171820 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of analog circuits Functional testing
Driving High Speed Voltage Waveforms for Current Measurements
#2VARIABLE-BIT ADAPTIVE SENSING CIRCUIT SYSTEM IN ANALOG NEUROMORPHIC SYSTEMS
#3ANALOG DIVIDER CIRCUITRY WITH BUILT-IN TEST CAPABILITY
#4DETECTION OF MALICIOUS CIRCUITS INSERTED IN ANALOG CIRCUITS
#5TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA
#6POWER SOURCE EMULATOR AND METHOD FOR TESTING SWITCHGEAR
#7RF TESTING METHOD AND TESTING SYSTEM
#8Signal path monitor
#9Vector-valued regularized kernel function approximation based fault diagnosis method for analog circuit
#10TESTING DEVICE AND TESTING METHOD
#11Method for diagnosing analog circuit fault based on vector-valued regularized kernel function approximation
#12Digital output monitor circuit and high frequency front-end circuit
#13Analog-test-bus apparatuses involving calibration of comparator circuits and methods thereof
#14Deep belief network feature extraction-based analogue circuit fault diagnosis method
#15Fingerprint recognition method and apparatus and computer readable storage medium
#16Analog functional safety with anomaly detection
#17Semiconductor device and failure detection method
#18Method for testing comparator and device therefor
#19Test apparatus, test method, calibration device, and calibration method
#20Method for testing comparator and device therefor
#21System for testing electronic circuits
#22Method for testing integrated circuits with hysteresis
#23Method and device for frequency response measurement
#24Circuit arrangement and method for testing a reset circuit
#25Method and apparatus for sub-assembly error detection in high voltage analog circuits and pins
#26Analog scan circuit, analog flip-flop, and data processing apparatus
#27Probing analog signals
#28Test probe structure
#29CALIBRATION TECHNIQUE FOR POWER AMPLIFIERS
#30Source-measure unit based on digital control loop
#31Semiconductor device test system having reduced current leakage
#32Load Board Based Test Circuits
#33Integrated semiconductor circuit
#34MODEL-BASED TESTING METHOD AND SYSTEM USING EMBEDDED MODELS
#35Interface circuit for using a low voltage logic tester to test a high voltage IC
#36Power detector for mismatched load
#37Circuit for testing power down reset function of an electronic device
#38Verification vector creating method, and electronic circuit verifying method using the former method
#39Power detector for mismatched load
#40Power detector for mismatched load