Patents-Review.com
ClassID:

171806 ⎘

G01R31/302 - CPC Classification

Classification description:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer Contactless testing

Sub-classes:
Recent Application in this class:
#1
20250004047
2025-01-02

METROLOGY IN THE PRESENCE OF CMOS UNDER ARRAY (CUA) STRUCTURES UTILIZING AN EFFECTIVE MEDIUM MODEL WITH PHYSICAL MODELING

 #2
20240337689
2024-10-10

RADIATION EVALUATION FOR SEMICONDUCTOR DEVICE

 #3
20240201104
2024-06-20

INSPECTION DEVICE

 #4
20240103072
2024-03-28

TESTING A SEMICONDUCTOR DEVICE USING X-RAYS

 #5
20230029364
2023-01-26

In-situ monitoring method and apparatus for power electronic device explosion

 #6
20220003678
2022-01-06

Optical systems and methods of characterizing high-k dielectrics

 #7
20210247442
2021-08-12

Counterfeit device detection using EMI fingerprints

 #8
20210148972
2021-05-20

Wafter, wafer testing system, and method thereof

 #9
20200408836
2020-12-31

Non-contact DC voltage measurement device with oscillating sensor

 #10
20200348340
2020-11-05

Contactless testing of electronic circuits

 #11
20200132719
2020-04-30

Anechoic chamber and signal test system containing the same

 #12
20200132629
2020-04-30

Inspection device and inspection method

 #13
20200033410
2020-01-30

System and method for diagnosing contactor using sound sensor

 #14
20200028381
2020-01-23

Current sense apparatus and method

 #15
20190346502
2019-11-14

Non-contact DC voltage measurement device with oscillating sensor

 #16
20190277776
2019-09-12

Detecting die repeating programmed defects located in backgrounds with non-repeating features

 #17
20190271734
2019-09-05

Semiconductor device inspection apparatus and semiconductor device inspection method

 #18
20190265297
2019-08-29

Semiconductor device inspection method and semiconductor device inspection device

 #19
20190245382
2019-08-08

Current sense apparatus and method

 #20
20190236048
2019-08-01

CONTROL APPARATUS AND CONTROL METHOD

 #21
20190212252
2019-07-11

Semiconductor device inspection method and semiconductor device inspection apparatus

 #22
20190154730
2019-05-23

Probe card

 #23
20190137352
2019-05-09

Strain gauge detection and orientation system

 #24
20180348165
2018-12-06

Optical polarization inspection device and method

 #25
20180284026
2018-10-04

Ultrahigh resolution dynamic IC chip activity detection for hardware security

 #26
20180156860
2018-06-07

Light source device and inspection device

 #27
20180003754
2018-01-04

Device, system and method for automatic test of integrated antennas

 #28
20170192052
2017-07-06

Method of inspecting pattern defect

 #29
20170067830
2017-03-09

Optical systems and methods of characterizing high-k dielectrics

 #30
20160258999
2016-09-08

Digital test system

 #31
20160080667
2016-03-17

Triggered operation and/or recording of test and measurement or imaging tools

 #32
20160069952
2016-03-10

Detector device for functional certification

 #33
20160033763
2016-02-04

Protected lens cover plate for an optical metrology device

 #34
20150331017
2015-11-19

Contactless voltage sensing devices

 #35
20150253241
2015-09-10

Fault analysis apparatus and fault analysis method

 #36
20150177313
2015-06-25

Illuminator for wafer prober and related methods

 #37
20140325322
2014-10-30

Semiconductor integrated circuit and drive apparatus including the same

 #38
20140218229
2014-08-07

Advance manufacturing monitoring and diagnostic tool

 #39
20130127440
2013-05-23

Pass through device for non-contact voltage detectors

 #40
20130055052
2013-02-28

Semiconductor integrated circuit and drive apparatus including the same

 #41
20120249776
2012-10-04

LIGHT-EMITTING DEVICE INSPECTING APPARATUS AND METHOD

 #42
20120249169
2012-10-04

Method for testing transponders

 #43
20120203533
2012-08-09

Improper voltage level detection in emulation systems

 #44
20110187352
2011-08-04

METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DEVICE ON THE BASIS OF A MONODIRECTIONAL PROBE

 #45
20110102574
2011-05-05

Systems and methods for imaging multiple sides of objects

 #46
20110082652
2011-04-07

Method and Apparatus for Fault Detection

 #47
20100280785
2010-11-04

Method for testing a software application

 #48
20100123453
2010-05-20

Advance manufacturing monitoring and diagnostic tool

 #49
20090319218
2009-12-24

Apparatus and method for testing a panel of interferometric modulators

 #50
20090072843
2009-03-19

Method and apparatus for interrogating an electronic component

 #51
20080191031
2008-08-14

Reference equipment for testing contactless payment devices

 #52
20080089567
2008-04-17

ARTIFACT REDUCTION IN AN X-RAY IMAGING SYSTEM

 #53
20080033681
2008-02-07

User interface system and method

 #54
20080018349
2008-01-24

METHOD FOR TESTING ELECTRICAL ELEMENTS USING AN INDIRECT PHOTOELECTRIC EFFECT

 #55
20070164109
2007-07-19

Peer-to-peer radio frequency communications for management of RFID readers

 #56
20070126450
2007-06-07

Sensor differentiated fault isolation

 #57
20070108984
2007-05-17

Ionization test for electrical verification

 #58
20060232284
2006-10-19

Sensor differentiated fault isolation

 #59
20060232261
2006-10-19

Method for fabricating light-emitting device through inspection

 #60
20060181290
2006-08-17

Apparatus and method for contacting of test objects

 #61
20060125510
2006-06-15

Line short localization in LCD pixel arrays

 #62
20060048025
2006-03-02

Diagnostic data gathering apparatus and method

 #63
20060027655
2006-02-09

Method and system for conducting contactless payment card transactions

 #64
20060022696
2006-02-02

Method and apparatus for non-contact electrical probe

 #65
20060022045
2006-02-02

Payment card signal characterization methods and circuits

 #66
20060022044
2006-02-02

Reference equipment for testing contactless payment devices

 #67
20060022043
2006-02-02

Contactless payment card reader with a frusto-conical operating volume

 #68
20060022042
2006-02-02

Collision detection and avoidance scheme for contactless card payment systems

 #69
20060012385
2006-01-19

Integration of photon emission microscope and focused ion beam

 #70
20050162180
2005-07-28

Semiconductor testing device

 #71
20050046430
2005-03-03

RF testing method and arrangement

 #72
18379702
2026-01-27

System and apparatus for testing magnetoresistive random access memory (MRAM) devices

 #73
16803767
2023-08-22

Wirelessly loaded impedance sensor for self-test