ClassID:

171814

G01R31/309 - CPC Classification

Classification description:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates

Recent Application in this class:
#1
20260136456
2026-05-14

SOLDER MASK FAULT FIBER OPTICS SENSOR

#2
20260104453
2026-04-16

HIGH-SPEED ELECTRICAL TESTING SYSTEM APPLIED TO PRINTED DISPLAY PANEL

#3
20250251447
2025-08-07

METHOD OF TERMINATING UNUSED PORTS DURING CROSSTALK MEASUREMENT

#4
20240284590
2024-08-22

SOLDER MASK FAULT FIBER OPTICS SENSOR

#5
20240142516
2024-05-02

SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USING MULTIPLE MODALITIES

#6
20240036109
2024-02-01

RADIO FREQUENCY CONDUCTION TEST METHOD AND RELATED APPARATUS

#7
20220291281
2022-09-15

Systems and methods for high precision optical characterization of carrier transport properties in semiconductor manufacturing

#8
20220268836
2022-08-25

Immunity evaluation system and immunity evaluation method

#9
20210286030
2021-09-16

Method, method of inspecting magnetic disk device, and electronic component

#10
20210215541
2021-07-15

Temperature monitoring for printed circuit board assemblies during mass soldering

#11
20210165040
2021-06-03

High precision optical characterization of carrier transport properties in semiconductors

#12
20210158499
2021-05-27

AI-based Automatic Judgment Unit for Quality Classification of Semifinished Component Carriers of a Panel Based on Automatic Optical Inspection

#13
20210082101
2021-03-18

System and method for rapid inspection of printed circuit board using multiple modalities

#14
20200174067
2020-06-04

Integrated photonic test circuit

#15
20190286787
2019-09-19

Measurement models of nanowire semiconductor structures based on re-useable sub-structures

#16
20190195949
2019-06-27

Test apparatus and methods for arc mitigation device

#17
20180218486
2018-08-02

Substrate inspection apparatus and method

#18
20180188319
2018-07-05

High precision optical characterization of carrier transport properties in semiconductors

#19
20180098433
2018-04-05

Method of forming a plurality of electro-optical module assemblies

#20
20180098432
2018-04-05

Method of forming a plurality of electro-optical module assemblies

#21
20180095125
2018-04-05

Integrated electro-optical module assembly

#22
20180012116
2018-01-11

Feedback control of mounted chip production

#23
20170322255
2017-11-09

Integrated electro-optical module assembly

#24
20170269007
2017-09-21

Method and apparatus for generating X-ray inspection image of electronic circuit board

#25
20170227474
2017-08-10

Metrology test structure design and measurement scheme for measuring in patterned structures

#26
20170102412
2017-04-13

Optical electrical measurement system, a measurement probe and a method therefor

#27
20160305995
2016-10-20

Apparatus and method for non-contact sample analyzing using terahertz wave

#28
20160224718
2016-08-04

Graphic user interface for a three dimensional board inspection apparatus

#29
20150231744
2015-08-20

Substrate inspection device and component mounting device

#30
20140133735
2014-05-15

METHOD OF INSPECTING A LEAD OF AN ELECTRIC DEVICE

#31
20130215262
2013-08-22

Board inspection apparatus and method

#32
20130127487
2013-05-23

Non-contact testing of printed electronics

#33
20130027050
2013-01-31

System and method for inspection of electrical circuits

#34
20120025839
2012-02-02

Apparatus for measuring conductive pattern on substrate

#35
20110128011
2011-06-02

Apparatus and method for inspecting defects of a circuit pattern formed on a substrate using a laser and a non-contact capacitor sensor

#36
20110116084
2011-05-19

Method of inspecting defects in circuit pattern of substrate

#37
20110002527
2011-01-06

Board inspection apparatus and method

#38
20100302360
2010-12-02

Defect correcting method and defect correcting device for an electronic circuit pattern

#39
20100283499
2010-11-11

Non-contact testing of printed electronics

#40
20100220186
2010-09-02

Method and system for detecting micro-cracks in wafers

#41
20100208250
2010-08-19

Producing method of wired circuit board

#42
20100158348
2010-06-24

Inspection system and inspection method

#43
20090150092
2009-06-11

Electric ultimate defects analyzer detecting all defects in PCB/MCM

#44
20090102487
2009-04-23

Method for validating printed circuit board materials for high speed applications

#45
20080272792
2008-11-06

Method and device for testing of non-componented circuit boards

#46
20080013594
2008-01-17

Nondestructive Inspection Method For Inspecting Junction Of Flexible Printed Circuit Board

#47
20070165939
2007-07-19

REDUCTION OF FALSE ALARMS IN PCB INSPECTION

#48
20070038969
2007-02-15

Electronic ultimate defects analyzer detecting all defects in pcb/mcm

#49
20070023860
2007-02-01

Semiconductor device having a fuse barrier pattern and fabrication method thereof

#50
20070013772
2007-01-18

In-circuit test fixture with integral vision inspection system

#51
20060152232
2006-07-13

Method and apparatus for inspection of high frequency and microwave hybrid circuits and printed circuit boards

#52
20060132759
2006-06-22

Vision inspection apparatus using a full reflection mirror

#53
20060109345
2006-05-25

Inspection device

#54
20060086773
2006-04-27

Technique for optical inspection system verification

#55
20060083420
2006-04-20

Inspection system and inspection method

#56
20060072116
2006-04-06

Method and apparatus for determining presence of a component in a printed circuit board

#57
20060068701
2006-03-30

RFID verifier system with grade classification

#58
20060034506
2006-02-16

Machine vision analysis system and method

#59
20060017452
2006-01-26

Substrate inspection device and substrate inspecting method

#60
20060000989
2006-01-05

Method of generating image and illumination device for inspecting substrate

#61
20050268459
2005-12-08

System and method for detecting connector pin insertion in printed circuit board assemblies

#62
20050190361
2005-09-01

Apparatus for surface inspection and method and apparatus for inspecting substrate

#63
20050017729
2005-01-27

Circuit based testing apparatus and method for testing a circuit board

#64
14591783
2016-08-16

Adjustable split-beam optical probing (ASOP)