G01R31/2641 - CPC Classification Index

ClassID:

171733 ⎘

G01R31/2641 - CPC Classification

Classification description:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices; Circuits therefor for testing charge coupled devices

Recent Application in this class:

20200292414

Inspection apparatus and inspection method

20160044307

Method and device for testing an image sensor and motor vehicle

20120194211

OPTICAL DEVICE INSPECTING APPARATUS

20100182034

Circuit for continuously measuring discontinuous metal insulator transition of MIT element and MIT sensor using the same

20100053601

Optical device inspecting apparatus

20090002001

Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating same

20080290890

TESTING SYSTEM FOR TESTING ELECTRONIC ASSEMBLY

20080149853

Light shaping apparatus

20070159532

Image sensor test apparatus

20060284631

Imaging test socket, system, and method of testing an image sensor device

20060036391

System and method for testing CMOS image sensor