ClassID:

171728

G01R31/2632 - CPC Classification

Classification description:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices; Circuits therefor for testing diodes

Sub-classes:
Recent Application in this class:
#1
20260116554
2026-04-30

POWER DISTRIBUTION DEVICE WITH SOLID STATE POWER CONTROLLER

#2
20260104446
2026-04-16

METHOD FOR TESTING AT LEAST ONE BYPASS DIODE IN AN APPARATUS COMPRISING AT LEAST ONE PHOTOVOLTAIC MODULE IN OPERATION

#3
20260063702
2026-03-05

Electronic Subassembly

#4
20250290969
2025-09-18

ELECTRONIC CIRCUIT TO VERIFY THE STATE OF INTEGRITY OF A DIODE

#5
20250093388
2025-03-20

Systems and Methods for Calibrating a Wireless Harness Automated Measurement System

#6
20250012843
2025-01-09

SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH

#7
20240321651
2024-09-26

SEMICONDUCTOR DEVICES WITH INTEGRATED TEST STRUCTURES

#8
20230252923
2023-08-10

DISPLAY DEVICE AND INSPECTING METHOD THEREOF

#9
20230228804
2023-07-20

Monitoring an ideal diode

#10
20230168298
2023-06-01

Diode test module for monitoring leakage current and its method thereof

#11
20230058694
2023-02-23

Optical inspection of the varactor diodes in varactor metasurface antenna

#12
20220130302
2022-04-28

Display device and inspecting method thereof

#13
20220099738
2022-03-31

Pin driver and test equipment calibration

#14
20220065918
2022-03-03

Semiconductor device

#15
20220037882
2022-02-03

Motor vehicle control unit with redundant power supply, and corresponding motor vehicle

#16
20210373085
2021-12-02

Circuit for detecting pin-to-pin leaks of an integrated circuit package

#17
20210325445
2021-10-21

Predictive chip-maintenance

#18
20210318176
2021-10-14

Analyzing an operation of a power semiconductor device

#19
20210249993
2021-08-12

Device for testing a satellite solar array

#20
20210217944
2021-07-15

Asymmetrical PN junction thermoelectric couple structure and its parameter determination method

#21
20210141012
2021-05-13

PASSIVE HARMONIC FILTER POWER QUALITY MONITOR AND COMMUNICATIONS DEVICE

#22
20210063467
2021-03-04

Power transistor junction temperature determination using a desaturation voltage sensing circuit

#23
20210041493
2021-02-11

Transient voltage suppressor bit stimulation

#24
20200326366
2020-10-15

Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test

#25
20200191858
2020-06-18

Structure and testing device for measuring the bonding strength of the light-emitting panel

#26
20200182934
2020-06-11

Fault detection and isolation in generator modules

#27
20200161406
2020-05-21

Display device and inspecting method thereof

#28
20200088783
2020-03-19

Passive harmonic filter power quality monitor and communications device

#29
20200003824
2020-01-02

High accurate contact resistance measurement method using one or more diodes

#30
20190178930
2019-06-13

Voltage suppressor test circuit and method of testing a voltage suppressor

#31
20190064249
2019-02-28

Semiconductor test circuit, semiconductor test apparatus, and semiconductor test method

#32
20180340972
2018-11-29

Pulse current application circuit and control method thereof

#33
20180328970
2018-11-15

Battery disconnect for electrical drain test system

#34
20180172755
2018-06-21

Doorbell camera test tool

#35
20180172754
2018-06-21

ROTATING DIODE FAULT DETECTION

#36
20180113165
2018-04-26

Inspection device and inspection method for performing dynamic and static characteristics tests

#37
20180108285
2018-04-19

Array substrates testing circuits, display panels, and flat display devices

#38
20170155244
2017-06-01

Transient voltage suppressor having built-in-test capability for solid state power controllers

#39
20170077003
2017-03-16

Method to improve analog fault coverage using test diodes

#40
20170074921
2017-03-16

Life estimation circuit and semiconductor device made using the same

#41
20160282405
2016-09-29

Systems and methods for determining an operational condition of a capacitor package

#42
20160167610
2016-06-16

Method and device for identifying a polarity of a freewheeling diode, actuator circuit and safety device for a vehicle

#43
20160124033
2016-05-05

Electrical drain test system and method

#44
20160109506
2016-04-21

Semiconductor device with upset event detection and method of making

#45
20160091556
2016-03-31

Fault diagnosis method for freewheeling diodes of dual-switch power converter of switched reluctance motor

#46
20160003889
2016-01-07

Method for manufacturing silicon carbide semiconductor apparatus, and energization test apparatus

#47
20150260780
2015-09-17

Semiconductor device and control for testing a transistor and diode

#48
20150219711
2015-08-06

Apparatus for determining deterioration of photocoupler

#49
20150212134
2015-07-30

Method and computer-readable medium for detecting parasitic transistors by utilizing equivalent circuit and threshold distance

#50
20150198655
2015-07-16

Rectifier diode fault detection in brushless exciters

#51
20150168462
2015-06-18

Sensorless current sensing methods for power electronic converters

#52
20150153396
2015-06-04

Detecting shorted diodes

#53
20150061715
2015-03-05

Method and apparatus for non-contact measurement of forward voltage, saturation current density, ideality factor and I-V curves in P-N junctions

#54
20150061714
2015-03-05

Apparatus and method for accurate measurement and mapping of forward and reverse-bias current-voltage characteristics of large area lateral p-n junctions

#55
20140354285
2014-12-04

Organic light emitting display panel

#56
20140176173
2014-06-26

Probe card for power device

#57
20140152338
2014-06-05

ELECTRONIC DEVICE RELIABILITY MEASUREMENT SYSTEM AND METHOD

#58
20140097866
2014-04-10

Method of evaluating metal contamination in semiconductor sample and method of manufacturing semiconductor substrate

#59
20140070839
2014-03-13

Semiconductor device and method of detecting wire open failure thereof

#60
20130265056
2013-10-10

Apparatus and method of LED short detection

#61
20130050691
2013-02-28

Inspection apparatus and inspection method for light emitting device

#62
20120043990
2012-02-23

Zener diode detecting circuit

#63
20080054932
2008-03-06

Method and apparatus for measuring leakage current

#64
20070222470
2007-09-27

Buried short location determination using voltage contrast inspection

#65
20070126475
2007-06-07

Method and Apparatus for Semi-Automatic Extraction and Monitoring of Diode Ideality in a Manufacturing Environment

#66
20060107242
2006-05-18

Method and apparatus for semi-automatic extraction and monitoring of diode ideality in a manufacturing environment

#67
20050189954
2005-09-01

Method for optimizing the accuracy of an electronic circuit

#68
20050083070
2005-04-21

Method for detecting the operability of a number of identical zener diodes that are connected in parallel to one another and to a solenoid

#69
18587234
2025-05-27

Battery diode fault monitoring

#70
17724635
2023-05-16

Low-power voltage detector for low-voltage CMOS processes

#71
17240519
2024-04-09

Battery diode fault monitoring

#72
15695836
2018-01-30

Diode checker

#73
14852977
2017-11-28

Diode checker