171738 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices Contactless testing
Sub-classes:COUPLING PROBE FOR MICRO DEVICE INSPECTION
#2NON-CONTACT WAFER METROLOGY SYSTEM
#3POWER DEVICE PROGNOSTICS WITH QUANTUM SENSING THROUGH 2-D MATERIALS
#4Inspection Apparatus and Mounting Base
#5APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE
#6Substrate inspection device and substrate inspection method
#7Coupling probe for micro device inspection
#8ANALYSIS METHOD, STORAGE MEDIUM, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
#9Test circuit and method
#10Ultrasonic testing device and ultrasonic testing method
#11System and method of preparing integrated circuits for backside probing using charged particle beams
#12Test circuit and method
#13Substrate inspection device and substrate inspection method
#14MULTIPLEXED DLTS AND HSCV MEASUREMENT SYSTEM
#15Semiconductor device inspection apparatus and semiconductor device inspection method
#16Test circuit and method
#17Soft error rate calculation device and calculation method for semiconductor large scale integration (LSI)
#18Non-contact probe signal loading device
#19Fault detector for anti-parallel thyristor
#20Optical coupling device
#21Chip-on-wafer process control monitoring for chip-on-wafer-on-substrate packages
#22System of inspecting focus ring and method of inspecting focus ring
#23Semiconductor inspection method, semiconductor inspection device and manufacturing method of semiconductor element
#24Capacitance monitoring using X-ray diffraction
#25Storage device calibration methods and controlling device using the same
#26Method for testing special pattern and probe card defect in wafer testing
#27Work function calibration of a non-contact voltage sensor
#28Dynamic differential thermal measurement systems and methods
#29Method for testing a CMOS transistor
#30Test circuit and method
#31Non-contact test system for determining whether electronic device structures contain manufacturing faults
#32Semiconductor device
#33Semiconductor integrated circuit and drive apparatus including the same
#34System, a method and a computer program product for size estimation
#35TEST PATTERN DESIGN FOR SEMICONDUCTOR DEVICES AND METHOD OF UTILIZING THEREOF
#36Advance manufacturing monitoring and diagnostic tool
#37Stack including inspection circuit, inspection method and inspection apparatus
#38Method and apparatus for measuring alpha particle induced soft errors in semiconductor devices
#39Method and apparatus of RFID tag contactless testing
#40Method of measuring a silicon thin film, method of detecting defects in a silicon thin film, and silicon thin film defect detection device
#41Semiconductor integrated circuit and drive apparatus including the same
#42Non-contact test system for determining whether electronic device structures contain manufacturing faults
#43Measuring Minority Carrier Lifetime
#44METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DEVICE ON THE BASIS OF A MONODIRECTIONAL PROBE
#45APPARATUS FOR MEASURING MINORITY CARRIER LIFETIME AND METHOD FOR USING THE SAME
#46Advance manufacturing monitoring and diagnostic tool
#47Method using conductive atomic force microscopy to measure contact leakage current
#48Method and device for single event effect testing of large capacity solid state drives based on high-energy particles
#49System and method for simultaneous testing of radiation, environmental and electrical reliability of multiple semiconductor electrical devices