171818 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer Testing of analog circuits
Sub-classes:Zero Ohm Output Impedance
#2PROGRAMMABLE DELAY TESTING CIRCUIT
#3SENSOR CIRCUITS, ELECTRONIC DEVICES, AND METHODS FOR PERFORMING INTERNAL CALIBRATION OPERATIONS
#4Test circuit of electronic device, electronic device including test circuit, and operating method thereof
#5DFT architecture for analog circuits
#6Signal path monitor
#7Predictive chip-maintenance
#8METHOD AND SYSTEM FOR EXTRACTING FAULT FEATURE OF ANALOG CIRCUIT BASED ON OPTIMAL WAVELET BASIS FUNCTION
#9Method for diagnosing analog circuit fault based on cross wavelet features
#10Analog-circuit fault diagnosis method based on continuous wavelet analysis and ELM neural network
#11High voltage interlock circuit and detection method
#12Compressed test patterns for a field programmable gate array
#13Analog circuit fault feature extraction method based on parameter random distribution neighbor embedding winner-take-all method
#14Single pin test interface for pin limited systems
#15Measuring system as well as method for analyzing an analog signal
#16Method and Device for Analyzing an Electrical Circuit
#17Failure determination circuit, physical quantity measurement device, electronic apparatus, vehicle, and failure determination method
#18Semiconductor device
#19Analog circuit fault mode classification method
#20Analog circuit fault diagnosis method using single testable node
#21Time delay estimation apparatus and time delay estimation method therefor
#22Techniques for determining a fault probability of a location on a chip
#23Driving circuit having built-in-self-test function
#24Sense amplifier soft-fail detection circuit
#25Improper voltage level detection in emulation systems
#26High throughput semiconductor device testing
#27Circuit structure free from test effect and testing method thereof
#28Method and apparatus for determining relevance values for a detection of a fault on a chip and for determining a fault probability of a location on a chip
#29Analog circuit testing and test pattern generation
#30Programmable circuit for drift compensation
#31Analog signal test using a-priori information
#32Circuit and Method for Trimming Integrated Circuits
#33Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics
#34Circuit and method for trimming integrated circuits
#35Performing a signal analysis based on digital samples in conjunction with analog samples
#36Spatial transformer for RF and low current interconnect
#37Transmitter voltage and receiver time margining
#38Internal analog loopback for a high-speed interface test
#39Active load arrangement
#40Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics
#41Compositions and methods for helper-free production of recombinant adeno-associated viruses
#42Versatile system for time-independent signal sampling
#43Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics
#44Analog circuit automatic calibration system
#45Frequency-domain impedance sensing system and method for neural network prediction of impending failure modes
#46Apparatuses and methods involving error detection and correction of linear analog circuits