171772 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Specific tests of electronic circuits not provided for elsewhere; Fault-finding or characterising Environmental or reliability testing, e.g. burn-in or validation tests
DETERMINING A LOCKOUT CONDITION IN A CONDUCTED ELECTRICAL WEAPON
#2THERMAL REGULATING DEVICE
#3SYSTEM AND METHOD FOR DEVELOPING AND DEBUGGING A SILICON PRODUCTION TEST PROGRAM FOR SEMICONDUCTOR DEVICES
#4Burn-In Station for Performing Burn-In Testing of Electronic Devices
#5THERMAL REGULATING DEVICE
#6HEAT GENERATION CONTROL FOR MEMORY SYSTEM EVALUATION
#7THERMAL RUNAWAY TRIGGER METHOD
#8FUSE LIFE EXPECTANCY PREDICTION DEVICE FOR ELECTRIC VEHICLE BATTERY AND PREDICTION METHOD THEREOF
#9Scalable Tester for Testing Multiple Devices Under Test
#10DETECTING FLUID INGRESS IN A CONDUCTED ELECTRICAL WEAPON
#11INDEPENDENT THERMAL CONTROLLER FOR MEMORY DEVICES AND DEVICE INTERFACE BOARDS
#12Protection circuit for high temperature reverse bias test
#13ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFECTS FOR INTEGRATED CIRCUITS
#14METHOD OF MONITORING A HEALTH STATE OF A POWER SEMICONDUCTOR DEVICE
#15METHOD FOR PREDICTING A REMAINING FAILURE OR LIFETIME OF AN ELECTRICAL COMPONENT OF AN ELECTRICAL CIRCUIT
#16TEST DEVICE AND TEMPERATURE CONTROL METHOD
#17Modular wireless communication device testing system
#18Device and method for simulating a battery
#19Thermal runaway trigger method
#20Systems, apparatuses, or components for electrolytic corrosion protection of electronic element testing apparatuses
#21Ring oscillator and test method
#22Field collapse pulser
#23Fuse life expectancy prediction device for electric vehicle battery and prediction method thereof
#24SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF CIRCUITS TO RADIATION-INDUCED SINGLE-EVENT-EFFECTS
#25Modular wireless communication device testing system
#26Test card and test display adapter with shorter time for preliminary heat dissipation tests of high-performance display adapters
#27Cryogenic wafer test system
#28Integrated circuit burn-in board management system with effective burn-in board suspending and releasing mechanism
#29Circuit device aging assessment and compensation
#30Techniques For Reduction Of Degradation In Channels Caused By Bias Temperature Instability
#31Scalable tester for testing multiple devices under test
#32Testing device for burn-in test operations and control method thereof
#33Inspection apparatus including power supply for supplying power to heating mechanism used for heating device
#34Method and device for estimating the ageing of an electronic component
#35Semiconductor burn-in oven chamber sealing
#36Method and device for monitoring the reliability of an electronic system
#37Testing electrode quality
#38High-pressure burn-in test apparatus
#39Electronic component testing system and time certification method
#40Display panel and manufacturing method thereof
#41Screening method for electrolytic capacitors that maintains individual capacitor unit identity
#42Lifetime estimating system and method for heating source, and inspection apparatus
#43Test board and test apparatus including a multi-type fluid supplier for testing electronic apparatuses having semiconductor devices
#44System and methods for analyzing and estimating susceptibility of circuits to radiation-induced single-event-effects
#45Thermal management system for a test-and-measurement probe
#46Chip testing method for testing chips by chip testing system
#47Device for testing electronic devices in adjustable and accurate simulation of real-world environments
#48Gate driver with Vand Vmeasurement capability for the state of health monitor
#49Electronic device, signal validator, and method for signal validation
#50Test board and a device testing apparatus using the test board
#51Burn-in board and burn-in device
#52Reverse bias voltage adjuster
#53INSPECTION APPARATUS, TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD
#54Inspection apparatus and inspection method for inspecting electrical characteristic of electronic device
#55Semiconductor device with a data-recording mechanism
#56Apparatus and method for initiating thermal runaway in a battery
#57Apparatus and method for a high temperature test and a low temperature test and configured to maintain an electronic component under test near a test temperature
#58Modular wireless communication device testing system
#59System and methods for analyzing and estimating susceptibility of circuits to radiation-induced single-event-effects
#60Method and device for estimating level of damage or lifetime expectation of power semiconductor module
#61Gate driver with VGTH and VCESAT measurement capability for the state of health monitor
#62Low cycle fatigue prevention
#63Systems and methods for dynamic Rdson measurement
#64Method, system and assembly for determining a reduction of remaining service lifetime of an electrical device during a specific time period of operation of the electrical device
#65System and methods for analyzing and estimating susceptibility of circuits to radiation-induced single-event-effects
#66APPARATUS AND METHOD FOR PERFORMING AVALANCHE MODE DELTA VSD TESTING
#67Method for continuous tester operation during multiple stage temperature testing
#68Electrostatic capacitance measuring device
#69Device for attaching a semiconductor device to a circuit board
#70Systems and methods for dynamic Rdson measurement
#71Self-heating effect apparatus and test method
#72SELF-CORRECTION TECHNIQUES FOR CRYSTAL OSCILLATOR
#73System and methods for analyzing and estimating susceptibility of circuits to radiation-induced single-event-effects
#74Detection of damper resistor degradation and failures
#75System and method for managing semiconductor manufacturing defects
#76Laminate bond strength detection
#77Dynamic predictor of semiconductor lifetime limits
#78System and methods for analyzing and estimating susceptibility of circuits to radiation-induced single-event-effects
#79Solid state switch power emulator
#80Die edge crack and delamination detection
#81Electronic-component testing device
#82Shielded probe systems
#83Laminate bond strength detection
#84Screening method for electrolytic capacitors
#85Temperature Profiling in an Electricity Meter
#86Working fluid output device for temperature control system
#87FUNCTIONAL ELECTRONICS MODULE, OPERATING METHOD FOR A FUNCTIONAL ELECTRONICS MODULE AND SYSTEM HAVING A FUNCTIONAL ELECTRONICS MODULE
#88System and method for managing semiconductor manufacturing defects
#89Monitoring system for detecting degradation of integrated circuit
#90Energy-recycling burn-in apparatus and method of burn-in for electronic ballasts
#91METHOD FOR FINDING FAULT-TO-FAILURE SIGNATURES USING ORDERED HEALTH STATES
#92Method for characterizing the sensitivity of electronic components to destructive mechanisms
#93Virtual load board and test system and test method for liquid crystal display control board
#94Power supply aging system and load balance control method
#95Environmental Testing Apparatus
#96AGING DEGRADATION DIAGNOSIS CIRCUIT AND AGING DEGRADATION DIAGNOSIS METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT
#97Burn-in testing apparatus
#98Energy-recycling burn-in apparatus for electronic ballasts and a method of burning-in electronic ballasts
#99Method of determining the particle sensitivity of electronic components
#100Monitoring the low cycle fatigue of ruggedized avionics electronics
#101Current collector shape adjusting device
#102Correlated testing system
#103GPS embedded interactive network interface
#104Extensible testing system
#105Binary definition files
#106Power cycling test arrangement
#107Systems and methods for circuit lifetime evaluation
#108Device for testing an integrated circuit and method for implementing same
#109Method and system to verify the reliability of electronic devices
#110DETERIORATION DETECTION CIRCUIT
#111Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation
#112Testing system for power supply unit
#113Equipment burn-in method and system
#114TEMPERATURE CONTROL OF CONDUCTION-COOLED DEVICES DURING TESTING AT HIGH TEMPERATURES
#115Compensating for aging in integrated circuits
#116Methods for testing lasers using optical burn-in
#117Burn-in system for electronic devices
#118Monolithic voltage reference device with internal, multi-temperature drift data and related testing procedures
#119Method for characterizing the sensitivity of an electronic component to energetic interactions
#120Method for testing a software application
#121Monitoring device and monitoring method
#122TESTING APPARATUS FOR COMPUTER MOTHERBOARD DESIGN
#123Method and device for characterising sensitivity to energy interactions in an electronic component
#124Process measuring device for a measuring and control technology
#125High-power optical burn-in
#126Temperature Profiling in an Electricity Meter
#127STRESS CONDITION LOGGING IN UTILITY METER
#128Environmental Testing Apparatus
#129System and method for conducting accelerated soft error rate testing
#130Automatic test equipment
#131Large Component Thermal Head Adapter
#132Monitoring of Capacitor
#133MECHANICALLY ISOLATED ENVIRONMENTAL TEST CHAMBER
#134Method for evaluating the deterioration of magneto-resistive effect device
#135Temperature testing apparatus and temperature testing method
#136Systems and methods for facilitating use of a universal test connection for a plurality of different devices
#137Tray for handling devices to be tested
#138Systems and methods for conducting simultaneous vibration and electrical testing
#139Testing system for power supply
#140Fluid fitting electromagnetic effects test chamber
#141Stress detection circuit and semiconductor chip including same
#142Test chamber apparatus
#143Prismatic battery short circuit inspection method and prismatic battery manufacturing method
#144Method of manufacturing circuit module, collective board for circuit module, and circuit module manufactured by the method
#145CONSTANT-TEMPERATURE BOX CAPABLE OF CONTROLLING TEMPERATURE AND AIRFLOW
#146Determining the quality and reliability of a component by monitoring dynamic variables
#147SYSTEM AND METHOD FOR REGENERATIVE BURN-IN
#148Method for testing semiconductor devices and an apparatus therefor
#149Method for testing semiconductor devices and an apparatus therefor
#150Methods and apparatus for optimizing environmental humidity
#151System and method for improving electrical equipment accuracy by environmental condition compensation
#152Data transfer between moisture sensors
#153System and method for regenerative burn-in
#154Method for testing semiconductor devices and an apparatus therefor
#155Semiconductor device testing method and testing equipment
#156Methods and systems for testing wire insulation
#157Integrated circuit burn-in methods and apparatus
#158Method for evaluating semiconductor device error and system for supporting the same
#159Electronic devices mounted on electronic equipment board test system and test method
#160Circuit device aging assessment and compensation
#161Scalable tester for testing multiple devices under test
#162Power measurement transducer