G01R31/315 - CPC Classification Index

ClassID:

171817 ⎘

G01R31/315 - CPC Classification

Classification description:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Contactless testing by inductive methods

Recent Application in this class:

20250085327

2025-03-13

METHOD OF DETECTING A FAULT IN A PULSED POWER DISTRIBUTION SYSTEM

20240159814

2024-05-16

Method of detecting a fault in a pulsed power distribution system

20240019472

2024-01-18

Alternative Near-Field Gradient Probe For The Suppression Of Radio Frequency Interference

20230168300

2023-06-01

CRACK DETECTOR FOR SEMICONDUCTOR DIES

20220229101

2022-07-21

Alternative near-field gradient probe for the suppression of radio frequency interference

20220050135

2022-02-17

Method of detecting a fault in a pulsed power distribution system

20220003816

2022-01-06

Short-circuit determining apparatus, switch apparatus and short-circuit determining method

20210215750

2021-07-15

METHOD AND SYSTEM FOR FAULT DETECTION

20200319225

2020-10-08

Apparatus for measuring velocities of projectiles

#10

20200264220

2020-08-20

Alternative near-field gradient probe for the suppression of radio frequency interference

#11

20190187187

2019-06-20

Current sensor

#12

20190137352

2019-05-09

Strain gauge detection and orientation system

#13

20190049514

2019-02-14

Ferromagnetic resonance testing of buried magnetic layers of whole wafer

#14

20190020213

2019-01-17

Detection of coil coupling in an inductive charging system

#15

20180180671

2018-06-28

Power drive transistor resonance sensor

#16

20180174964

2018-06-21

Inductive connection structure for use in an integrated circuit

#17

20180013312

2018-01-11

Detection of coil coupling in an inductive charging system

#18

20170292969

2017-10-12

Apparatus for measuring velocities of projectiles launched from firearms

#19

20170052215

2017-02-23

Solderless test fixture for trimmed coaxial cable or related products

#20

20160252572

2016-09-01

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE INCLUDING VARIABLE FREQUENCY TYPE PROBE TEST PAD AND SEMICONDUCTOR SYSTEM

#21

20160146886

2016-05-26

Method and apparatus for checking a circuit

#22

20150179325

2015-06-25

Magnetic pre-conditioning of magnetic sensors

#23

20150160309

2015-06-11

Magnetic field probe, magnetic field measurement system and magnetic field measurement method

#24

20150130480

2015-05-14

System and method for monitoring characteristics of an electrical device

#25

20140300381

2014-10-09

Contactless measuring system for contactless decoupling of a signal running on a signal waveguide

#26

20140253111

2014-09-11

Method and system for localization of open defects in electronic devices with a DC squid based RF magnetometer

#27

20140103487

2014-04-17

Semiconductor device

#28

20130062731

2013-03-14

Semiconductor device

#29

20120242333

2012-09-27

MAGNETIC STEERING APPLICATION FOR SINGULATED (X) MR SENSORS

#30

20120153745

2012-06-21

Inductive connection structure for use in an integrated circuit

#31

20120116734

2012-05-10

Method of characterizing an electrical defect affecting an electronic circuit, related device and information recording medium

#32

20110267088

2011-11-03

Contactless loop probe

#33

20110260743

2011-10-27

Contactless measuring system for near field measurement of a signal waveguide

#34

20110204359

2011-08-25

Semiconductor device

#35

20110201271

2011-08-18

Electronic circuit and communication functionality inspection method

#36

20110187352

2011-08-04

METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DEVICE ON THE BASIS OF A MONODIRECTIONAL PROBE

#37

20110148220

2011-06-23

Inspection method and inspection apparatus

#38

20110074455

2011-03-31

Probe card and semiconductor wafer inspection method using the same

#39

20100259107

2010-10-14

Systems and Methods for Providing Power to a Device Under Test

#40

20100144063

2010-06-10

Seminconductor device

#41

20100123453

2010-05-20

Advance manufacturing monitoring and diagnostic tool

#42

20100090679

2010-04-15

Apparatus for testing printed circuit and method therefor

#43

20090212792

2009-08-27

Inspection method and inspection apparatus

#44

20090066592

2009-03-12

System for inspecting electromagnetic coupling modules and radio IC devices and method for manufacturing electromagnetic coupling modules and radio IC devices using the system

#45

20090058442

2009-03-05

Prober for testing magnetically sensitive components

#46

20090002000

2009-01-01

Failure analysis method and failure analysis apparatus

#47

20080258744

2008-10-23

Electronic circuit testing apparatus

#48

20080054882

2008-03-06

Self-test probe design & method for non-contact voltage detectors

#49

20070216408

2007-09-20

Magnetic field sensor

#50

20070188317

2007-08-16

Local access port communications using near field induction

#51

20070126429

2007-06-07

Semiconductor integrated circuit device

#52

20060202692

2006-09-14

Magnetoresistive sensor element and method of assembling magnetic field sensor elements with on-wafer functional test

#53

20060066326

2006-03-30

Non-contact tester for electronic circuits

#54

20060049830

2006-03-09

Magnetic sensor for detecting location of short circuit between lead wires of high-density micro-patterns

#55

20060033510

2006-02-16

Method and device for measuring intensity of electromagnetic field, method and device for measuring current-voltage distribution, and method for judging quality of electronic device, and electronic device therefor

#56