Patents-Review.com
ClassID:

171749 ⎘

G01R31/281 - CPC Classification

Classification description:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing

Sub-classes:
Recent Application in this class:
#1
20260147032
2026-05-28

DEVICE AND METHOD FOR TESTING AN ELECTRONIC COMPONENT

 #2
20250347733
2025-11-13

METAL DETECTION SENSOR BASED ON DUAL RESONANCE

 #3
20250164554
2025-05-22

SYSTEM AND METHOD FOR FAULT SEQUENCE RECORDING

 #4
20240393392
2024-11-28

System and method for fault sequence recording

 #5
20240230690
2024-07-11

DETACHABLE MODULARIZED TEST PLATFORM

 #6
20240133906
2024-04-25

DETACHABLE MODULARIZED TEST PLATFORM

 #7
20240120241
2024-04-11

PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTATIC CHARGES

 #8
20230032751
2023-02-02

Method for manufacturing system analysis and/or maintenance

 #9
20230009784
2023-01-12

HYBRID SOCKET WARP INDICATOR

 #10
20220091178
2022-03-24

Printed circuit board

 #11
20210349142
2021-11-11

System and method for testing a device-under-test

 #12
20210185801
2021-06-17

Adjustable mount for contacting probes to a dense pattern of pads in a circuit board

 #13
20210172996
2021-06-10

Method and apparatus for monitoring isolation of an electric power bus

 #14
20210072306
2021-03-11

Test system for improving test stability

 #15
20210063472
2021-03-04

Circuit for detection and warning of electro-migration on a printed circuit board

 #16
20210033660
2021-02-04

Enabling of functional logic in IC using thermal sequence enabling test

 #17
20200241080
2020-07-30

Electric short-circuit device

 #18
20200110130
2020-04-09

Self-check system and method thereof

 #19
20190257877
2019-08-22

Test system for checking electronic connections

 #20
20190154743
2019-05-23

Sensor device, evaluation device and corresponding systems and methods

 #21
20190109556
2019-04-11

Method and apparatus for predicting degradation in power modules

 #22
20190101591
2019-04-04

Current leakage and charge injection mitigating solid state switch

 #23
20190079127
2019-03-14

Information processing system and information processing method

 #24
20180331678
2018-11-15

Short circuit detector including a voltage detector

 #25
20180074115
2018-03-15

RESIDUAL IONIC CLEANLINESS EVALUATION COMPONENT

 #26
20180046747
2018-02-15

Temperature-dependent printed circuit board trace analyzer

 #27
20170292988
2017-10-12

Signal testing apparatus for printed circuit board

 #28
20170168110
2017-06-15

Directional pulse injection into a microelectronic system for electrostatic test

 #29
20170160336
2017-06-08

High-temperature test fixture

 #30
20170122999
2017-05-04

Integrated time dependent dielectric breakdown reliability testing

 #31
20170068771
2017-03-09

Using computer-aided design layout in scanning system

 #32
20170023630
2017-01-26

Sensor device, evaluation device and corresponding systems and methods

 #33
20170010322
2017-01-12

Integrated time dependent dielectric breakdown reliability testing

 #34
20160320443
2016-11-03

Residual material detection in backdrilled stubs

 #35
20160047855
2016-02-18

PCB AUTHENTICATION AND COUNTERFEIT DETECTION

 #36
20150177320
2015-06-25

Semiconductor chip, stack chip including the same, and testing method thereof

 #37
20150168463
2015-06-18

Via layout techniques for improved low current measurements

 #38
20150130501
2015-05-14

ADJUSTABLE RESISTOR DEVICE

 #39
20150006024
2015-01-01

Isolation adapter for a vehicle component test and test method for a vehicle component

 #40
20140375351
2014-12-25

Inspection apparatus and inspection method for inspecting a wiring board

 #41
20140115551
2014-04-24

Correlation of device manufacturing defect data with device electrical test data

 #42
20130345997
2013-12-26

Integrated time dependent dielectric breakdown reliability testing

 #43
20130241592
2013-09-19

Server with current monitoring system

 #44
20120166131
2012-06-28

Integrated device test circuits and methods

 #45
20120119769
2012-05-17

Apparatus for thermal testing of a printed circuit board

 #46
20120119757
2012-05-17

Electronic device and noise current measuring method

 #47
20120096727
2012-04-26

Curvature examining jig

 #48
20120082180
2012-04-05

Electrical component behavior analysis tools

 #49
20120079442
2012-03-29

Correlation of device manufacturing defect data with device electrical test data

 #50
20120079440
2012-03-29

Suspect logical region synthesis and simulation using device design and test information

 #51
20120079439
2012-03-29

Suspect logical region synthesis from device design and test information

 #52
20110298530
2011-12-08

Remote testing system

 #53
20100332169
2010-12-30

System and method for testing a characteristic impedance of a signal path routing of a printed circuit board

 #54
20090240450
2009-09-24

SYSTEM AND METHOD FOR EVALUATING A TEMPERATURE RISE OF A PRINTED CIRCUIT BOARD TRACE

 #55
20070038969
2007-02-15

Electronic ultimate defects analyzer detecting all defects in pcb/mcm

 #56
20060226853
2006-10-12

Test converting card and test apparatus thereof

 #57
20060087337
2006-04-27

Method and apparatus for layout independent test point placement on a printed circuit board

 #58
20050196032
2005-09-08

Verification of non-recurring defects in pattern inspection

 #59
20050017743
2005-01-27

Circuit board inspection device

 #60
18045295
2025-04-22

Non-contact circuit testing systems and methods

 #61
14868284
2019-01-08

Power line fault locating system

 #62
14586176
2019-04-23

Printed circuit board (PCB) interconnect defect detection