171768 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Specific tests of electronic circuits not provided for elsewhere; Fault-finding or characterising In-circuit-testing
METHOD FOR DETECTING DEVICES MOUNTED ON A BASEBOARD
#2In-Situ Electrical Connectivity Detection
#3CONTINUOUSLY VARIABLE ELECTRONIC LOAD TESTER FOR USE WITH NUCLEAR INSTRUMENTATION SYSTEM HIGH VOLTAGE POWER SUPPLIES
#4DETECTION OF STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT
#5METHOD FOR DETECTING THE HEALTH OF A FIRST SWITCHING UNIT OF A POWER SYSTEM AND POWER SYSTEM
#6SEMICONDUCTOR PACKAGES WITH THROUGH VIA STRUCTURES AND METHODS FOR TESTING THE SAME
#7CONTINUOUSLY VARIABLE ELECTRONIC LOAD TESTER FOR USE WITH NUCLEAR INSTRUMENTATION SYSTEM HIGH VOLTAGE POWER SUPPLIES
#8Failure Diagnosis Circuit, Vibrator Device, And Physical Quantity Sensor
#9GATE DRIVER CIRCUIT, MOTOR DRIVE DEVICE USING SAME, AND ELECTRONIC APPARATUS
#10ELECTRONIC DEVICE
#11SEMICONDUCTOR PACKAGES WITH THROUGH VIA STRUCTURES AND METHODS FOR TESTING THE SAME
#12CURRENT DISTURBANCE DETECTION SYSTEM
#13Diagnostic Systems and Methods
#14TIME DOMAIN PERFORMANCE TESTING FOR DIGITAL DEVICES
#15CONTROL DEVICE AND POWER CONVERSION DEVICE
#16TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE
#17Electronic device
#18ACTIVE BRIDGE FOR CHIPLET AND MODULE INTER-COMMUNICATION
#19ELECTRONIC DEVICE AND IMAGE FORMING APPARATUS
#20Method and Equipment for Monitoring a Failure in a High-Voltage Circuit of a Vehicle, and High-Voltage Circuit System
#21Fault detection circuit, method and power adapter
#22Power-loss delay circuit and detection control circuit thereof
#23Testing an electronic circuit having a voltage monitor circuit
#24Device and method for monitoring function circuit and outputting result of monitoring
#25Method and system for diagnosing open circuit (OC) fault of T-type three-level (T3L) inverter under multiple power factors
#26Detecting capacitive faults and sensitivity faults in capacitive sensors
#27Keyboard with wire aging self-adaptation, self-adaptation method for keyboard, electronic computing device readable medium with stored program, and electronic computing device program product
#28Electronic device and corresponding self-test method
#29Testing electrode quality
#30Bi-directional coupler with termination point for a test point
#31Predictive chip-maintenance
#32Manufacturing method of electronic device and electronic device
#33Maximization of side-channel sensitivity for trojan detection
#34Frequency-based built-in-test for discrete outputs
#35Scan cell architecture for improving test coverage and reducing test application time
#36NAND flash memory controller and storage apparatus applying the same
#37TEST CIRCUIT, ARRAY SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE
#38Voltage source inverter filter with resistor failure detection circuit
#39In-die transistor characterization in an IC
#40Fault protection for high-fanout signal distribution circuitry
#41Fault detection and prediction for data storage elements
#42Power device including current transformer and method for compensating of current transformer
#43Semiconductor device
#44MAGNETIC RESONANCE IMAGING APPARATUS AND NOTIFICATION INFORMATION PROVIDING METHOD PERFORMED BY USING THE SAME AND RADIO FREQUENCY COIL AND NOTIFICATION INFORMATION PROVIDING METHOD PERFORMED BY USING THE RADIO FREQUENCY COIL
#45Systems and methods for detecting abnormalities within a circuit of an electrosurgical generator
#46Using test elements of an integrated circuit for integrated circuit testing
#47Methods and systems for testing electronic circuits
#48Drive failure protection
#49State of health estimation of power converters
#50PRINTED CIRCUIT BOARD
#51Operation check support device and operation check support method
#52Systems, methods, and devices for monitoring a capacitor bank
#53Methods for testing wireless electronic devices using automatic self-test mode
#54Circuits for detecting AC- or DC-coupled loads
#55Circuit arrangement with a plurality of on-chip monitor circuits and a control circuit and corresponding methods
#56Drive failure protection
#57Identifying a signal on a printed circuit board under test
#58SIGNAL GENERATOR FOR A BUILT-IN SELF TEST
#59Methods and systems for testing electronic circuits
#60System and method for testing a characteristic impedance of an electronic component
#61Operating characteristic measurement device and methods thereof
#62Operating characteristic measurement device and methods thereof
#63Detection of the state of the elements of an electric branch comprising a load and a switch
#64AC impedance spectroscopy testing of electrical parametric structures
#65Power converters with component stress monitoring for fault prediction
#66Apparatus and method for determining reliability of an integrated circuit
#67Manufacturing test and programming system
#68Circuit with a capacitive element with method for testing the same
#69Method and apparatus for configuration of automated debug of in-circuit tests
#70Systems and methods for built-in self test of low dropout regulators