vs. after stacking
#222Gate driving circuit having a fault detecting circuit for a semiconductor switching device
#223Semiconductor device test structures and methods
#224Space transformation methods
#225Test apparatus for semiconductor package
#226Method and apparatus for RFID tag testing
#227Method and apparatus for testing a semiconductor device
#228Pin removal mode signal generation circuit and semiconductor apparatus including the same
#229Methods and apparatus for testing inaccessible interface circuits in a semiconductor device
#230Wafer testing system and associated methods of use and manufacture
#231Internal power supply control device having at least one lighting control device for a motor vehicle
#232Current tests for I/O interface connectors
#233Semiconductor test and monitoring structure to detect boundaries of safe effective modulus
#234Ultrasonic transducer element chip, probe head, probe, electronic instrument, and ultrasonic diagnostic device
#235Method and device for measuring changes over time of the electrical performance of an FDSOI transistor
#236System and method for calibrating chips in a 3D chip stack architecture
#237Device and Method For Generating Noise Signals and Use Of a Device For Generating Noise Signals
#238Semiconductor device having potential monitoring terminal to monitor potential of power-supply line
#239Semiconductor apparatus and chip selecting method thereof
#240Control device
#241Method and apparatus for testing a semiconductor device
#242Test apparatus and test method
#243Voltage-driven intelligent characterization bench for semiconductor
#244Method and equipment for testing semiconductor apparatuses simultaneously and continuously
#245Power semiconductor device current detector circuit and detection method
#246Wafer testing systems and associated methods of use and manufacture
#247Methods and system for electrostatic discharge protection of thin-film transistor backplane arrays
#248Process monitor for monitoring an integrated circuit chip
#249High throughput quantum efficiency combinatorial characterization tool and method for combinatorial solar test substrates
#250High throughput current-voltage combinatorial characterization tool and method for combinatorial solar test substrates
#251Semiconductor device test structures and methods
#252Curve tracer signal conversion for integrated circuit testing
#253Test device for testing transistor characteristics in semiconductor integrated circuit
#254Gain control methods and systems in an amplifier assembly
#255Method of manufacturing a semiconductor device
#256Process monitor for monitoring an integrated circuit chip
#257Gain control methods and systems in an amplifier assembly
#258Semiconductor device, manufacturing method thereof, and measuring method thereof
#259Process monitor for monitoring and compensating circuit performance
#260Semiconductor device test structures and methods
#261Apparatus/method for measuring the switching time of output signals of a DUT
#262Gain control methods and systems in an amplifier assembly
#263Method and program for controlling an apparatus for measurement of characteristics of a semiconductor device under test
#264Method of manufacturing a semiconductor device
#265Variable-gain low noise amplifier for digital terrestrial applications
#266Gain control methods and systems in an amplifier assembly
#267Variable-gain low noise amplifier for digital terrestrial applications
#268Process monitor for monitoring and compensating circuit performance
#269Active load pull system
#270Decoupling BTI and HCI mechanism in ring oscillator
#271Hybrid harmonic source pull tuner system
#272Voltage spike detector and system for detecting voltage spikes in semiconductor devices
#273Heterodyne active electronic load pull tuner
#274Active electronic tuner
#275Current sensor having microwave chip resistors in parallel radial arrangement
#276Active slide screw tuner
#277Load pull method for transistors driven by modulated signal
#278Wideband attenuation and phase controller
#279Transistor test fixture with integrated couplers and method
#280Circuits and methods for measuring circuit elements in an integrated circuit device