171732 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices; Circuits therefor for testing other individual devices for testing field-effect devices, e.g. of MOS-capacitors
INTEGRATED CIRCUIT
#2METHOD FOR OBTAINING THE DIELECTRIC CONSTANT OF A DIELECTRIC SHEET
#3POWER DEVICE CHARACTERIZATION ON THE WAFER USING AUTOMATED PARAMETRIC SYSTEM
#4SYSTEM AND METHOD OF MEASURING CAPACITANCE OF DEVICE-UNDER-TEST
#5MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODELING METHOD FOR RADIO FREQUENCY MOS DEVICE
#6Two-Step Charge-Based Capacitor Measurement
#7System and method of measuring capacitance of device-under-test
#8Method for fabricating metal-oxide-metal capacitor
#9Power reduction in very large-scale integration (VLSI) systems
#10Power leakage testing
#11Techniques for isolating interfaces while testing semiconductor devices
#12Testing an integrated capacitor
#13Two-step charge-based capacitor measurement
#14Functional prober chip
#15Electronic test equipment apparatus and methods of operating thereof
#16High-frequency method and apparatus for measuring an amplifier
#17Operational amplifier circuit and current detection device using the same
#18HIGH-RESOLUTION POWER ELECTRONICS MEASUREMENTS
#19Testing MOS power switches
#20Method and system for MOM capacitance value control
#21Method and device of remaining life prediction for electromigration failure
#22On-die verification of resistor fabricated in CMOS process
#23Test circuit for testing a device-under-test by using a voltage-setting unit to pull an end of the device-under-test to a predetermined voltage
#24Functional prober chip
#25High-resolution power electronics measurements
#26Method for evaluating defect region of semiconductor substrate
#27Method for manufacturing display panel
#28SEMICONDUCTOR DEVICE TESTING APPARATUS, SEMICONDUCTOR DEVICE TESTING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
#29Method and device for testing an image sensor and motor vehicle
#30Current measurement and control of a semiconductor element based on the current measurement in a power semiconductor arrangement
#31High di/dt capacity measurement hardware
#32Method and device of remaining life prediction for electromigration failure
#33Noncontact determination of interface trap density for semiconductor-dielectric interface structures
#34Method for measuring interface state density
#35Noncontact determination of interface trap density for semiconductor-dielectric interface structures
#36VALUATION METHOD OF DIELECTRIC BREAKDOWN LIFETIME OF GATE INSULATING FILM, VALUATION DEVICE OF DIELECTRIC BREAKDOWN LIFETIME OF GATE INSULATING FILM AND PROGRAM FOR EVALUATING DIELECTRIC BREAKDOWN LIFETIME OF GATE INSULATING FILM
#37Method for Calculating Capacitance of High Voltage Depletion Capacitor
#38Electrical test structure and method for characterization of deep trench sidewall reliability
#39TDDB test pattern and method for testing TDDB of MOS capacitor dielectric
#40PLL loop filter capacitor test circuit and method for on chip testing of analog leakage of a circuit
#41Method for modeling inductive effects on circuit performance
#42Assessment of HCI in logic circuits based on AC stress in discrete FETs