171785 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of integrated circuits [IC]; Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
Sub-classes:VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAIN PERFORMANCE SIGNATURES
#2RADIATION ANOMALY CHARACTERIZATION SYSTEM
#3Apparatus for testing electronic devices
#4Virtual machine testing of electrical machines using physical domain performance signatures
#5METHOD AND APPARATUS FOR DELIVERING A THERMAL SHOCK
#6METHOD FOR CONTROLLING DROP TEST EQUIPMENT
#7Chip testing method and apparatus, and electronic equipment
#8Apparatus for testing electronic devices
#9Temperature detection of power switch using modulation of driver output impedance
#10Flexible test systems and methods
#11Semiconductor package test apparatus and method
#12SYSTEM AND METHOD FOR AUDIO OUTPUT DEVICE TESTING
#13Method and apparatus for delivering a thermal shock
#14Apparatus for testing electronic devices
#15Electrical overstress detection device
#16Method for detecting and controlling battery status by using sensor, and electronic device using same
#17Method of testing semiconductor device
#18Detection of an aged circuit
#19Substrate inspection device
#20Burn-in preform and method of making the same
#21Method, device and system for health monitoring of system-on-chip
#22System reference with compensation of electrical and mechanical stress and life-time drift effects
#23Apparatus for testing electronic devices
#24Method of fabricating surface-emitting laser
#25IC with insulating trench and related methods
#26Electrical overstress detection device
#27Wear-out monitor device
#28Integrated circuit and method for detecting a stress condition in the integrated circuit
#29Chip transient temperature predictor
#30SYSTEMS AND METHODS FOR PARTICLE DETECTION AND ERROR CORRECTION IN AN INTEGRATED CIRCUIT
#31Limiting aging effects in analog differential circuits
#32System reference with compensation of electrical and mechanical stress and life-time drift effects
#33Apparatus for testing electronic devices
#34IC with insulating trench and related methods
#35Apparatus and method for integrated circuit forensics
#36Analysis of stimulus by RFID
#37Apparatus for testing electronic devices
#38METHOD OF COMPENSATING FOR EFFECTS OF MECHANICAL STRESSES IN A MICROCIRCUIT
#39Analysis of stimulus by RFID
#40Methodology of grading reliability and performance of chips across wafer
#41On-going reliability monitoring of integrated circuit chips in the field
#42Monitoring the low cycle fatigue of ruggedized avionics electronics
#43Apparatus for testing electronic devices
#44Providing current control over wafer borne semiconductor devices using trenches
#45Apparatus for testing electronic devices
#46METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COMPONETS AND METHOD FOR CALIBRATION OF A MEASURING UNIT
#47Temperature testing apparatus and temperature testing method
#48Method of detecting abnormality in burn-in apparatus
#49Fabrication method of semiconductor integrated circuit device
#50Providing photonic control over wafer borne semiconductor devices
#51Providing current control over wafer borne semiconductor devices using overlayer patterns
#52Apparatus for testing electronic devices
#53Systems for wafer level burn-in of electronic devices
#54In-situ testing system for semiconductor device in aerospace irradiation environment
#55Compensating for degradation of electronics due to radiation vulnerable components
#56Method minimizing imprint through packaging of F-RAM