171767 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Specific tests of electronic circuits not provided for elsewhere; Fault-finding or characterising using signal generators, power supplies or circuit analysers Signal generators
TEST STAND FOR CONFRONTING A TEST PIECE WITH A SIMULATED ELECTRICAL FAULT
#2Zero Ohm Output Impedance
#3SEMICONDUCTOR TESTING APPARATUS
#4ARC FAULT CURRENT HEALTH CHECK CIRCUIT
#5TESTING CIRCUIT, TESTING APPARATUS, AND TESTING METHOD
#6Apparatus for Testing Electrical Characteristics of Multi-Pin Device
#7HARMONIC NOISE INSPECTION DEVICE FOR DISPLAY DEVICES
#8TEST CIRCUIT AND TEST METHOD FOR STACKED CHIP STRUCTURE
#9ELECTRONIC CIRCUIT
#10SYSTEMS AND METHODS FOR MEASURING WAVEFORMS AT DEVICES UNDER TEST
#11METHOD AND SYSTEM FOR FAULT DETECTION AND PREDICTION IN ELECTRIC GRIDS
#12ERRONEOUS WIRING INSPECTION DEVICE
#13TEST AND MEASUREMENT INSTRUMENTS AND PROBES HAVING AN ISOLATED OUTPUT
#14SENSING LEAKAGE CURRENT IN FAULT MANAGED POWER SYSTEMS
#15CONTACTOR WELD DETECTION
#16TEST AND MEASUREMENT INSTRUMENT, TEST AND MEASUREMENT SETUP AND METHOD OF MEASURING A DEVICE UNDER TEST
#17DEFECT DETECTION MODULE
#18ELECTRONIC DEVICE
#19TESTING APPARATUS
#20ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD
#21METHOD OF DETERMINING A FIGURE OF MERIT OF AT LEAST ONE COMPONENT UNDER TEST WITHIN A SIGNAL CHAIN AND MEASUREMENT INSTRUMENT
#22Measurement instrument, measurement system, and testing method of testing a device under test
#23REMOVING TEST EQUIPMENT NOISE FROM POWER SPECTRAL DENSITY MEASUREMENTS
#24Two-Step Charge-Based Capacitor Measurement
#25INSULATION MONITORING DEVICE AND METHOD FOR CONTROLLING INSULATION MONITORING DEVICE
#26IDENTIFYING FAILURES IN DEVICE CORES
#27TESTING DEVICE AND TESTING METHOD THEREOF
#28RANGING SYSTEMS AND METHODS FOR DECREASING TRANSITIVE EFFECTS IN MULTI-RANGE MATERIALS MEASUREMENTS
#29Hybrid digital and analog signal generation systems and methods
#30TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE
#31DIRECT DIGITAL SYNTHESIZER CIRCUIT, MEASUREMENT SYSTEM, AND METHOD OF OPERATING A DIRECT DIGITAL SYNTHESIZER CIRCUIT
#32Electronic device
#33Integrated communication link testing
#34INTEGRATED MEASUREMENT SYSTEMS AND METHODS FOR SYNCHRONOUS, ACCURATE MATERIALS PROPERTY MEASUREMENT
#35SIGNAL ABNORMALITY DETECTION SYSTEM AND METHOD THEREOF
#36SENSOR FOR A VEHICLE ELECTRICAL SYSTEM
#37AUTHENTICATING ELECTRONIC DEVICES VIA MULTI TONE ANALYSIS
#38Device for testing a group of radio-frequency (RF) chip modules and method for using the same
#39Artificial intelligence-based constrained random verification method for design under test and non-transitory machine-readable medium for storing program code that performs artificial intelligence-based constrained random verification method when executed
#40Sensor device for detecting electrical defects based on resonance frequency
#41Measurement system and method for a parallel measurement with multiple tones
#42Ranging systems and methods for decreasing transitive effects in multi-range materials measurements
#43SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
#44Signal test
#45Signal generation apparatus and attenuation amount correction method of signal generation apparatus
#46Method of manufacturing an integrated circuit involving performing an electrostatic discharge test and electrostatic discharge test system performing the same
#47Test system for memory card
#48Cloud-based signal generator system and method for providing a signal
#49Two-step charge-based capacitor measurement
#50Testing electrode quality
#51Field collapse pulser
#52Ranging systems and methods for decreasing transitive effects in multi-range materials measurements
#53Hybrid digital and analog signal generation systems and methods
#54Modulating jitter frequency as switching frequency approaches jitter frequency
#55Integrated measurement systems and methods for synchronous, accurate materials property measurement
#56Electrical testing apparatus for spintronics devices
#57Test apparatus and testing method using the same
#58Integrated communication link testing
#59System and method for monitoring semiconductor manufacturing equipment via analysis unit
#60Signal generating device and measurement device
#61Manufacturing method of electronic device and electronic device
#62Boundary test circuit, memory and boundary test method
#63Device and method for testing receptacle wiring
#64Signal injection technique for measurement and control of source reflection coefficient of a device under test
#65Test system and test method for testing a device under test
#66Modulating jitter frequency as switching frequency approaches jitter frequency
#67Testing device and testing method for testing a device under test
#68Real-time jitter impairment insertion for signal sources
#69Electrical testing apparatus for spintronics devices
#70System for position and/or line monitoring in an energy guide chain
#71Integrated communication link testing
#72Characterization of transmission media
#73Electrical testing apparatus for spintronics devices
#74Over-the-air test system and method for testing a device under test
#75Stacked semiconductor apparatus being electrically connected through through-via and monitoring method
#76Systematic methodology to remove reflections from I/O measurements
#77NON-CLAMPING METHOD AND APPARATUS FOR IDENTIFICATION OF DEAD UNDERGROUND POWER UTILITY CABLE FROM SPATIALLY ADJACENT POWER UTILITY CABLES
#78Monitoring waveforms from waveform generator at device under test
#79Monitoring device under test waveform on signal generator
#80Modulating jitter frequency as switching frequency approaches jitter frequency
#81Dynamic response analysis prober device
#82Display device and short circuit test method
#83Peak current evaluation system and peak current evaluation method
#84Multi-source signal generator and operating method thereof
#85Method and system for relay diagnosis
#86Modulating jitter frequency as switching frequency approaches jitter frequency
#87Arbitrary waveform generator based on instruction architecture
#88Spike safe floating current and voltage source
#89Display device and short circuit test method
#90Electronic arrangement and vector network analyzer characterized by reduced phase noise
#91Systems and methods for implementing S/SSTDR measurements
#92Electronic measurement device and method for operating an electronic measurement device
#93Apparatus and method for generating signals for ESD stress testing an electronic device and system for performing an ESD stress test of an electronic device
#94Systems and methods for implementing S/SSTDR measurements
#95Electronic arrangement and vector network analyzer characterized by reduced phase noise
#96Cancellation of secondary reverse reflections in a very-fast transmission line pulse system
#97S-parameter measurements using real-time oscilloscopes
#98High frequency phase reference standard signal
#99Measuring device with functional units controllable via a block diagram
#100Nonlinear distortion detection device and distortion compensation power amplifier
#101Temperature insensitive testing device and method
#102Load apparatus for testing
#103Multi-functional measuring and waveform-generating equipment with probe
#104Automatic test equipment for testing an oscillating crystal and method for operating the same
#105Electric circuit evaluation method
#106Electric circuit evaluation method and electric circuit
#107Continuous power leveling of a system under test
#108Power leveling of a system under test
#109Systems and methods for implementing S/SSTDR measurements
#110Voltage-current characteristic generator
#111Cancellation of secondary reverse reflections in a very-fast transmission line pulse system
#112Measurement apparatus and measurement method
#113Monitoring and analysis of power system components
#114Power amplification of a multi-tone test signal
#115Monitoring device and monitoring method for rotary encoder
#116INTEGRATED CIRCUIT AND PRINTED CIRCUIT BOARD HAVING RECEIVER TESTING FUNCTION
#117Method for identifying self-generated spurious signals
#118TIME DOMAIN REFLECTOMETRY SYSTEM AND METHOD
#119Testing integrated circuits using few test probes
#120Method for testing integrated circuits with hysteresis
#121Enhanced AWG waveform calibration using S-parameters
#122ENHANCED AWG WAVEF0RM CALIBRATION USING S-PARAMETERS
#123TEST CIRCUITS AND CURRENT PULSE GENERATOR FOR SIMULATING AN ELECTROSTATIC DISCHARGE
#124Method and device for broadband analysis of systems and substances
#125Compensation methods for digital source-measure-units (SMUs)
#126Resistance simulation and common mode rejection for digital source-measure units
#127Power supply
#128Voltage driver for a voltage-driven intelligent characterization bench for semiconductor
#129DRIVER CIRCUIT
#130Analog circuit test device
#131Automatic test equipment for testing an oscillating crystal and method for operating the same
#132Synthesizer having adjustable, stable and reproducible phase and frequency
#133Semiconductor test device, semiconductor test circuit connection device, and semiconductor test method
#134SIMULATING AN UMBILICAL
#135Pin card
#136Frequency-scalable shockline-based VNA
#137FREQUENCY-SCALABLE SHOCKLINE-BASED SIGNAL-SOURCE EXTENSIONS
#138Pin card
#139Method and apparatus for identifying and reducing spurious frequency components
#140Method for implementing continuous radio frequency (RF) alignment in advanced electronic warfare (EW) signal stimulation systems
#141Station for detecting winding products and method for detecting inter-turn short circuit
#142POWER SUPPLY AND SEMICONDUCTOR TEST DEVICE USING THE SAME
#143Compensation for voltage drop in automatic test equipment
#144Jitter generating circuit
#145Waveform generator
#146Method for implementing continuous radio frequency (RF) alignment in advanced electronic warfare (EW) signal stimulation systems
#147Waveform generation device, waveform generation method, and computer readable medium
#148Method for implementing continuous radio frequency (RF) alignment in advanced electronic warfare (EW) signal stimulation systems
#149Method to synchronize two different pulse generators
#150Impulse immunity test apparatus
#151Method for implementing continuous radio frequency (RF) alignment in advanced electronic warfare (EW) signal stimulation systems
#152Testing integrated circuits using few test probes
#153Calibrating signals by time adjustment
#154Enhanced programmable automatic level control
#155Radio frequency integrated circuit with on-chip noise source for self-test
#156Method and apparatus for testing AFCI device for series arc detection
#157Test circuits and current pulse generator for simulating an electrostatic discharge
#158Source-measure unit based on digital control loop
#159System, method, and apparatus for distortion analysis
#160Method and apparatus for identifying and reducing spurious frequency components
#161Device, method, program, and recording medium for error factor measurement, and output correction device and reflection coefficient measurement device provided with the device for error factor measurement
#162VOLTAGE GENERATING APPARATUS
#163Signal generator and user interface for adding amplitude noise to selected portions of a test signal
#164RADIO
#165Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatus
#166Apparatus and method for generating THz wave by heterodyning optical and electrical waves
#167Compensation for voltage drop in automatic test equipment
#168POWER SUPPLY APPARATUS AND TEST APPARATUS
#169Vector network analysis system and method using offset stimulus signals
#170Excitation signal generator for improved accuracy of model-based testing
#171Noise injection apparatus for printed circuit board
#172Oscillator circuit and test apparatus
#173Sequence status display during output for signal generator
#174Arbitrary waveform generator with configurable digital signal processing unit
#175Method for circuit inspection
#176Test apparatus with low-reflection signal distribution
#177Current mode waveform generator followed by a voltage mode buffer
#178Interface circuit for electronic test system
#179Amplitude varying driver circuit and test apparatus
#180Power supply device, method, program, recording medium, network analyzer, and spectrum analyzer
#181Mechanism to stabilize power delivered to a device under test
#182Current comb generator
#183Real-time time drift adjustment for a TDR step stimulus
#184Radio frequency power generation and power measurement
#185Method of self-calibration of pulse rise and fall times
#186Pulsed current generator circuit with charge booster
#187Signal generator with display
#188Apparatus for jitter testing an IC
#189Methods and apparatus for optimizing lists of waveforms
#190OBIRCH dual power circuit
#191Programmable jitter generator
#192Arc fault current health check circuit
#193Signal generator utilizing a neural network
#194Systems and methods for built-in self test of low dropout regulators