171721 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices; Circuits therefor for testing bipolar transistors for measuring thermal properties thereof
SEMICONDUCTOR DEVICE WITH AGING SENSOR SYSTEM AND METHOD THEREFOR
#2COMPARATIVE DEVICE OPERATING TEMPERATURE ANOMALY DETECTION
#3APPARATUS AND METHOD FOR ESTIMATING TEMPERATURE AND MAIN CURRENT OF POWER SEMICONDUCTOR ELEMENT
#4METHOD AND DEVICE FOR INSPECTING JUNCTION PORTION OF POWER MODULE
#5SEMICONDUCTOR DEVICE
#6Method and Apparatus for Estimating Cyclic Thermal Stress
#7METHOD AND DEVICE FOR MEASURING THE STATE OF HEALTH OF SEMICONDUCTOR-BASED ELECTRONIC COMPONENTS
#8METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEMPERATURE OF A SEMICONDUCTOR COMPONENT HAVING AN INSULATED GATE
#9METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE
#10METHOD FOR TESTING AND EVALUATING SHORT-CIRCUIT WITHSTAND CAPABILITY OF PRESS-PACK POWER COMPONENT
#11SEMICONDUCTOR DEVICE
#12DIAGNOSIS AND PROGNOSIS OF IGBT MODULES
#13STATE DETERMINATION DEVICE AND VEHICLE
#14JUNCTION TEMPERATURE CALCULATION METHOD AND DEVICE FOR POWER CONVERSION MODULE, MEDIUM, AND VEHICLE
#15ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
#16Method for estimating parameters of a junction of a power semi-conductor element and power unit
#17System and method for measuring intermittent operating life of GaN-based device
#18METHOD AND SYSTEM FOR CHARACTERIZING IGBT MODULE AGING BASED ON MINER THEORY
#19Semiconductor device and power conversion device
#20Multi-time-scale reliability evaluation method of wind power IGBT considering fatigue damage and system thereof
#21Determining the remaining usability of a semiconductor module in normal use
#22Method and apparatus for electrical component life estimation with corrosion compensation
#23Semiconductor device and system
#24Semiconductor device
#25Analyzing an operation of a power semiconductor device
#26Testing device
#27Power supply circuit for measuring transient thermal resistances of semiconductor device
#28Power Semiconductor Circuit and Method for Determining a Temperature of a Power Semiconductor Component
#29Method for determining failure of power element and electronic device thereof
#30Method for manufacturing semiconductor device
#31Method and device for estimating level of damage or lifetime expectation of power semiconductor module
#32THERMAL MODEL BASED HEALTH ASSESSMENT OF IGBT
#33Diagnosis system for power conversion device, diagnosis method for semiconductor module, and power conversion device
#34DOOR APPARATUS FOR CHAMBER
#35Drive circuit for insulated-gate semiconductor element
#36ON-LINE HEALTH MANAGEMENT DEVICE AND METHOD FOR INSULATED GATE BIPOLAR TRANSISTOR
#37SEMICONDUCTOR ELEMENT DRIVING DEVICE
#38System and method for measuring junction temperature of power module
#39Monitoring aging of power semiconductor devices based on case temperature
#40Method for determining a deterioration of power semiconductor modules as well as a device and circuit arrangement
#41Semiconductor structure and method for operating the same
#42Desaturation detection circuit and desaturation circuit monitoring function
#43Semiconductor device and fault detecting method
#44Insulated-gate bipolar transistor collector-emitter saturation voltage measurement
#45Method and device for determining the temperature calibration characteristic curve of a semiconductor component appertaining to power electronics
#46Thermal resistance measuring method and thermal resistance measuring device
#47Apparatus and method for power cycle test
#48Apparatus and method for power cycle test
#49System and method for monitoring in real time the operating state of an IGBT device
#50Method for evaluating semiconductor device
#51Method and apparatus for electrical component life estimation